Patents by Inventor Shyh-Hau Wang
Shyh-Hau Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11679565Abstract: An additive manufacturing (AM) method includes using an AM tool to fabricate a plurality of workpiece products; measuring qualities of the first workpiece products respectively; performing a temperature measurement on each of the melt pools on the powder bed during a fabrication of each of the workpiece products; performing photography on each of the melt pools on the powder bed during the fabrication of each of the workpiece products; extracting a length and a width of each of the melt pools; performing a melt-pool feature processing operation; building a conjecture model by using a plurality of sets of first process data and the actual metrology values of the first workpiece products in accordance with a prediction algorithm; and predicting a virtual metrology value of the second workpiece product by using the conjecture model based on a set of second process data.Type: GrantFiled: June 6, 2022Date of Patent: June 20, 2023Assignee: NATIONAL CHENG KUNG UNIVERSITYInventors: Haw-Ching Yang, Yu-Lung Lo, Hung-Chang Hsiao, Shyh-Hau Wang, Min-Chun Hu, Chih-Hung Huang, Fan-Tien Cheng
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Patent number: 11673339Abstract: An additive manufacturing (AM) method includes using an AM tool to fabricate a plurality of workpiece products; measuring qualities of the first workpiece products respectively; performing a temperature measurement on each of the melt pools on the powder bed; performing photography on each of the melt pools on the powder bed; extracting a length and a width of each of the melt pools; performing a melt-pool feature processing operation; first converting each of the workspace images to a gray level co-occurrence matrix (GLCM); building a conjecture model by using a plurality of sets of first process data and the actual metrology values of the first workpiece products in accordance with a prediction algorithm; and predicting a virtual metrology value of the second workpiece product by using the conjecture model based on a set of second process data.Type: GrantFiled: June 17, 2022Date of Patent: June 13, 2023Assignee: NATIONAL CHENG KUNG UNIVERSITYInventors: Haw-Ching Yang, Yu-Lung Lo, Hung-Chang Hsiao, Shyh-Hau Wang, Min-Chun Hu, Chih-Hung Huang, Fan-Tien Cheng
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Publication number: 20220314552Abstract: An additive manufacturing (AM) method includes using an AM tool to fabricate a plurality of workpiece products; measuring qualities of the first workpiece products respectively; performing a temperature measurement on each of the melt pools on the powder bed; performing photography on each of the melt pools on the powder bed; extracting a length and a width of each of the melt pools; performing a melt-pool feature processing operation; first converting each of the workspace images to a gray level co-occurrence matrix (GLCM); building a conjecture model by using a plurality of sets of first process data and the actual metrology values of the first workpiece products in accordance with a prediction algorithm; and predicting a virtual metrology value of the second workpiece product by using the conjecture model based on a set of second process data.Type: ApplicationFiled: June 17, 2022Publication date: October 6, 2022Inventors: Haw-Ching YANG, Yu-Lung LO, Hung-Chang HSIAO, Shyh-Hau WANG, Min-Chun HU, Chih-Hung HUANG, Fan-Tien CHENG
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Publication number: 20220297383Abstract: An additive manufacturing (AM) method includes using an AM tool to fabricate a plurality of workpiece products; measuring qualities of the first workpiece products respectively; performing a temperature measurement on each of the melt pools on the powder bed during a fabrication of each of the workpiece products; performing photography on each of the melt pools on the powder bed during the fabrication of each of the workpiece products; extracting a length and a width of each of the melt pools; performing a melt-pool feature processing operation; building a conjecture model by using a plurality of sets of first process data and the actual metrology values of the first workpiece products in accordance with a prediction algorithm; and predicting a virtual metrology value of the second workpiece product by using the conjecture model based on a set of second process data.Type: ApplicationFiled: June 6, 2022Publication date: September 22, 2022Inventors: Haw-Ching Yang, Yu-Lung Lo, Hung-Chang Hsiao, Shyh-Hau Wang, Min-Chun Hu, Chih-Hung Huang, Fan-Tien Cheng
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Patent number: 11383446Abstract: An additive manufacturing (AM) system, an AM method, and an AM feature extraction method are provided. The AM system includes an AM tool, a product metrology system, an in-situ metrology system, a virtual metrology (VM) system, a compensator, a track planner, a controller, a simulator and an augmented reality (AR) device. The simulator is used to find feasible parameter ranges, while the AR device is used to support operations and maintenance of the AM tool. The product metrology system, the in-situ metrology system and the VM system are integrated to estimate the variation of material on a powder bed of the AM tool. The compensator is used for compensating the process variation by adjusting process parameters. The product metrology system is used to measure the quality of products. The in-situ metrology system is used to collect features of melt pools on the powder bed.Type: GrantFiled: October 2, 2019Date of Patent: July 12, 2022Assignee: NATIONAL CHENG KUNG UNIVERSITYInventors: Haw-Ching Yang, Yu-Lung Lo, Hung-Chang Hsiao, Shyh-Hau Wang, Min-Chun Hu, Chih-Hung Huang, Fan-Tien Cheng
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Patent number: 11383450Abstract: An additive manufacturing (AM) system, an AM method, and an AM feature extraction method are provided. The AM system includes an AM tool, a product metrology system, an in-situ metrology system, a virtual metrology (VM) system, a compensator, a track planner, a controller, a simulator and an augmented reality (AR) device. The simulator is used to find feasible parameter ranges, while the AR device is used to support operations and maintenance of the AM tool. The product metrology system, the in-situ metrology system and the VM system are integrated to estimate the variation of material on a powder bed of the AM tool. The compensator is used for compensating the process variation by adjusting process parameters. The product metrology system is used to measure the quality of products. The in-situ metrology system is used to collect features of melt pools on the powder bed.Type: GrantFiled: April 22, 2020Date of Patent: July 12, 2022Assignee: NATIONAL CHENG KUNG UNIVERSITYInventors: Haw-Ching Yang, Yu-Lung Lo, Hung-Chang Hsiao, Shyh-Hau Wang, Min-Chun Hu, Chih-Hung Huang, Fan-Tien Cheng
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Publication number: 20200247064Abstract: An additive manufacturing (AM) system, an AM method, and an AM feature extraction method are provided. The AM system includes an AM tool, a product metrology system, an in-situ metrology system, a virtual metrology (VM) system, a compensator, a track planner, a controller, a simulator and an augmented reality (AR) device. The simulator is used to find feasible parameter ranges, while the AR device is used to support operations and maintenance of the AM tool. The product metrology system, the in-situ metrology system and the VM system are integrated to estimate the variation of material on a powder bed of the AM tool. The compensator is used for compensating the process variation by adjusting process parameters. The product metrology system is used to measure the quality of products. The in-situ metrology system is used to collect features of melt pools on the powder bed.Type: ApplicationFiled: April 22, 2020Publication date: August 6, 2020Inventors: Haw-Ching YANG, Yu-Lung LO, Hung-Chang HSIAO, Shyh-Hau WANG, Min-Chun HU, Chih-Hung HUANG, Fan-Tien CHENG
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Publication number: 20200147893Abstract: An additive manufacturing (AM) system, an AM method, and an AM feature extraction method are provided. The AM system includes an AM tool, a product metrology system, an in-situ metrology system, a virtual metrology (VM) system, a compensator, a track planner, a controller, a simulator and an augmented reality (AR) device. The simulator is used to find feasible parameter ranges, while the AR device is used to support operations and maintenance of the AM tool. The product metrology system, the in-situ metrology system and the VM system are integrated to estimate the variation of material on a powder bed of the AM tool. The compensator is used for compensating the process variation by adjusting process parameters. The product metrology system is used to measure the quality of products. The in-situ metrology system is used to collect features of melt pools on the powder bed.Type: ApplicationFiled: October 2, 2019Publication date: May 14, 2020Inventors: Haw-Ching YANG, Yu-Lung LO, Hung-Chang HSIAO, Shyh-Hau WANG, Min-Chun HU, Chih-Hung HUANG, Fan-Tien CHENG
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Patent number: 7220229Abstract: A density/solute monitor having at least one ultrasound probe, a signal processing unit, and a computing mechanism, and process for using the same, to measure phase shift between emitting and receiving ultrasound, sound velocity, compressibility, density, and solute concentration of fluid flowing through a fluid processing system. The ultrasound probe emits and receives ultrasound waves through the fluid and the signal-processing unit and computing mechanism process the ultrasound waves to determine phase and time shift. The computing mechanism converts phase shift to density, compressibility, and solute concentration measurements of the fluid. Calibrating fluids calibrate the detected phase shift in terms of sound velocity in the factory. Measurements provide information about passage of solutes and flow to achieve better solute collection efficiency, solution purity, and control of fluid processing systems.Type: GrantFiled: October 20, 2003Date of Patent: May 22, 2007Assignee: Global Monitors, Inc.Inventors: Lian-Pin Lee, Jen-Shih Lee, Shyh-Hau Wang, Mike Min
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Publication number: 20040087860Abstract: A density/solute monitor having at least one ultrasound probe, a signal processing unit, and a computing mechanism, and process for using the same, to measure phase shift between emitting and receiving ultrasound, sound velocity, compressibility, density, and solute concentration of fluid flowing through a fluid processing system. The ultrasound probe emits and receives ultrasound waves through the fluid and the signal-processing unit and computing mechanism process the ultrasound waves to determine phase and time shift. The computing mechanism converts phase shift to density, compressibility, and solute concentration measurements of the fluid. Calibrating fluids calibrate the detected phase shift in terms of sound velocity in the factory. Measurements provide information about passage of solutes and flow to achieve better solute collection efficiency, solution purity, and control of fluid processing systems.Type: ApplicationFiled: October 20, 2003Publication date: May 6, 2004Inventors: Lian-Pin Lee, Jen-Shih Lee, Shyh-Hau Wang, Mike Mia