Patents by Inventor SII NANOTECHNOLOGY INC.

SII NANOTECHNOLOGY INC. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20130180019
    Abstract: Provided is a method of evaluating a probe tip shape in a scanning probe microscope, including: measuring the probe tip shape by a probe shape test sample having a needle-like structure; determining radii of cross-sections at a plurality of distances from the apex; and calculating, based on the distances and the radii, a radios of curvature when the probe tip shape is approximated by a circle.
    Type: Application
    Filed: January 9, 2013
    Publication date: July 11, 2013
    Applicant: SII NANOTECHNOLOGY INC.
    Inventor: SII NANOTECHNOLOGY INC.
  • Publication number: 20130175446
    Abstract: Provided is a lamella preparation apparatus including an EB column (1), an FIB column (2), a reflected electron detector (5) for detecting charged particles released from a lamella (21), an input unit (10) for setting a first measurement region (41) on an upper side and a second measurement region (42) on a lower side of the lamella (21), and a calculation unit (15) for calculating a slant angle of the lamella (21) from a detected amount of the charged particles generated from the first measurement region (41) and a detected amount of the charged particles generated from the second measurement region (42) by irradiation of the electron beam (8) and a distance between the first measurement region (41) and the second measurement region (42).
    Type: Application
    Filed: December 6, 2012
    Publication date: July 11, 2013
    Applicant: SII NANOTECHNOLOGY INC.
    Inventor: SII NANOTECHNOLOGY INC.