Patents by Inventor Shyan-Jer Lay

Shyan-Jer Lay has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Sector synchronized test method and circuit for memory
    Patent number: 6930937
    Abstract: A sector synchronized test method and circuit for a memory, applicable for testing several electrically programmable or electrically erasable memory dies. The section synchronize test circuit has a read-write device, a selected switch, and a plurality of test interfaces. While programming or erasing the memory dies simultaneously, the selected switch connects the parallel output terminal, so that the memory dies are connected in parallel. Meanwhile, the read-write device receives a test signal to perform the program or erase operation on the memory dies according to the test signal.
    Type: Grant
    Filed: April 3, 2002
    Date of Patent: August 16, 2005
    Assignee: Macronix International Co. Ltd.
    Inventor: Shyan-Jer Lay
  • Sector synchronized test method and circuit for memory
    Publication number: 20030043662
    Abstract: A sector synchronized test method and circuit for a memory, applicable for testing several electrically programmable or electrically erasable memory dies. The section synchronize test circuit has a read-write device, a selected switch, and a plurality of test interfaces. While programming or erasing the memory dies simultaneously, the selected switch connects the parallel output terminal, so that the memory dies are connected in parallel. Meanwhile, the read-write device receives a test signal to perform the program or erase operation on the memory dies according to the test signal.
    Type: Application
    Filed: April 3, 2002
    Publication date: March 6, 2003
    Inventor: Shyan-Jer Lay