Patents by Inventor Silke Reitz

Silke Reitz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9664803
    Abstract: A method for calibrating a counting digital X-ray detector includes performing a threshold value scan in at least one defined X-ray spectrum for irradiating the X-ray detector, which includes a matrix composed of pixel elements, storing count rates of the pixel elements as a function of respective applied threshold values, and from results of a measurement of count rates of the pixel elements, determining or calculating individual correction threshold values for the individual pixel elements. The individual correction threshold values correct a threshold value that is to be applied to the pixel elements for the defined X-ray spectrum such that threshold value noise is reduced.
    Type: Grant
    Filed: July 25, 2016
    Date of Patent: May 30, 2017
    Assignee: Siemens Healthcare GmbH
    Inventors: Silke Reitz, Martin Spahn
  • Publication number: 20160334521
    Abstract: A method for calibrating a counting digital X-ray detector includes performing a threshold value scan in at least one defined X-ray spectrum for irradiating the X-ray detector, which includes a matrix composed of pixel elements, storing count rates of the pixel elements as a function of respective applied threshold values, and from results of a measurement of count rates of the pixel elements, determining or calculating individual correction threshold values for the individual pixel elements. The individual correction threshold values correct a threshold value that is to be applied to the pixel elements for the defined X-ray spectrum such that threshold value noise is reduced.
    Type: Application
    Filed: July 25, 2016
    Publication date: November 17, 2016
    Inventors: Silke Reitz, Martin Spahn
  • Patent number: 9417345
    Abstract: A method for calibrating a counting digital X-ray detector includes performing a threshold value scan in at least one defined X-ray spectrum for irradiating the X-ray detector, which includes a matrix composed of pixel elements, storing count rates of the pixel elements as a function of respective applied threshold values, and from results of a measurement of count rates of the pixel elements, determining or calculating individual correction threshold values for the individual pixel elements. The individual correction threshold values correct a threshold value that is to be applied to the pixel elements for the defined X-ray spectrum such that threshold value noise is reduced.
    Type: Grant
    Filed: January 2, 2014
    Date of Patent: August 16, 2016
    Assignee: Siemens Aktiengesellschaft
    Inventors: Silke Reitz, Martin Spahn
  • Publication number: 20140185781
    Abstract: A method for calibrating a counting digital X-ray detector includes performing a threshold value scan in at least one defined X-ray spectrum for irradiating the X-ray detector, which includes a matrix composed of pixel elements, storing count rates of the pixel elements as a function of respective applied threshold values, and from results of a measurement of count rates of the pixel elements, determining or calculating individual correction threshold values for the individual pixel elements. The individual correction threshold values correct a threshold value that is to be applied to the pixel elements for the defined X-ray spectrum such that threshold value noise is reduced.
    Type: Application
    Filed: January 2, 2014
    Publication date: July 3, 2014
    Inventors: Silke Reitz, Martin Spahn