Patents by Inventor Simon Ebbinghaus

Simon Ebbinghaus has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Particle dynamics microscopy using temperature jump and probe anticorrelation/correlation techniques
    Patent number: 8757871
    Abstract: An apparatus and methods for characterizing the response of a particle to a parameter that characterizes an environment of the particle. A change is induced in the parameter characterizing the environment of the particle, where the change is rapid on a timescale characterizing kinetic response of the particle. The response of the particle is then imaged at a plurality of instants over the course of a period of time shorter than the timescale characterizing the kinetic response of the particle. The response may be detected by measuring a temperature jump or by measuring correlation and anticorrelation between probe parameters across pixels. More particularly, the particle may be a molecule, such as a biomolecule, and the environment, more particularly, may be a biological cell. The parameter characterizing the environment of the particle may be a temperature, and change may be induced in the temperature by heating a volume that includes the particle, either conductively or radiatively.
    Type: Grant
    Filed: August 16, 2011
    Date of Patent: June 24, 2014
    Assignee: The Board of Trustees of the University of Illinois
    Inventors: Martin Gruebele, Simon Ebbinghaus, Apratim Dhar, J Douglas McDonald
  • Particle Dynamics Microscopy using Temperature Jump and Probe Anticorrelation/Correlation Techniques
    Publication number: 20120039353
    Abstract: An apparatus and methods for characterizing the response of a particle to a parameter that characterizes an environment of the particle. A change is induced in the parameter characterizing the environment of the particle, where the change is rapid on a timescale characterizing kinetic response of the particle. The response of the particle is then imaged at a plurality of instants over the course of a period of time shorter than the timescale characterizing the kinetic response of the particle. The response may be detected by measuring a temperature jump or by measuring correlation and anticorrelation between probe parameters across pixels. More particularly, the particle may be a molecule, such as a biomolecule, and the environment, more particularly, may be a biological cell. The parameter characterizing the environment of the particle may be a temperature, and change may be induced in the temperature by heating a volume that includes the particle, either conductively or radiatively.
    Type: Application
    Filed: August 16, 2011
    Publication date: February 16, 2012
    Applicant: The Board of Trustees of the University of Illinois
    Inventors: Martin Gruebele, Simon Ebbinghaus, Apratim Dhar, J. Douglas McDonald