Abstract: The invention relates to a method for the sequential measurement of a plurality of semiconductor-based light sources such as LEDs, OLEDs or VCSELs, in particular comparatively low-luminosity light sources such as so-called micro-LEDs. The invention further relates to a device for carrying out the method. The object of the present invention is to provide a method that operates faster, more accurately and more sensitively than the known methods, which operate by scanning with a photodiode or with a spectrometer. The method according to the invention proposes for this that a current pulse is applied by means of a pulsed current source (1) to the low-luminosity light sources consecutively or simultaneously.

Abstract: In a method and a circuit arrangement for recovering a digital signal having digital pulses from a recorded signal which is read by a read head of a storage device, the shape of the recorded signal, being a reproduction of the digital signal, is compared with the shape of a normal read signal previously stored as a comparison pattern of voltage values. In the case of agreement, which is given on the presence of a certain correlation, the recorded signal is evaluated as a digital pulse and otherwise on non-agreement as a digital non-pulse.