Patents by Inventor Shyamsunder Tondanur Mandayam

Shyamsunder Tondanur Mandayam has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11099002
    Abstract: A system for inspecting a coating on a substrate, the system including a platform that receives a sample including the substrate having the coating, and a light source that directs a plurality of electromagnetic pulses towards a scanning location on the coating, wherein the light source is oriented to direct the plurality of electromagnetic pulses at an oblique angle relative to a surface of the coating. A light detector receives electromagnetic pulses reflected from the sample, wherein a first portion of each electromagnetic pulse is reflected from the surface of the coating, and a second portion of each electromagnetic pulse is reflected from a surface of the substrate. An actuator is coupled to the platform and/or the light source, wherein the actuator moves the platform and the light source relative to each other such that the plurality of electromagnetic pulses are directable towards the scanning location from different rotational positions.
    Type: Grant
    Filed: December 9, 2019
    Date of Patent: August 24, 2021
    Assignee: General Electric Company
    Inventors: Esha Sen Gupta, Shyamsunder Tondanur Mandayam
  • Publication number: 20210172726
    Abstract: A system for inspecting a coating on a substrate, the system including a platform that receives a sample including the substrate having the coating, and a light source that directs a plurality of electromagnetic pulses towards a scanning location on the coating, wherein the light source is oriented to direct the plurality of electromagnetic pulses at an oblique angle relative to a surface of the coating. A light detector receives electromagnetic pulses reflected from the sample, wherein a first portion of each electromagnetic pulse is reflected from the surface of the coating, and a second portion of each electromagnetic pulse is reflected from a surface of the substrate. An actuator is coupled to the platform and/or the light source, wherein the actuator moves the platform and the light source relative to each other such that the plurality of electromagnetic pulses are directable towards the scanning location from different rotational positions.
    Type: Application
    Filed: December 9, 2019
    Publication date: June 10, 2021
    Inventors: Esha Sen Gupta, Shyamsunder Tondanur Mandayam
  • Patent number: 10152784
    Abstract: A method for inspecting a component is presented. The method includes inducing, by an inductive coil, an electrical current flow into the component. Further, the method includes capturing, by an infrared (IR) camera, at least a first set of frames and a second set of frames corresponding to the component, wherein the first set of frames is captured at a first time interval and a second set of frames is captured at a second time interval. Also, the method includes constructing, by a processing unit, a thermal image based on at least the first set of frames and the second set of frames corresponding to the component. Furthermore, the method includes determining presence of a thermal signature in the thermal image, wherein the thermal signature is representative of a defect in the component.
    Type: Grant
    Filed: June 30, 2016
    Date of Patent: December 11, 2018
    Assignee: GENERAL ELECTRIC COMPANY
    Inventors: Venkata Vijayaraghava Nalladega, Thomas James Batzinger, Yuri Alexeyevich Plotnikov, Shyamsunder Tondanur Mandayam, Bryon Edward Knight, Satheesh Jeyaraman, Esha SenGupta
  • Publication number: 20180005368
    Abstract: A method for inspecting a component is presented. The method includes inducing, by an inductive coil, an electrical current flow into the component. Further, the method includes capturing, by an infrared (IR) camera, at least a first set of frames and a second set of frames corresponding to the component, wherein the first set of frames is captured at a first time interval and a second set of frames is captured at a second time interval. Also, the method includes constructing, by a processing unit, a thermal image based on at least the first set of frames and the second set of frames corresponding to the component. Furthermore, the method includes determining presence of a thermal signature in the thermal image, wherein the thermal signature is representative of a defect in the component.
    Type: Application
    Filed: June 30, 2016
    Publication date: January 4, 2018
    Inventors: Venkata Vijayaraghava Nalladega, Thomas James Batzinger, Yuri Alexeyevich Plotnikov, Shyamsunder Tondanur Mandayam, Bryon Edward Knight, Satheesh Jeyaraman, Esha SenGupta
  • Publication number: 20120136630
    Abstract: A method and system for inspecting a wind turbine is provided. The method includes providing at least one remotely operated aerial platform (ROAP), providing at least one non-destructive evaluation (NDE) device attached to the ROAP, and providing at least one distance measuring system attached to the ROAP. The distance measuring system is used for determining the distance between the ROAP and at least a portion of the wind turbine. The method also includes positioning the ROAP so that the at least one non-destructive evaluation device captures data used for inspecting the wind turbine.
    Type: Application
    Filed: February 4, 2011
    Publication date: May 31, 2012
    Inventors: John Thomas Murphy, Debasish Mishra, George Rowan Silliman, Vinod Padmanabhan Kumar, Shyamsunder Tondanur Mandayam, Prafull Sharma
  • Patent number: 7233867
    Abstract: An eddy current inspection system and method for inspecting a component is provided. The system includes an eddy current probe for sensing eddy currents from the component and an analog to digital converter configured for converting eddy currents to digital signals. The system also includes a processor configured for generating an eddy current image from the digital signals and pre-processing the image to enhance a quality of the image. The processor is configured to identify regions displaying flaw patterns and calculating a defect characterizing parameter for the identified regions.
    Type: Grant
    Filed: April 6, 2005
    Date of Patent: June 19, 2007
    Assignee: General Electric Company
    Inventors: Preeti Pisupati, Gigi Olive Gambrell, Shyamsunder Tondanur Mandayam, Amitabha Dutta
  • Patent number: 7154265
    Abstract: An eddy current (EC) probe for inspecting a component is provided. The EC probe includes a tangential drive coil configured to generate a probing field for inducing eddy currents in the component, where a portion of the eddy currents are aligned parallel to an edge of the component. An axis of the tangential drive coil is aligned parallel to a surface of the component. The EC probe further includes a pair of sense coils, where an axis of the sense coils is aligned perpendicular to the surface of the component. The sense coils are configured to sense the portion of the eddy currents aligned parallel to the edge of the component.
    Type: Grant
    Filed: December 21, 2004
    Date of Patent: December 26, 2006
    Assignee: General Electric Company
    Inventors: Mottito Togo, Changting Wang, Yuri Alexeyevich Plotnikov, Shyamsunder Tondanur Mandayam, William Stewart McKnight, Walter Joseph Bantz, Ui Won Suh