Patents by Inventor Sigrid Lipsett

Sigrid Lipsett has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5592086
    Abstract: A magnetic resonance apparatus is provided to analyze, diagnose, or treat matter. In general, the MRA is used to transmit a synthesized resonance pattern into the subject matter under test which encounters the inherent resonance pattern produced by the tested subject matter. This information is returned to the MRA, which, after removing the static capacity and resistance, is analyzed, digitized and compared to a coded predetermined resonance pattern and examined for irregularities. The presence or lack of irregularities can be used to analyze and diagnose matter. A second set of test pattern signals can also be applied to alter the substance's natural magnetic resonance, thereby treating the substance to achieve a particular resonance pattern.
    Type: Grant
    Filed: October 19, 1994
    Date of Patent: January 7, 1997
    Inventors: Ronald J. Weinstock, Sigrid Lipsett
  • Patent number: 5517119
    Abstract: The magnetic resonance signal analyzer allows to automatically generate a large variety of test signals including one or more frequencies. The test signals can be applied as electromagnetic fields or as currents to material under test. An electromagnetic or electrical response signal of the material under test be applied to the analyzer for processing to determine the response pattern of the material under test and then returned to the automatic controller of the frequency sources. The automatic controller determines the test signal with the most effective response for the particular matter under test.
    Type: Grant
    Filed: April 19, 1994
    Date of Patent: May 14, 1996
    Inventors: Ronald J. Weinstock, Sigrid Lipsett
  • Patent number: 5317265
    Abstract: The magnetic resonance signal analyzer allows to generate a large variety of test signals including one or more frequencies. The test signals can be applied as electromagnetic fields or as currents to material under test. An electromagnetic or electrical response signal of the material under test be applied to the analyzer for processing to determine the response pattern of the material under test.
    Type: Grant
    Filed: September 16, 1992
    Date of Patent: May 31, 1994
    Inventors: Ronald J. Weinstock, Sigrid Lipsett