Abstract: Systems and method for sensing an accessed voltage value associated with a memory cell is described. In different embodiments, a memory array may include a different number of sense components. Moreover, each sense component may receive latching signals to latch the accessed voltage value of memory cells of the memory array based on different timings. For example, the memory array may latch digit line voltages of memory cells positioned farther from a respective word line driver at a later time based on a latching signal with a higher delay. Such memory arrays may include circuitry to receive and/or generate the delayed latching signals as well as selection circuitry for latching the digit line voltages based on a selected delayed latching signals.

Abstract: Systems and method for sensing an accessed voltage value associated with a memory cell is described. In different embodiments, a memory array may include a different number of sense amplifiers. Moreover, each sense amplifier may include capacitors with different capacitance values to compensate for a difference in received charges associated with a similar memory state caused by various circuit delays. For example, farther memory cells from a word line driver may receive activation signals with higher delays which in turn may result in delayed activation. As such, the sense amplifiers may include capacitors with varying capacitance values to compensate for an amount charge received at a latching time caused by delayed provision of charges associated with the targeted memory states.

Abstract: Memory with DQS pulse control circuitry is disclosed herein. In one embodiment, a memory device comprises a DQS terminal and circuitry operably coupled to the DQS terminal. The DQS terminal is configured to receive an external DQS signal including a first pulse having a first width. In turn, the circuitry is configured to generate a second pulse based at least in part on the first pulse and output an internal DQS signal including the second pulse. The second pulse can have a second width greater than the first width. In some embodiments, the external DQS signal can further include a third pulse having a third width greater than the second width. In such embodiments, the circuitry can be further configured to generate and output a fourth pulse based at least in part on the third pulse that has a fourth width equivalent to the third width.

Abstract: There are provided a memory device for supporting a command bus training (CBT) mode and a method of operating the same. The memory device is configured to enter a CBT mode or exit from the CBT mode in response to a logic level of a first data signal, which is not included in second data signals, which are in one-to-one correspondence with command/address signals, which are used to output a CBT pattern in the CBT mode. The memory device is further configured to change a reference voltage value in accordance with a second reference voltage setting code received by terminals associated with the second data signals, to terminate the command/address signals or a pair of data clock signals to a resistance value corresponding to an on-die termination (ODT) code setting stored in a mode register, and to turn off ODT of data signals in the CBT mode.

Abstract: There are provided a memory device for supporting a command bus training (CBT) mode and a method of operating the same. The memory device is configured to enter a CBT mode or exit from the CBT mode in response to a logic level of a first data signal, which is not included in second data signals, which are in one-to-one correspondence with command/address signals, which are used to output a CBT pattern in the CBT mode. The memory device is further configured to change a reference voltage value in accordance with a second reference voltage setting code received by terminals associated with the second data signals, to terminate the command/address signals or a pair of data clock signals to a resistance value corresponding to an on-die termination (ODT) code setting stored in a mode register, and to turn off ODT of data signals in the CBT mode.

Abstract: A system (100) for providing a timing signal with tunable temperature dependency in an electronic device may include a timing circuit (102) and an initial setting circuit (104). The timing circuit (102) may include a delay stage (106) and a gate stage (108). The delay stage (106) may be configured to receive an input signal and to produce a delayed signal by introducing a delay to the input signal. The gate stage (108) may be configured to receive the delayed signal and a threshold setting signal, to produce an output signal using the delayed signal and a logic threshold, and to set an initial value of the logic threshold according to the threshold setting signal. The initial setting circuit (104) may be configured to allow the threshold setting signal to be tuned for providing the time delay with a specified temperature dependency.

Abstract: An electronic device may include a main circuit including multiple sub-circuits powered by a direct-current (DC) power supply circuit. The main circuit has a main circuit current demand being a time-varying demand for a DC voltage-regulated supply current being a function of a number of the sub-circuits being active. The DC power supply circuit may include multiple DC voltage regulators to provide the main circuit with the supply current and a command decoding and power management circuit to control enablement of the voltage regulators. The command decoding and power management circuit may be configured to detect an instant value of the main circuit current demand and to selectively enable one or more of the voltage regulators based on the detected instant value.

Abstract: Memory with DQS pulse control circuitry is disclosed herein. In one embodiment, a memory device comprises a DQS terminal and circuitry operably coupled to the DQS terminal. The DQS terminal is configured to receive an external DQS signal including a first pulse having a first width. In turn, the circuitry is configured to generate a second pulse based at least in part on the first pulse and output an internal DQS signal including the second pulse. The second pulse can have a second width greater than the first width. In some embodiments, the external DQS signal can further include a third pulse having a third width greater than the second width. In such embodiments, the circuitry can be further configured to generate and output a fourth pulse based at least in part on the third pulse that has a fourth width equivalent to the third width.

Abstract: A method of controlling on-die termination (ODT) in a multi-rank system including a plurality of memory ranks is provided. The method includes: enabling ODT circuits of the plurality of memory ranks into an initial state when the multi-rank system is powered on; enabling the ODT circuits of a write target memory rank and non-target memory ranks among the plurality of memory ranks during a write operation; and disabling the ODT circuit of a read target memory rank among the plurality of memory ranks while enabling the ODT circuits of non-target memory ranks among the plurality of memory ranks during a read operation.

Abstract: An electronic device may include a main circuit including multiple sub-circuits powered by a direct-current (DC) power supply circuit. The main circuit has a main circuit current demand being a time-varying demand for a DC voltage-regulated supply current being a function of a number of the sub-circuits being active. The DC power supply circuit may include multiple DC voltage regulators to provide the main circuit with the supply current and a command decoding and power management circuit to control enablement of the voltage regulators. The command decoding and power management circuit may be configured to detect an instant value of the main circuit current demand and to selectively enable one or more of the voltage regulators based on the detected instant value.

Abstract: There are provided a memory device for supporting a command bus training (CBT) mode and a method of operating the same. The memory device is configured to enter a CBT mode or exit from the CBT mode in response to a logic level of a first data signal, which is not included in second data signals, which are in one-to-one correspondence with command/address signals, which are used to output a CBT pattern in the CBT mode. The memory device is further configured to change a reference voltage value in accordance with a second reference voltage setting code received by terminals associated with the second data signals, to terminate the command/address signals or a pair of data clock signals to a resistance value corresponding to an on-die termination (ODT) code setting stored in a mode register, and to turn off ODT of data signals in the CBT mode.

Abstract: An electronic device may include a main circuit including multiple sub-circuits powered by a direct-current (DC) power supply circuit. The main circuit has a main circuit current demand being a time-varying demand for a DC voltage-regulated supply current being a function of a number of the sub-circuits being active. The DC power supply circuit may include multiple DC voltage regulators to provide the main circuit with the supply current and a command decoding and power management circuit to control enablement of the voltage regulators. The command decoding and power management circuit may be configured to detect an instant value of the main circuit current demand and to selectively enable one or more of the voltage regulators based on the detected instant value.

Abstract: An electronic device may include a main circuit including multiple sub-circuits powered by a direct-current (DC) power supply circuit. The main circuit has a main circuit current demand being a time-varying demand for a DC voltage-regulated supply current being a function of a number of the sub-circuits being active. The DC power supply circuit may include multiple DC voltage regulators to provide the main circuit with the supply current and a command decoding and power management circuit to control enablement of the voltage regulators. The command decoding and power management circuit may be configured to detect an instant value of the main circuit current demand and to selectively enable one or more of the voltage regulators based on the detected instant value.

Abstract: There are provided a memory device for supporting a command bus training (CBT) mode and a method of operating the same. The memory device is configured to enter a CBT mode or exit from the CBT mode in response to a logic level of a first data signal, which is not included in second data signals, which are in one-to-one correspondence with command/address signals, which are used to output a CBT pattern in the CBT mode. The memory device is further configured to change a reference voltage value in accordance with a second reference voltage setting code received by terminals associated with the second data signals, to terminate the command/address signals or a pair of data clock signals to a resistance value corresponding to an on-die termination (ODT) code setting stored in a mode register, and to turn off ODT of data signals in the CBT mode.

Abstract: A method of controlling on-die termination (ODT) in a multi-rank system including a plurality of memory ranks is provided. The method includes: enabling ODT circuits of the plurality of memory ranks into an initial state when the multi-rank system is powered on; enabling the ODT circuits of a write target memory rank and non-target memory ranks among the plurality of memory ranks during a write operation; and disabling the ODT circuit of a read target memory rank among the plurality of memory ranks while enabling the ODT circuits of non-target memory ranks among the plurality of memory ranks during a read operation.

Abstract: A method of controlling on-die termination (ODT) in a multi-rank system including a plurality of memory ranks is provided. The method includes: enabling ODT circuits of the plurality of memory ranks into an initial state when the multi-rank system is powered on; enabling the ODT circuits of a write target memory rank and non-target memory ranks among the plurality of memory ranks during a write operation; and disabling the ODT circuit of a read target memory rank among the plurality of memory ranks while enabling the ODT circuits of non-target memory ranks among the plurality of memory ranks during a read operation.

Abstract: There are provided a memory device for supporting a command bus training (CBT) mode and a method of operating the same. The memory device is configured to enter a CBT mode or exit from the CBT mode in response to a logic level of a first data signal, which is not included in second data signals, which are in one-to-one correspondence with command/address signals, which are used to output a CBT pattern in the CBT mode. The memory device is further configured to change a reference voltage value in accordance with a second reference voltage setting code received by terminals associated with the second data signals, to terminate the command/address signals or a pair of data clock signals to a resistance value corresponding to an on-die termination (ODT) code setting stored in a mode register, and to turn off ODT of data signals in the CBT mode.

Abstract: A method of controlling on-die termination (ODT) in a multi-rank system including a plurality of memory ranks is provided. The method includes: enabling ODT circuits of the plurality of memory ranks into an initial state when the multi-rank system is powered on; enabling the ODT circuits of a write target memory rank and non-target memory ranks among the plurality of memory ranks during a write operation; and disabling the ODT circuit of a read target memory rank among the plurality of memory ranks while enabling the ODT circuits of non-target memory ranks among the plurality of memory ranks during a read operation.

Abstract: There are provided, a memory device for supporting a command bus training (CBT) mode and a method of operating the same. The memory device is configured to enter a CBT mode or exit from the CBT mode in response to a logic level of a first data signal, which is not included in second data signals, which are in one-to-one correspondence with command/address signals, which are used to output a CBT pattern in the CBT mode. The memory device is further configured to change a reference voltage value in accordance with a second reference voltage setting code received by terminals associated with the second data signals, to terminate the command/address signals or a pair of data clock signals to a resistance value corresponding to an on-die termination (ODT) code setting stored in a mode register, and to turn off ODT of data signals in the CBT mode.

Abstract: A method of controlling on-die termination (ODT) in a multi-rank system including a plurality of memory ranks is provided. The method includes: enabling ODT circuits of the plurality of memory ranks into an initial state when the multi-rank system is powered on; enabling the ODT circuits of a write target memory rank and non-target memory ranks among the plurality of memory ranks during a write operation; and disabling the ODT circuit of a read target memory rank among the plurality of memory ranks while enabling the ODT circuits of non-target memory ranks among the plurality of memory ranks during a read operation.