Patents by Inventor Silvere Lux

Silvere Lux has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240151793
    Abstract: A system, method and computer program product for generating a data record of a training dataset set configured to train a neural network for determination of the concentration of a particular target molecule in an NMR sample. An NMR spectrum associated with a known concentration of the target molecule is obtained. The obtained NMR spectrum is adjusted by applying a random shift to generate an adjusted NMR spectrum. A background generator adds a background spectrum which reflects contributions of impurities in the NMR sample. The resulting NMR spectrum together with the information about the concentration of the target molecule is then stored as a new data record of the training dataset.
    Type: Application
    Filed: December 15, 2023
    Publication date: May 9, 2024
    Inventor: Silvère Lux
  • Patent number: 10890676
    Abstract: Provided is a device for spectrometry of a radiation of photons, including a detector configured to receive the radiation and to deliver, at an output, an electrical signal that is a function of the radiation (X) received, a reference database that can be parameterised by means of a first parameter, a comparator configured to establish a comparison between the electrical signal and the reference signal, the comparator delivering a signal (E(t)) representative of the energy of each photon of the radiation and a quality factor (B(t)) of the comparison, and a feedback loop enabling the first parameter of the reference database to be adapted so as to optimise the quality factor (B(t)).
    Type: Grant
    Filed: October 25, 2017
    Date of Patent: January 12, 2021
    Assignee: DETECTION TECHNOLOGY SAS
    Inventors: Eric Marche, Silvère Lux
  • Publication number: 20190250288
    Abstract: Provided is a device for spectrometry of a radiation of photons, including a detector configured to receive the radiation and to deliver, at an output, an electrical signal that is a function of the radiation (X) received, a reference database that can be parameterised by means of a first parameter, a comparator configured to establish a comparison between the electrical signal and the reference signal, the comparator delivering a signal (E(t)) representative of the energy of each photon of the radiation and a quality factor (B(t)) of the comparison, and a feedback loop enabling the first parameter of the reference database to be adapted so as to optimise the quality factor (B(t)).
    Type: Application
    Filed: October 25, 2017
    Publication date: August 15, 2019
    Applicant: DETECTION TECHNOLOGY SAS
    Inventors: Eric MARCHE, Silvère LUX
  • Patent number: 9322937
    Abstract: A method for detecting ionizing radiation using a pixelated semi-conductor detector. When the radiation interacts with the detector, the affected pixel is determined, together with the instant of impact for this pixel. A first instant before and a second instant after the instant of impact are deduced from this. The deviations of the signals coming from an assembly of pixels adjacent to the affected point are then measured, with the deviations being measured between the first and second instants. The position of the point of interaction of the radiation with the semi-conductor is estimated from the deviations thus measured.
    Type: Grant
    Filed: October 8, 2013
    Date of Patent: April 26, 2016
    Assignee: Commissariat à l'énergie atomique et aux énergies alternatives
    Inventors: Silvere Lux, Guillaume Montemont
  • Publication number: 20150260854
    Abstract: A method for detecting ionising radiation using a pixelated semi-conductor detector. When the radiation interacts with the detector, the affected pixel is determined, together with the instant of impact for this pixel. A first instant before and a second instant after the instant of impact are deduced from this. The deviations of the signals coming from an assembly of pixels adjacent to the affected point are then measured, with the deviations being measured between the first and second instants. The position of the point of interaction of the radiation with the semi-conductor is estimated from the deviations thus measured.
    Type: Application
    Filed: October 8, 2013
    Publication date: September 17, 2015
    Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
    Inventors: Silvere Lux, Guillaume Montemont