Patents by Inventor Siming Lin

Siming Lin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7668376
    Abstract: System and method for analyzing an image. A received image, comprising an object or objects, is optionally preprocessed. Invariant shape features of the object(s) are extracted using a generalized invariant feature descriptor. The generalized invariant feature descriptor may comprise a generalized invariant feature vector comprising components corresponding to attributes of each object, e.g., related to circularity, elongation, perimeter-ratio-based convexity, area-ratio-based convexity, hole-perimeter-ratio, hole-area-ratio, and/or functions of Hu Moment 1 and/or Hu Moment 2. Non-invariant features, e.g., scale and reflection, may be extracted to form corresponding feature vectors.
    Type: Grant
    Filed: December 3, 2004
    Date of Patent: February 23, 2010
    Assignee: National Instruments Corporation
    Inventors: Siming Lin, Kevin M. Crotty, Nicolas Vazquez
  • Publication number: 20090122304
    Abstract: A substrate illumination and inspection system provides for illuminating and inspecting a substrate particularly the substrate edge. The system uses a light diffuser with a plurality of lights disposed at its exterior or interior for providing uniform diffuse illumination of a substrate. An optic and imaging system exterior of the light diffuser are used to inspect the plurality of surfaces of the substrate including specular surfaces. An automatic defect characterization processor is provided.
    Type: Application
    Filed: August 8, 2008
    Publication date: May 14, 2009
    Applicant: Accretech USA, Inc.
    Inventors: Ju Jin, Satish Sadam, Vishal Verma, Zhiyan Huang, Siming Lin, Michael D. Robbins, Paul F. Forderhase
  • Publication number: 20090116727
    Abstract: A substrate illumination and inspection system provides for illuminating and inspecting a substrate particularly the substrate edge. The system a image processor to automatically detect and characterize defects on the wafer's edge.
    Type: Application
    Filed: August 8, 2008
    Publication date: May 7, 2009
    Applicant: Accretech USA, Inc.
    Inventors: Ju Jin, Satish Sadam, Vishal Verma, Zhiyan Huang, Siming Lin, Michael D. Robbins, Paul F. Forderhase
  • Patent number: 7508504
    Abstract: A substrate illumination and inspection system provides for illuminating and inspecting a substrate particularly the substrate edge. The system uses a light diffuser with a plurality of lights disposed at its exterior or interior for providing uniform diffuse illumination of a substrate. An optic and imaging system exterior of the light diffuser are used to inspect the plurality of surfaces of the substrate including specular surfaces. The optic can be rotated radially relative to a center point of the substrate edge to allow for focused inspection of all surfaces of the substrate edge.
    Type: Grant
    Filed: August 9, 2007
    Date of Patent: March 24, 2009
    Assignee: Accretech USA, Inc.
    Inventors: Ju Jin, Satish Sadam, Vishal Verma, Zhiyan Huang, Siming Lin, Michael D Robbins, Paul F. Forderhase
  • Publication number: 20080030731
    Abstract: A substrate illumination and inspection system provides for illuminating and inspecting a substrate particularly the substrate edge. The system uses a light diffuser with a plurality of lights disposed at its exterior or interior for providing uniform diffuse illumination of a substrate. An optic and imaging system exterior of the light diffuser are used to inspect the plurality of surfaces of the substrate including specular surfaces. The optic can be rotated radially relative to a center point of the substrate edge to allow for focused inspection of all surfaces of the substrate edge.
    Type: Application
    Filed: August 9, 2007
    Publication date: February 7, 2008
    Applicant: Accretech USA, Inc.
    Inventors: Ju Jin, Satish Sadam, Vishal Verma, Zhiyan Huang, Siming Lin, Michael Robbins, Paul Forderhase
  • Patent number: 7046842
    Abstract: A system and method for measuring the similarity of multiple-color images and for locating regions of a target image having color information that matches, at least to a degree, the color information of a template image. A color characterization method operates to characterize the colors of an image and to measure the similarity between multiple-color images. For each image pixel, the method determines a color category or bin for the respective pixel based on HSI values of the respective pixel, wherein the color category is one of a plurality of possible color categories in HSI color space. In various embodiments, the weight of the pixel may be fractionally distributed across a plurality of color categories, e.g., as determined by applying fuzzy pixel classification with a fuzzy membership function. The percentage of pixels assigned to each category is then determined. The percentage of pixels in each color category is then used as a color feature vector to represent the color information of the color image.
    Type: Grant
    Filed: December 13, 2000
    Date of Patent: May 16, 2006
    Assignee: National Instruments Corporation
    Inventors: Siming Lin, Dinesh Nair, Darren Schmidt
  • Patent number: 7039229
    Abstract: A system and method for locating regions in a target image matching a template image with respect to color and pattern information. The template image is characterized with regard to pattern and color. A first-pass search is made using color information from the color characterization of the template image to find color match candidate locations preferably via a hill-climbing technique. For each color match candidate location, a luminance pattern matching search is performed, optionally using a hill-climbing technique, on a region proximal to the location, producing final match regions. For each final match region a hue plane pattern match score may be calculated using pixel samples from the interior of each pattern. A final color match score may be calculated for each final match region. A final score is calculated from luminance pattern match, color match, and possibly hue pattern match, scores, and the scores and sum output.
    Type: Grant
    Filed: October 26, 2001
    Date of Patent: May 2, 2006
    Assignee: National Instruments Corporation
    Inventors: Siming Lin, Dinesh Nair, Darren R. Schmidt
  • Publication number: 20060008151
    Abstract: System and method for analyzing an image. A received image, comprising an object or objects, is optionally preprocessed. Invariant shape features of the object(s) are extracted using a generalized invariant feature descriptor. The generalized invariant feature descriptor may comprise a generalized invariant feature vector comprising components corresponding to attributes of each object, e.g., related to circularity, elongation, perimeter-ratio-based convexity, area-ratio-based convexity, hole-perimeter-ratio, hole-area-ratio, and/or functions of Hu Moment 1 and/or Hu Moment 2. Non-invariant features, e.g., scale and reflection, may be extracted to form corresponding feature vectors.
    Type: Application
    Filed: December 3, 2004
    Publication date: January 12, 2006
    Inventors: Siming Lin, Kevin Crotty, Nicolas Vazquez
  • Patent number: 6963425
    Abstract: A system and method for locating regions in a target image that match a template image with respect to color and pattern information. The method may comprise performing a first-pass search using color information obtained in a color characterization analysis of the template image in order to find a plurality of color match candidate locations. For each color match candidate location, a region proximal to the location may then be searched in detail, based on pattern information obtained in a pattern analysis of the template image.
    Type: Grant
    Filed: August 14, 2000
    Date of Patent: November 8, 2005
    Assignee: National Instruments Corporation
    Inventors: Dinesh Nair, Siming Lin, Darren Schmidt, Nicolas Vazqúez
  • Patent number: 6944331
    Abstract: A system and method for locating regions in a target image that match a template image with respect to color and pattern information. The template image is characterized with regard to pattern and color. The method comprises performing a first-pass search using color information from the color characterization of the template image to find one or more color match candidate locations. For each color match candidate location, a luminance, i.e., gray scale, pattern matching search is performed on a region proximal to the location, producing one or more final match regions. For each final match region a hue plane pattern match score may be calculated using pixel samples from the interior of each pattern. A final color match score may be calculated for each final match region. A weighted sum of luminance pattern match, hue pattern match, and color match scores may be calculated, and the scores and sum output.
    Type: Grant
    Filed: October 26, 2001
    Date of Patent: September 13, 2005
    Assignee: National Instruments Corporation
    Inventors: Darren R. Schmidt, Kevin L. Schultz, Siming Lin, Dinesh Nair
  • Publication number: 20040228526
    Abstract: A system and method for measuring the similarity of multiple-color images and for locating regions of a target image having color information that matches, at least to a degree, the color information of a template image. A color characterization method operates to characterize the colors of an image and to measure the similarity between multiple-color images. For each image pixel, the method determines a color category or bin for the respective pixel based on HSI values of the respective pixel, wherein the color category is one of a plurality of possible color categories in HSI color space. In various embodiments, the weight of the pixel may be fractionally distributed across a plurality of color categories, e.g., as determined by applying fuzzy pixel classification with a fuzzy membership function. The percentage of pixels assigned to each category is then determined. The percentage of pixels in each color category is then used as a color feature vector to represent the color information of the color image.
    Type: Application
    Filed: December 13, 2000
    Publication date: November 18, 2004
    Inventors: Siming Lin, Dinesh Nair, Darren Schmidt
  • Patent number: 6757428
    Abstract: A color characterization method operates to analyze each respective pixel of at least a subset of the pixels of an image object. The image is obtained in HSI format, or alternatively converted from another format to HSI. For each respective pixel, the method determines a color category or bin for the respective pixel based on values of the respective pixel. The color category is one a plurality of possible color categories or bins in the HSI color space. As the pixels are analyzed and assigned to color categories, the method stores information in tho computer regarding the number or percentage or pixels in each of the color categories. A color matching method uses the color characterization method. The color matching method determines similarity of colors between a template image object and a region of interest (ROI).
    Type: Grant
    Filed: August 17, 1999
    Date of Patent: June 29, 2004
    Assignee: National Instruments Corporation
    Inventors: Siming Lin, Dinesh Nair
  • Publication number: 20030083850
    Abstract: A system and method for locating regions in a target image that match a template image with respect to color and pattern information. The template image is characterized with regard to pattern and color. The method comprises performing a first-pass search using color information from the color characterization of the template image to find one or more color match candidate locations. For each color match candidate location, a luminance, i.e., gray scale, pattern matching search is performed on a region proximal to the location, producing one or more final match regions. For each final match region a hue plane pattern match score may be calculated using pixel samples from the interior of each pattern. A final color match score may be calculated for each final match region. A weighted sum of luminance pattern match, hue pattern match, and color match scores may be calculated, and the scores and sum output.
    Type: Application
    Filed: October 26, 2001
    Publication date: May 1, 2003
    Inventors: Darren R. Schmidt, Kevin L. Schultz, Siming Lin, Dinesh Nair
  • Publication number: 20020102018
    Abstract: A system and method for measuring the similarity of multiple-color images and for locating regions of a target image having color information that matches, at least to a degree, the color information of a template image. A color characterization method operates to characterize the colors of an image and to measure the similarity between multiple-color images. For each image pixel, the method determines a color category or bin for the respective pixel based on HSI values of the respective pixel, wherein the color category is one of a plurality of possible color categories in HSI color space. In various embodiments, the weight of the pixel may be fractionally distributed across a plurality of color categories, e.g., as determined by applying fuzzy pixel classification with a fuzzy membership function. The percentage of pixels assigned to each category is then determined. The percentage of pixels in each color category is then used as a color feature vector to represent the color information of the color image.
    Type: Application
    Filed: December 13, 2000
    Publication date: August 1, 2002
    Inventors: Siming Lin, Dinesh Nair, Darren Schmidt
  • Publication number: 20020041705
    Abstract: A system and method for locating regions in a target image matching a template image with respect to color and pattern information. The template image is characterized with regard to pattern and color. A first-pass search is made using color information from the color characterization of the template image to find color match candidate locations preferably via a hill-climbing technique. For each color match candidate location, a luminance pattern matching search is performed, optionally using a hill-climbing technique, on a region proximal to the location, producing final match regions. For each final match region a hue plane pattern match score may be calculated using pixel samples from the interior of each pattern. A final color match score may be calculated for each final match region. A final score is calculated from luminance pattern match, color match, and possibly hue pattern match, scores, and the scores and sum output.
    Type: Application
    Filed: October 26, 2001
    Publication date: April 11, 2002
    Applicant: National Instruments Corporation
    Inventors: Siming Lin, Dinesh Nair, Darren R. Schmidt