Abstract: Method and apparatus for mass spectral analysis of unknown species of matter present on a surface even in extremely low concentrations. A probe beam such as an ion beam, electron beam or laser is directed to the surface under examination to remove a sample of material. An untuned, high-intensity laser is directed to a spatial region proximate to the surface. The laser has sufficient intensity to induce a high degree of nonresonant, and hence non-selective, photoionization of the sample of material within the laser beam. The non-selectively ionized sample is then subjected to mass spectral analysis to determine the nature of the unknown species.

Abstract: A flowing discharge ion source for supplying negative and positive ions to a mass spectrometer has an elongated, confined flow and discharge region through which flow the sample to be analyzed and a reagent gas and in which ionizing discharge electrodes are located. Inlet and outlet gas flow orifices are independently variable so that the reagent gas pressure in the discharge region and flow velocity therethrough are controlled. Controlling flow velocity provides one way for determining reagent and sample gas residence time, which is further controlled by making the position of the discharge electrodes adjustable along the length of the ionization region. A controllable heater is provided upstream of the discharge region to regulate reagent and sample gas temperature.

Abstract: An ionization source comprises a housing defining a space, a wire extending o the space, a temperature control connected to the wire and an alkali metal glass bead attached to the wire to be heated by the temperature control. An ion extraction plate with an orifice therein covers the space and is insulated from the housing by an insulating ring. The housing includes a port for drawing a vacuum from the space and for leaking molecules into the space which are to form quasi ions on the glass bead. A focusing plate may also be provided over the extraction plate with an aperture lying on an ion axis which also extends through the orifice for the focusing of the ion beam.