Patents by Inventor Sicong Zhu

Sicong Zhu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11966900
    Abstract: A transaction record is created showing a purchase transaction of a customer. A CV profile showing a list of items in the transaction obtained from images is also obtained. The items in the transaction record are compared to items on the list. When there is a discrepancy, an action to take is determined.
    Type: Grant
    Filed: July 16, 2020
    Date of Patent: April 23, 2024
    Assignee: Walmart Apollo, LLC
    Inventors: Zhichun Xiao, Lingfeng Zhang, Jon Hammer, Joseph Duffy, Yao Liu, Sicong Fang, Xiang Yao, Pingyuan Wang, Yu Tao, Tianyi Mao, Yutao Tang, Feiyun Zhu, Han Zhang, Chunmei Wang, Pingjian Yu, Muzzammil Afroz, Haining Liu
  • Patent number: 11693046
    Abstract: A test and measurement instrument including a signal generator configured to generate a waveform to be sent over a cable to a device under test (DUT) and a real-time waveform monitor (RTWM) circuit. The RTWM is configured to determine a propagation delay of the cable, capture a first waveform, including an incident waveform and a reflection waveform at a first test point between the signal generator and the DUT, capture a second waveform including at least the incident waveform at a second test point between the signal generator and the DUT, determine a reflection waveform and the incident waveform based on the first waveform and the second waveform, and determine a DUT waveform based on the incident waveform, the reflection waveform, and the propagation delay. The DUT waveform represents the waveform generated by the signal generator as received by the DUT.
    Type: Grant
    Filed: October 1, 2018
    Date of Patent: July 4, 2023
    Assignee: Tektronix, Inc.
    Inventors: Yufang Li, Sicong Zhu, Hua Wei, Fan Huang, Ye Yang
  • Patent number: 10890604
    Abstract: A test and measurement instrument having a signal generator circuit and a waveform monitor circuit for monitoring a waveform received at a device under test (DUT). The signal generator circuit generates a waveform based on an input from a user, while the waveform monitor circuit sends captured signals to a processor to determine a waveform received at the DUT. The waveform monitor captures a signal at a first test point and a second test point, via a switch, and the processor receives the captured signals and using linear equations determines both an incident waveform and a reflected waveform from the DUT.
    Type: Grant
    Filed: July 20, 2017
    Date of Patent: January 12, 2021
    Assignee: Tektronix, Inc.
    Inventors: Jianjie Huang, Sicong Zhu, Hu Tang, Yufang Li, Jin Qian
  • Publication number: 20200329737
    Abstract: The invention relates to the manufacture of food and food ingredients, more in particular to plant-based fibrous structures for use in vegan products such as meat analogs. Provided is a method for the manufacture of an edible protein-based fibrous structure, comprising contacting an aqueous solution of a non-denatured potato protein with a carboxy methyl cellulose (CMC) having a Mw of at least 150,000 Dalton (Da) to yield a fiber forming solution, which fiber forming solution has a total dry matter (TDM) content in the range of 0.5 to 15%, and wherein said contacting is performed in the pH range of 2 to 5 and while mixing thereby inducing the formation of a potato protein-based edible fibrous structure.
    Type: Application
    Filed: October 31, 2018
    Publication date: October 22, 2020
    Inventors: Sicong ZHU, Vân Anh PHAN, Marc Christiaan LAUS
  • Publication number: 20190033364
    Abstract: A test and measurement instrument including a signal generator configured to generate a waveform to be sent over a cable to a device under test (DUT) and a real-time waveform monitor (RTWM) circuit. The RTWM is configured to determine a propagation delay of the cable, capture a first waveform, including an incident waveform and a reflection waveform at a first test point between the signal generator and the DUT, capture a second waveform including at least the incident waveform at a second test point between the signal generator and the DUT, determine a reflection waveform and the incident waveform based on the first waveform and the second waveform, and determine a DUT waveform based on the incident waveform, the reflection waveform, and the propagation delay. The DUT waveform represents the waveform generated by the signal generator as received by the DUT.
    Type: Application
    Filed: October 1, 2018
    Publication date: January 31, 2019
    Applicant: Tektronix, Inc.
    Inventors: Yufang Li, Sicong Zhu, Hua Wei, Fan Huang, Ye Yang
  • Publication number: 20190025344
    Abstract: A test and measurement instrument having a signal generator circuit and a waveform monitor circuit for monitoring a waveform received at a device under test (DUT). The signal generator circuit generates a waveform based on an input from a user, while the waveform monitor circuit sends captured signals to a processor to determine a waveform received at the DUT. The waveform monitor captures a signal at a first test point and a second test point, via a switch, and the processor receives the captured signals and using linear equations determines both an incident waveform and a reflected waveform from the DUT.
    Type: Application
    Filed: July 20, 2017
    Publication date: January 24, 2019
    Applicant: Tektronix, Inc.
    Inventors: Jianjie Huang, Sicong Zhu, Hu Tang, Yufang Li, Jin Qian