Patents by Inventor Simon H. Melikian

Simon H. Melikian has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6636634
    Abstract: In one aspect the invention provides processes for locating a pattern within an image that can comprise the acts of providing a template representative of the pattern to be located within an image. The image can be subdivided into a plurality of sub-images, each being representative of a portion of the image. The process can then compare each of the sub-images to the template to generate a plurality of score signals representative of a location of the pattern, and can then process the score signals to determine a location for the pattern. In one practice, the step of processing the score signals can include a step of identifying at least one sub-image that includes a degraded image. As described above, a degraded image can include an image that has had a portion obscured by shadows or debris. Additionally, an image can be degraded at spots of high-reflection that create glare and wash-out portions of the image.
    Type: Grant
    Filed: May 23, 2002
    Date of Patent: October 21, 2003
    Assignee: Coreco Imaging, Inc.
    Inventors: Simon H. Melikian, Rohit G. Israni
  • Publication number: 20030002740
    Abstract: In one aspect the invention provides processes for locating a pattern within an image that can comprise the acts of providing a template representative of the pattern to be located within an image. The image can be subdivided into a plurality of sub-images, each being representative of a portion of the image. The process can then compare each of the sub-images to the template to generate a plurality of score signals representative of a location of the pattern, and can then process the score signals to determine a location for the pattern. In one practice, the step of processing the score signals can include a step of identifying at least one sub-image that includes a degraded image. As described above, a degraded image can include an image that has had a portion obscured by shadows or debris. Additionally, an image can be degraded at spots of high-reflection that create glare and wash-out portions of the image.
    Type: Application
    Filed: May 23, 2002
    Publication date: January 2, 2003
    Inventors: Simon H. Melikian, Rohit G. Israni
  • Patent number: 6477275
    Abstract: In one aspect the invention provides processes for locating a pattern within an image that can comprise the acts of providing a template representative of the pattern to be located within an image. The image can be subdivided into a plurality of sub-images, each being representative of a portion of the image. The process can then compare each of the sub-images to the template to generate a plurality of score signals representative of a location of the pattern, and can then process the score signals to determine a location for the pattern. In one practice, the step of processing the score signals can include a step of identifying at least one sub-image that includes a degraded image. As described above, a degraded image can include an image that has had a portion obscured by shadows or debris. Additionally, an image can be degraded at spots of high-reflection that create glare and wash-out portions of the image.
    Type: Grant
    Filed: June 16, 1999
    Date of Patent: November 5, 2002
    Assignee: Coreco Imaging, Inc.
    Inventors: Simon H. Melikian, Rohit G. Israni