Patents by Inventor Simon G. Kroon

Simon G. Kroon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of treating a monocrystalline body utilizing a measuring member consisting of a monocrystalline layer and an adjoining substratum of different index of refraction
    Patent number: 4177094
    Abstract: A method in which a monocrystalline body is subjected in a gas atmosphere to a treatment for changing the thickness of the body, in which the thickness of the body is controlled by means of a measuring member which is subjected to the same treatment and which measuring member, on its side which is subjected to the treatment, consists of a monocrystalline layer and an adjoining substratum of a material having a refractive index differing of that the monocrystalline layer material. The measuring member is obtained by providing a substrate, depositing the monocrystalline layer on the substrate, forming the substratum on the monocrystalline layer, and then removing the substrate to form the measuring member.
    Type: Grant
    Filed: September 13, 1978
    Date of Patent: December 4, 1979
    Assignee: U.S. Philips Corporation
    Inventor: Simon G. Kroon