Patents by Inventor Shushi Suzuki

Shushi Suzuki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Quantum beam aided atomic force microscopy and quantum beam aided atomic force microscope
    Patent number: 7534999
    Abstract: A quantum beam aided atomic force microscopy and quantum beam aided atomic force microscope that can simultaneously perform atomic-level configuration observation and elemental analysis with the use of an atomic force microscope and further can effect analysis of the chemical state of sample surface and that as being operable in liquids, can realize the elemental analysis and chemical state analysis of biosamples with an atomic-level resolving power. Accordingly, atoms of sample surface are irradiated with quantum beams, such as charged particles, electrons and photons, having a given electron transition energy characteristic of element, and any change in interaction force between the atoms of sample surface having been irradiated with quantum beams and the distal end of the probe is detected.
    Type: Grant
    Filed: December 21, 2004
    Date of Patent: May 19, 2009
    Assignee: Japan Science and Technology Agency
    Inventors: Shushi Suzuki, Wang-Jae Chun, Kiyotaka Asakura, Masaharu Nomura
  • Quantum Beam Aided Atomic Force Microscopy and Quantum Beam Aided Atomic Force Microscope
    Publication number: 20070215804
    Abstract: A quantum beam aided atomic force microscopy and quantum beam aided atomic force microscope that can simultaneously perform atomic-level configuration observation and elemental analysis with the use of an atomic force microscope and further can effect analysis of the chemical state of sample surface and that as being operable in liquids, can realize the elemental analysis and chemical state analysis of biosamples with an atomic-level resolving power. Accordingly, atoms of sample surface are irradiated with quantum beams, such as charged particles, electrons and photons, having a given electron transition energy characteristic of element, and any change in interaction force between the atoms of sample surface having been irradiated with quantum beams and the distal end of the probe is detected.
    Type: Application
    Filed: December 21, 2004
    Publication date: September 20, 2007
    Inventors: Shushi Suzuki, Wang-Jae Chun, Kiyotaka Asakura, Masaharu Nomura