Abstract: A broadband antenna structure has an electrically conductive enclosure with a closed end, over which a non-electrically conductive cover is placed. A radiating portion of an antenna feed layer comprising a conductive patch antenna element is placed in between the enclosure and the cover. The patch antenna element design is inherently broader band than that of conventional cavity-backed slot-radiating antennas, which are constrained in bandwidth by the need to keep the cavity formed in the enclosure small. The dielectric constant of the dielectric material of the cover reduces the required size of the conductive antenna element. The broadband antenna structure may be connected with an electronic device to form an antenna arrangement in which a portion of the antenna feed layer extends through an opening in a surface of an antenna housing, the portion being within an electronic device enclosure of the electronic device.

Abstract: The invention relates to methods for analyzing the miscibility of compositions. The methods may further quantify the degree of miscibility of the compositions.

Abstract: A method of analyzing patterns. The method comprises: receiving a first diffraction pattern; receiving a second diffraction pattern; receiving a third diffraction pattern; determining a similarity between the first and second diffraction patterns; determining a similarity between the first and third diffraction pattern; determining a similarity between the second and third diffraction pattern; and performing hierarchical cluster analysis on the first and second diffraction pattern based on the determined similarity.

Abstract: An assay for analytically determining the amount of an impurity in a solid sample is provided. This X-ray diffraction method preferably uses the Rietveld refinement.

Abstract: Embodiments of the invention relate to a broadband antenna structure and an antenna arrangement comprising the antenna structure and an electronic device. In one aspect, the antenna employs an electrically conductive enclosure with a closed end, over which a non-electrically conductive cover is placed. A radiating portion of the antenna feed layer comprising a conductive patch antenna element is placed in between the enclosure and the cover. This patch antenna element design is inherently broader band than that of conventional cavity-backed slot-radiating antennas, which are constrained in bandwidth by the need to keep the cavity formed in the enclosure small, so that the column elements may be arranged in an array at substantially half-wavelength spacing. The new design suffers less compromise in terms of bandwidth in achieving the same size constraint.

Abstract: A method for treating hyperphosphatemia using lanthanum carbonate, including analytically determining the amount of an impurity in the lanthanum carbonate sample is provided. This X-ray diffraction method preferably uses the Rietveld refinement.

Abstract: A method of analyzing patterns. The method comprises: receiving a first diffraction pattern; receiving a second diffraction pattern; receiving a third diffraction pattern; determining a similarity between the first and second diffraction patterns; determining a similarity between the first and third diffraction pattern; determining a similarity between the second and third diffraction pattern; and performing hierarchical cluster analysis on the first and second diffraction pattern based on the determined similarity.

Abstract: A method of analyzing patterns. The method comprises: receiving a first diffraction pattern; receiving a second diffraction pattern; receiving a third diffraction pattern; determining a similarity between the first and second diffraction patterns; determining a similarity between the first and third diffraction pattern; determining a similarity between the second and third diffraction pattern; and performing hierarchical cluster analysis on the first and second diffraction pattern based on the determined similarity.

Abstract: A method for treating hyperphosphatemia using lanthanum carbonate, including analytically determining the amount of an impurity in the lanthanum carbonate sample is provided. This X-ray diffraction method preferably uses the Rietveld refinement.

Abstract: Crystalline solid forms may be characterized by their unit cell parameters through a process known as indexing. An embodiment of the invention searches for the unit cell parameters of a crystalline solid form using a Monte-Carlo algorithm that incorporates certain rules to reduce search space. Another embodiment refines the results of the search to identify the correct unit cell parameters of the crystalline solid form. These methods may be automated, conveniently requiring little interaction from the user. The indexing method of the invention may be applied, for example, to distinguish between different crystalline solid forms of a substance.

Abstract: An assay for analytically determining the amount of an impurity in a solid sample is provided. This X-ray diffraction method preferably uses the Rietveld refinement.

Abstract: A method that comprises providing a PDF trace of a first sample of a substance, providing a PDF trace of a second sample of the substance, and comparing the PDF traces to determine whether the substance of the first sample and the substance of the second sample have the same or different solid forms. This embodiment may be used, for example, to distinguish one solid form of a compound from another, to screen for new solid forms of a compound, or to determine whether a disordered crystalline compound has the same solid form as another crystalline sample of the compound.

Abstract: The present invention is directed to methods for characterizing the structure of compositions such as amorphous, crystalline, and combinations thereof. The methods are directed to analyzing pairwise distribution function plots of the components of the compositions and comparing them to the pairwise distribution function plot of the composition.

Abstract: The present invention relates to a method and apparatus for X-ray diffraction analysis. An improved sample holder is provided that includes a curved surface or a plurality of surfaces at different planes. An improved sample holder also has removable individual sample holders.

Abstract: An apparatus and method for determining a parameter of a constituent of a sample employ a radiation source, focusing means for focusing emitted radiation at a first position on the sample, detecting means for detecting the radiation reflected from or transmitted through the sample and adapted to generate a signal representative of the detected radiation, processing means for receiving the signal and determining a parameter of a constituent of the sample corresponding to the signal, and translational repositioning means adapted to translate the focused radiation to a second position on the sample.

Abstract: A method of analyzing patterns. The method comprises: receiving a first diffraction pattern; receiving a second diffraction pattern; receiving a third diffraction pattern; determining a similarity between the first and second diffraction patterns; determining a similarity between the first and third diffraction pattern; determining a similarity between the second and third diffraction pattern; and performing hierarchical cluster analysis on the first and second diffraction pattern based on the determined similarity.