Abstract: A system for controlling a filling level of a reservoir filled with a liquid includes the reservoir configured to be filled with the liquid at least up to a maximum filling level. The system also includes a probe including a probe body, at least a section of the probe body extending, in a height dimension of the reservoir, from a first position to a second position, the first position being lower than the second position, and the second position being above the maximum filling level, and further including a temperature dependent sensor configured to generate a sensor signal based on a temperature at the second position, the temperature depending on the filling level. The system also includes a controller for controlling the filling level of the reservoir depending on the sensor signal such that the filling level is kept constant.

Abstract: A modular specimen holder (10?) for high pressure freezing and/or X-ray crystallography of a specimen has a specimen holding element (100?) and an extension element (200?) connectable with and separable from each other; the specimen holding element (100?) including a tubule (120?) adapted to hold the specimen and a base element (110?) adapted to hold the tubule (120?), wherein a distance from a bottom of the base element (110?) to a top of the tubule (120?) is a first distance (d1); the extension element (200?) being connectable with the base element (110?), wherein, when the extension element (200?) and the base element (110?) are connected with each other, a second distance (d2) from a bottom of the extension element (200?) to the top of the tubule (120?) is larger than the first distance (d1).

Abstract: The present invention relates to modular specimen holder (10?) for high pressure freezing and/or X-ray crystallography of a specimen comprising a specimen holding element (100?) and an extension element (200?) connectable with each other and separable from each other; the specimen holding element (100?) comprising a tubule (120?) and a base element (110?), wherein the tubule (120?) is adapted to hold the specimen, the base element (110?) is adapted to hold the tubule (120?), wherein a distance from a bottom of the base element (110?) to a top of the tubule (120?) is a distance d1; the extension element (200?) being adapted to be connected with the base element (110?), wherein, when the extension element (200?) and the base element (110?) are connected with each other, a distance from a bottom of the extension element (200?) to the top of the tubule (120?) is a second distance d2; wherein the second distance d2 is larger than the first distance d1.

Abstract: An apparatus for staining sample sections, comprising: a chamber that is adapted for fastening sample sections therein; and a pump that is adapted for pumping liquids through the chamber. The chamber has an inlet and an outlet. The inlet can be connected to at least one reservoir of a staining liquid via inlet lines that are controllable by valves. The inlet lines are formed at least in the region of the associated valves by means of elastic hose lines, and the valves are formed as hose pinch valves. This apparatus minimizes or eliminates contaminations arising from staining processes for thin sections that are in particular prepared for examination in an electron microscope.

Abstract: A vibrating microtome and measuring device for measuring the transverse offset of a vibrating knife comprises a light barrier into which the knife is placeable and a control application signal (pklo, pkhi) that describes the time course of the vibration of the knife and an electronic measurement system of the measuring device measures the coverage of the light barrier as an oscillating signal (tpm), and determines the transverse offset from the signal values at points in time that are defined by the control application signal.

Abstract: In a vibrating microtome (1), a knife (6) is caused to vibrate during a sectioning operation in a direction parallel to a section plane and substantially parallel to the knife's edge, during which a transverse offset can occur as a consequence of a potentially present inclination of the cutting edge with respect to the section plane. A measuring device (3) for measuring the transverse offset comprises a light barrier (9) into which the cutting edge is placeable so as to partially cover the light of the light barrier. The vibrating microtome (1) generates, from the motion of the knife, a control application signal (pklo, pkhi) that describes the time course of the vibration of the knife (6), and the electronic measurement system of the measuring device (3) measures the coverage of the light barrier as a consequence of the vibration of the knife as an oscillating signal (tpm), and determines the transverse offset from the signal values at points in time that are defined by the control application signal.

Abstract: A vibrating microtome and measuring device for measuring the transverse offset of a vibrating knife comprises a light barrier into which the knife is placeable and a control application signal (pklo, pkhi) that describes the time course of the vibration of the knife and an electronic measurement system of the measuring device measures the coverage of the light barrier as an oscillating signal (tpm), and determines the transverse offset from the signal values at points in time that are defined by the control application signal.

Abstract: An apparatus for staining sample sections, comprising: a chamber that is adapted for fastening sample sections therein; and a pump that is adapted for pumping liquids through the chamber. The chamber has an inlet and an outlet. The inlet can be connected to at least one reservoir of a staining liquid via inlet lines that are controllable by valves. The inlet lines are formed at least in the region of the associated valves by means of elastic hose lines, and the valves are formed as hose pinch valves. This apparatus minimizes or eliminates contaminations arising from staining processes for thin sections that are in particular prepared for examination in an electron microscope.

Abstract: In a vibrating microtome (1), a knife (6) is caused to vibrate during a sectioning operation in a direction parallel to a section plane and substantially parallel to the knife's edge, during which a transverse offset can occur as a consequence of a potentially present inclination of the cutting edge with respect to the section plane. A measuring device (3) for measuring the transverse offset comprises a light barrier (9) into which the cutting edge is placeable so as to partially cover the light of the light barrier. The vibrating microtome (1) generates, from the motion of the knife, a control application signal (pklo, pkhi) that describes the time course of the vibration of the knife (6), and the electronic measurement system of the measuring device (3) measures the coverage of the light barrier as a consequence of the vibration of the knife as an oscillating signal (tpm), and determines the transverse offset from the signal values at points in time that are defined by the control application signal.

Abstract: A cooling chamber 10 for a microtome 1 is disclosed. A knife 2 having a cutting edge 16 is arranged in the cooling chamber 10 opposite a sample holder 4 having a sample 4a retained therein. The microtome 1 further possesses a stereomicroscope 12 having an optical system 14, the optical system 14 defining an optical axis 11. The region of the sample 4a and of the cutting edge 16 of the knife 2 is observable with the stereomicroscope 12. There is mounted in the cooling chamber 10 an illumination system 20 that emits light 20a and is directed onto a surface 2a of the knife 2 in such a way that the light 20a reflects from the surface 2a parallel to the optical axis 11.

Abstract: A cooling chamber 10 for a microtome 1 is disclosed. A knife 2 having a cutting edge 16 is arranged in the cooling chamber 10 opposite a sample holder 4 having a sample 4a retained therein. The microtome 1 further possesses a stereomicroscope 12 having an optical system 14, the optical system 14 defining an optical axis 11. The region of the sample 4a and of the cutting edge 16 of the knife 2 is observable with the stereomicroscope 12. There is mounted in the cooling chamber 10 an illumination system 20 that emits light 20a and is directed onto a surface 2a of the knife 2 in such a way that the light 20a reflects from the surface 2a parallel to the optical axis 11.

Abstract: The invention concerns a unit (2) for automatic delivery of specimen slides to a coverslipper (3). The unit (2) comprises a housing (27) in which a front panel (25) is provided. Also provided is a passage (20) in the housing (27) that is defined substantially by a first and a second cutout (21 and 23) in the first and the second side wall (22 and 24). A transfer position (8) for racks (4) is provided in the region of the cutout (21) in the first side wall (22), and a transport apparatus (9) extends out substantially from the transfer position (8) to beyond the cutout (23) in the second side wall (24).

Abstract: The invention concerns a unit (2) for automatic delivery of specimen slides to a coverslipper (3). The unit (2) comprises a housing (27) in which a front panel (25) is provided. Also provided is a passage (20) in the housing (27) that is defined substantially by a first and a second cutout (21 and 23) in the first and the second side wall (22 and 24). A transfer position (8) for racks (4) is provided in the region of the cutout (21) in the first side wall (22), and a transport apparatus (9) extends out substantially from the transfer position (8) to beyond the cutout (23) in the second side wall (24).