Patents by Inventor Si-Hun Choi

Si-Hun Choi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Power System for Electrified Vehicle and Control Method Thereof
    Publication number: 20240149733
    Abstract: A power system for an electrified vehicle comprising a first power source device, a first converter having a first end connected to the first power source device, a second power source device, a motor driving device comprising a motor and an inverter, a switch device configured to selectively connect a second end of the first converter to the second power source device or the motor driving device, and a controller configured to control the switch device such that the second end of the first converter is connected to the second power source device when the first power source device is charged with power of the second power source device and such that the second end of the first converter is connected to the motor driving device when the motor performs regenerative braking.
    Type: Application
    Filed: April 19, 2023
    Publication date: May 9, 2024
    Inventors: Min Seong Choi, In Yong Yeo, Jong Eun Byun, Sang Jin Kim, Jin Young Yang, Si Hun Yang
  • Probe pin, inspection jig, inspection unit and inspection device
    Patent number: 10962564
    Abstract: A probe pin includes a first contact part and a second contact part; a middle part located between the first contact part and the second contact part; a first flexible part configured to move the first contact part relative to the middle part in the first arrangement direction; and a movable part configured to move the second contact part relative to the middle part in a direction intersecting with the first arrangement direction.
    Type: Grant
    Filed: December 3, 2018
    Date of Patent: March 30, 2021
    Assignee: Omron Corporation
    Inventors: Naoya Sasano, Hirotada Teranishi, Takahiro Sakai, Si-Hun Choi
  • PROBE PIN, INSPECTION JIG, INSPECTION UNIT AND INSPECTION DEVICE
    Publication number: 20190242926
    Abstract: A probe pin includes a first contact part and a second contact part; a middle part located between the first contact part and the second contact part; a first flexible part configured to move the first contact part relative to the middle part in the first arrangement direction; and a movable part configured to move the second contact part relative to the middle part in a direction intersecting with the first arrangement direction.
    Type: Application
    Filed: December 3, 2018
    Publication date: August 8, 2019
    Applicant: OMRON Corporation
    Inventors: Naoya Sasano, Hirotada Teranishi, Takahiro Sakai, Si-Hun Choi