Patents by Inventor Siegfried Wiltsche
Siegfried Wiltsche has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11015930Abstract: A method for a three dimensional surveying of a 3D-scene for deriving a true-to-size 3D-model. It involves deriving a first 3D-partial-model of a section of the 3D-scene together with a capturing of at least one first 2D-visual-image and a second 3D-partial-model of another section of the 3D-scene, together with a capturing of at least one second 2D-visual-image, wherein the 3D-partial-models are partially overlapping. The first 3D-partial-model is conglomerated with the second 3D-partial-model to form the 3D-model of the 3D-scene, which is done with defining a first line segment in the first 2D-visual-image and a second line segment in the second 2D-visual-image, which first and second line segments are representing a visual feature, which is common in both of the 2D-visual-images. The line segments in the 2D-visual-images are utilized in conglomerating the corresponding 3D-partial models to form the 3D-model of the whole 3D-scene.Type: GrantFiled: November 20, 2018Date of Patent: May 25, 2021Assignee: LEICA GEOSYSTEMS AGInventors: Bernhard Metzler, Tobias Heller, Siegfried Wiltsche
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Patent number: 10645363Abstract: A method for an image-based measurement of a scene using a handheld apparatus, including a recording of at least one first image and one second image of the scene by at least one camera of the apparatus, a photogrammetric evaluating of the first and the second image, and a graphic outputting of an image representation of the scene on a display unit, characterized by an automatically proceeding edge measurement functionality, as part of which, in each case without user intervention, edges in the scene are identified utilizing at least one image of the scene, edge lengths of the identified edges are ascertained based on the photogrammetrically evaluated images, and the ascertained edge lengths are displayed in the image representation of the scene.Type: GrantFiled: November 20, 2018Date of Patent: May 5, 2020Assignee: LEICA GEOSYSTEMS AGInventors: Elmar Vincent Van Der Zwan, Tobias Heller, Siegfried Wiltsche
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Publication number: 20190162534Abstract: A method for a three dimensional surveying of a 3D-scene for deriving a true-to-size 3D-model. It involves deriving a first 3D-partial-model of a section of the 3D-scene together with a capturing of at least one first 2D-visual-image and a second 3D-partial-model of another section of the 3D-scene, together with a capturing of at least one second 2D-visual-image, wherein the 3D-partial-models are partially overlapping. The first 3D-partial-model is conglomerated with the second 3D-partial-model to form the 3D-model of the 3D-scene, which is done with defining a first line segment in the first 2D-visual-image and a second line segment in the second 2D-visual-image, which first and second line segments are representing a visual feature, which is common in both of the 2D-visual-images. The line segments in the 2D-visual-images are utilized in conglomerating the corresponding 3D-partial models to form the 3D-model of the whole 3D-scene.Type: ApplicationFiled: November 20, 2018Publication date: May 30, 2019Applicant: LEICA GEOSYSTEMS AGInventors: Bernhard METZLER, Tobias HELLER, Siegfried WILTSCHE
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Publication number: 20190158806Abstract: A method for an image-based measurement of a scene using a handheld apparatus, including a recording of at least one first image and one second image of the scene by at least one camera of the apparatus, a photogrammetric evaluating of the first and the second image, and a graphic outputting of an image representation of the scene on a display unit, characterized by an automatically proceeding edge measurement functionality, as part of which, in each case without user intervention, edges in the scene are identified utilizing at least one image of the scene, edge lengths of the identified edges are ascertained based on the photogrammetrically evaluated images, and the ascertained edge lengths are displayed in the image representation of the scene.Type: ApplicationFiled: November 20, 2018Publication date: May 23, 2019Applicant: LEICA GEOSYSTEMS AGInventors: Elmar Vincent VAN DER ZWAN, Tobias HELLER, Siegfried WILTSCHE
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Patent number: 10162057Abstract: Some embodiments of the invention relate to a method for capturing a relative position of at least one first spatial point by means of a portable distance measuring device, the method comprising positioning a known reference object, which has known features which may be captured by optical means, said features being arranged in a pattern designed for a resection, at least one first measuring process, comprising measuring a first distance to the first spatial point, and recording a first reference image linked in time with measuring the first distance, the reference object being imaged in the first reference image, and ascertaining the position and orientation of the distance measuring device relative to the reference object comprising identifying the reference object, recalling stored information about the known features of the identified reference object and identifying positions of known features of the reference object in the first reference image.Type: GrantFiled: December 14, 2016Date of Patent: December 25, 2018Assignee: LEICA GEOSYSTEMS AGInventors: Bernhard Metzler, Beat Aebischer, Knut Siercks, Siegfried Wiltsche
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Publication number: 20170168160Abstract: Some embodiments of the invention relate to a method for capturing a relative position of at least one first spatial point by means of a portable distance measuring device, the method comprising positioning a known reference object, which has known features which may be captured by optical means, said features being arranged in a pattern designed for a resection, at least one first measuring process, comprising measuring a first distance to the first spatial point, and recording a first reference image linked in time with measuring the first distance, the reference object being imaged in the first reference image, and ascertaining the position and orientation of the distance measuring device relative to the reference object comprising identifying the reference object, recalling stored information about the known features of the identified reference object and identifying positions of known features of the reference object in the first reference image.Type: ApplicationFiled: December 14, 2016Publication date: June 15, 2017Applicant: LEICA GEOSYSTEMS AGInventors: Bernhard METZLER, Beat AEBISCHER, Knut SIERCKS, Siegfried WILTSCHE
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Patent number: 9441990Abstract: Some embodiments may include a capacitive rotary position encoder for the absolute determination of a rotary position about a rotary spindle. The rotary position encoder may include a transceiver unit, comprising a first arrangement of N electrically conductive, capacitive sensitivity areas which are embodied as angle segments over a defined angle range, which are distributed uniformly over the circumference, an electrically conductive reference area and an evaluation circuit, by means of which an electrical capacitance value between the reference area and one of the sensitivity areas is determinable. In some embodiments the sensitivity areas and the reference area are embodied as conductor track structures on a first electronics printed circuit board.Type: GrantFiled: July 8, 2014Date of Patent: September 13, 2016Assignee: LEICA GEOSYSTEMS AGInventors: Peter Forrer, Siegfried Wiltsche
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Publication number: 20150015277Abstract: Some embodiments may include a capacitive rotary position encoder for the absolute determination of a rotary position about a rotary spindle. The rotary position encoder may include a transceiver unit, comprising a first arrangement of N electrically conductive, capacitive sensitivity areas which are embodied as angle segments over a defined angle range, which are distributed uniformly over the circumference, an electrically conductive reference area and an evaluation circuit, by means of which an electrical capacitance value between the reference area and one of the sensitivity areas is determinable. In some embodiments the sensitivity areas and the reference area are embodied as conductor track structures on a first electronics printed circuit board.Type: ApplicationFiled: July 8, 2014Publication date: January 15, 2015Inventors: Peter FORRER, Siegfried WILTSCHE
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Publication number: 20060118043Abstract: A method of manufacturing electronic or opto-electronic or micromechanic components by providing a vacuum where the external surface of a wall is exposed to ambient air and the inner surface enclosed as a processing area. A base body of a part to be manufactured is introduced into the processing area and a low energy plasma discharged is generated in the process area, the ion energy at the surface of the base body is between 0 and 15 eV in order to introduce a reactive gas. Subsequently, the reactive gas treats the base body in order to separate the processing area from an inner surface of the wall and enclosing the processing area during the treatment.Type: ApplicationFiled: November 14, 2005Publication date: June 8, 2006Inventors: Rudolf Wagner, Siegfried Wiltsche, Juergen Ramm
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Publication number: 20030070608Abstract: A method, installation and reactor is for the production of components or of their intermediate products. Each component in the process of being produced as a structural member, is subjected to a treatment process and several of the structural members are simultaneously subjected to a common CVD process under conditions of ultrahigh vacuum. The treatment process is a vacuum process and from it the structural members are supplied to the CVD process under vacuum.Type: ApplicationFiled: October 12, 2001Publication date: April 17, 2003Inventors: Hans Martin Buschbeck, Philipp Bartholet, Siegfried Wiltsche, Jurgen Ramm
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Publication number: 20020160620Abstract: A method of manufacturing electronic or opto-electronic or micromechanic components by providing a vacuum where the external surface of a wall is exposed to ambient air and the inner surface enclosed as a processing area. A base body of a part to be manufactured is introduced into the processing area and a low energy plasma discharged is generated in the process area, the ion energy at the surface of the base body is between 0 and 15 eV in order to introduce a reactive gas. Subsequently, the reactive gas treats the base body in order to separate the processing area from an inner surface of the wall and enclosing the processing area during the treatment.Type: ApplicationFiled: February 26, 2001Publication date: October 31, 2002Inventors: Rudolf Wagner, Siegfried Wiltsche, Juergen Ramm