Patents by Inventor Sichen YAN

Sichen YAN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10110879
    Abstract: A calibration method is described for a telecentric imaging 3D shape measurement system, including step S1: establishing a telecentric 3D shape measurement system; S2: controlling a telecentric projection equipment to project a sinusoidal fringe pattern to a translation stage, and collecting the sinusoidal fringe pattern by a telecentric camera equipment; moving the translation stage to different depth, then obtaining absolute phase values of a pixel for calibration by a phase-shifting method; and conducting linear fitting on the series of absolute phase values of the pixel and the corresponding depths to obtain a phase-depth conversion of the measurement system; and S3: transforming pixel coordinates on the image plane of the telecentric camera equipment into world coordinates through calibrating parameters of the telecentric camera equipment. A relationship between phase and depth herein is linear, and only needs to calibrate the linearity of one pixel.
    Type: Grant
    Filed: February 24, 2016
    Date of Patent: October 23, 2018
    Assignee: SHENZHEN UNIVERSITY
    Inventors: Jindong Tian, Dong Li, Sichen Yan, Yong Tian
  • Publication number: 20160261851
    Abstract: A calibration method is described for a telecentric imaging 3D shape measurement system, including step S1: establishing a telecentric 3D shape measurement system; S2: controlling a telecentric projection equipment to project a sinusoidal fringe pattern to a translation stage, and collecting the sinusoidal fringe pattern by a telecentric camera equipment; moving the translation stage to different depth, then obtaining absolute phase values of a pixel for calibration by a phase-shifting method; and conducting linear fitting on the series of absolute phase values of the pixel and the corresponding depths to obtain a phase-depth conversion of the measurement system; and S3: transforming pixel coordinates on the image plane of the telecentric camera equipment into world coordinates through calibrating parameters of the telecentric camera equipment. A relationship between phase and depth herein is linear, and only needs to calibrate the linearity of one pixel.
    Type: Application
    Filed: February 24, 2016
    Publication date: September 8, 2016
    Inventors: Jindong TIAN, Dong LI, Sichen YAN, Yong TIAN