Patents by Inventor Sigrid C. Kuebler

Sigrid C. Kuebler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11852584
    Abstract: The present disclosure describes an apparatus of measuring light scattering of a sample. In an embodiment, the apparatus includes (1) at least one display logically coupled to an enclosure housing a light scattering measurement instrument, where the at least one display is configured to allow for operating the instrument to acquire light scattering data from the sample and for accessing the data, (2) an indicator connected to an outside surface of the enclosure, where the indicator is configured to indicate at least one status of the instrument, (3) a sample chamber configured to accommodate at least one sample cell, where each of the at least one sample cell has a unique size and a unique shape, and (4) and a sample door connected to the enclosure, where the sample door is configured to seal the sample chamber, thereby providing thermal insulation to the sample chamber.
    Type: Grant
    Filed: September 16, 2021
    Date of Patent: December 26, 2023
    Assignee: Wyatt Technology, LLC
    Inventors: Sigrid C. Kuebler, Ross E. Bryant, Shiladitya Sen, Ryan Olson, Nicholas Wong, Marco Vanella, Ryan Thomas, Patrick Tufts, Jared Naito
  • Patent number: 11719631
    Abstract: The present disclosure describes a computer implemented method, a system, and a computer program product of measuring light scattering of a sample.
    Type: Grant
    Filed: September 16, 2021
    Date of Patent: August 8, 2023
    Assignee: WYATT TECHNOLOGY CORPORATION
    Inventors: Dwight Kahng, Cha Lee, Sigrid C. Kuebler, Ross E. Bryant
  • Publication number: 20220147234
    Abstract: The present disclosure describes a computer implemented method, a system, and a computer program product of measuring light scattering of a sample.
    Type: Application
    Filed: September 16, 2021
    Publication date: May 12, 2022
    Applicant: Wyatt Technology Corporation
    Inventors: Dwight Kahng, Cha Lee, Sigrid C. Kuebler, Ross E. Bryant
  • Publication number: 20220082498
    Abstract: The present disclosure describes an apparatus of measuring light scattering of a sample.
    Type: Application
    Filed: September 16, 2021
    Publication date: March 17, 2022
    Applicant: Wyatt Technology Corporation
    Inventors: Sigrid C. Kuebler, Ross E. Bryant, Shiladitya Sen, Ryan Olson, Nicholas Wong, Marco Vanella, Ryan Thomas, Patrick Tufts, Jared Naito
  • Publication number: 20040242427
    Abstract: The invention relates to a solid crop protection formulation comprising
    Type: Application
    Filed: May 6, 2004
    Publication date: December 2, 2004
    Inventors: Sebastian Koltzenburg, Wolfgang Schrof, Michael Seufert, Robert Heger, Stephan Lehmann, Uwe Kardorff, Cyrill Zagar, Matthias Bratz, Eric D. Carlson, Han Ting Chang, Sigrid C. Kuebler
  • Patent number: 6819420
    Abstract: Methods, systems and devices are described for rapid characterization and screening of liquid samples to determine properties (e.g., particle size, particle size distribution, molar mass and/or molar mass distribution) thereof with static light scattering and/or dynamic light scattering. The liquid samples can be solutions, emulsions, suspensions or dispersions. One method, includes providing a vessel containing a liquid sample having an exposed surface that defines a gas-liquid sample interface, and analyzing the sample by light scattering methods that include transmitting light through the gas-liquid sample interface into the sample, and detecting light scattered from the sample or from a component thereof. Additional methods are directed to characterizing a plurality of liquid samples or components thereof. The methods, systems, and devices have applications in high-throughput screening, and particularly, in combinatorial materials research and in industrial process control.
    Type: Grant
    Filed: January 13, 2003
    Date of Patent: November 16, 2004
    Assignee: Symyx Technologies, Inc.
    Inventors: Sigrid C. Kuebler, James Bennett
  • Publication number: 20030142309
    Abstract: Methods, systems and devices are described for rapid characterization and screening of liquid samples to determine properties (e.g., particle size, particle size distribution, molar mass and/or molar mass distribution) thereof with static light scattering and/or dynamic light scattering. The liquid samples can be solutions, emulsions, suspensions or dispersions. One method, includes providing a vessel containing a liquid sample having an exposed surface that defines a gas-liquid sample interface, and analyzing the sample by light scattering methods that include transmitting light through the gas-liquid sample interface into the sample, and detecting light scattered from the sample or from a component thereof. Additional methods are directed to characterizing a plurality of liquid samples or components thereof. The methods, systems, and devices have applications in high-throughput screening, and particularly, in combinatorial materials research and in industrial process control.
    Type: Application
    Filed: January 13, 2003
    Publication date: July 31, 2003
    Applicant: Symyx Technologies, Inc.
    Inventors: Sigrid C. Kuebler, James Bennett
  • Patent number: 6577392
    Abstract: Rapid characterization and screening of polymer samples to determine average molecular weight, molecular weight distribution and other properties is disclosed. Rapid flow characterization systems and methods, including liquid chromatography and flow-injection analysis systems and methods are preferably employed. High throughput, automated sampling systems and methods, high-temperature characterization systems and methods, and rapid, indirect calibration compositions and methods are also disclosed. The described methods, systems, and devices have primary applications in combinatorial polymer research and in industrial process control.
    Type: Grant
    Filed: November 28, 2000
    Date of Patent: June 10, 2003
    Assignee: Symyx Technologies, Inc.
    Inventors: Ralph B. Nielsen, Sigrid C. Kuebler, Thomas S. Lee, Adam Safir, Miroslav Petro
  • Patent number: 6519032
    Abstract: Methods, systems and devices are described for rapid characterization and screening of liquid samples to determine properties (e.g., particle size, particle size distribution, molar mass and/or molar mass distribution) thereof with static light scattering and/or dynamic light scattering. The liquid samples can be solutions, emulsions, suspensions or dispersions. One method, includes providing a vessel containing a liquid sample having an exposed surface that defines a gas-liquid sample interface, and analyzing the sample by light scattering methods that include transmitting light through the gas-liquid sample interface into the sample, and detecting light scattered from the sample or from a component thereof. Additional methods are directed to characterizing a plurality of liquid samples or components thereof. The methods, systems, and devices have applications in high-throughput screening, and particularly, in combinatorial materials research and in industrial process control.
    Type: Grant
    Filed: October 11, 2000
    Date of Patent: February 11, 2003
    Assignee: Symyx Technologies, Inc.
    Inventors: Sigrid C. Kuebler, James Bennett