Patents by Inventor Shuyi JIA

Shuyi JIA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11790517
    Abstract: A subtle defect detection method based on coarse-to-fine strategy, including: (S1) acquiring data of an image to be detected via a charge-coupled device (CCD) camera; (S2) constructing a defect area location network and preprocessing the image to be detected to initially determine a defect position; (S3) constructing a defect point detection network; and training the defect point detection network by using a defect segmentation loss function; and (S4) subjecting subtle defects in the image to be detected to quantitative extraction and segmentation via the defect point detection network.
    Type: Grant
    Filed: April 24, 2023
    Date of Patent: October 17, 2023
    Assignee: Nanjing University of Aeronautics and Astronautics
    Inventors: Jun Wang, Zhongde Shan, Shuyi Jia, Dawei Li, Yuxiang Wu
  • Publication number: 20230260101
    Abstract: A subtle defect detection method based on coarse-to-fine strategy, including: (S1) acquiring data of an image to be detected via a charge-coupled device (CCD) camera; (S2) constructing a defect area location network and preprocessing the image to be detected to initially determine a defect position; (S3) constructing a defect point detection network; and training the defect point detection network by using a defect segmentation loss function; and (S4) subjecting subtle defects in the image to be detected to quantitative extraction and segmentation via the defect point detection network.
    Type: Application
    Filed: April 24, 2023
    Publication date: August 17, 2023
    Inventors: Jun WANG, Zhongde SHAN, Shuyi JIA, Dawei LI, Yuxiang WU