Abstract: A spoke wrench for a bicycle comprises a body, at least two driving members and a screwdriver bit. The body includes a driving seat having a slide way formed therein. A slot way is integrally formed on the body. The body has at least one depression for engaging with the driving member. A positioning portion which is integrally formed with the body has a receiving chamber, a opening is formed through the positioning portion for communicating with the receiving chamber, a steel ball is then retractably defined in the opening of the positioning portion. At least two driving members are detachably received in the slide way of the driving seat and the depressions of the body. A screwdriver bit is detachably received in the receiving chamber of the positioning portion of the body for engaging with a workpiece to tighten or loosen it.

Abstract: The present invention provides a C-V method for measuring an effective channel length in a device, which can simultaneously measure a gate-to-drain overlap length and a gate etch bias length in the device. In the present method, the measured length of the gate by using the present method has a deviation below 5% compared with the real gate length form SEM. Furthermore, the calculating method of the present invention only uses simple simultaneous equations, which can be measured by a man or a mechanism. As the layout rule shrunk, the present method provides a simple way to measure those parameters, which have become more and more important in the device.

Abstract: The present invention provides a C-V method for measuring an effective channel length in a device, which can simultaneously measure a gate-to-drain overlap length and a gate etch bias length in the device. In the present method, the measured length of the gate by using the present method has a deviation below 5% to compare with the real gate length form SEM. Furthermore, the calculating method of the present invention is only using simple simultaneous equations, which can be measured by a man or a mechanism. As the layout rule shrunk, the present method provides a simple way to measure those parameters, which become more and more important in the device.