Patents by Inventor Simon Kerkhofs

Simon Kerkhofs has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12418637
    Abstract: A process includes receiving a target quality value, receiving a measured quality value, receiving a source quality value, and sending a source control instruction. The source control instruction is based at least in part on the target quality value, the measured quality value, and the source quality value. The target quality value, the measured quality value, the source quality value, and the source control instruction are communicated via the communication port. The measured quality value is generated by an inspection device configured to inspect a sample. The source quality value is associated with a quality level of a first group of samples. The target quality value indicates a desired quality value of an output group of samples. The source control instruction causes a source selecting device to select one of a plurality of groups of samples, each group having identified quality characteristics.
    Type: Grant
    Filed: October 17, 2022
    Date of Patent: September 16, 2025
    Inventors: Raf Peeters, Pieter Boogaerts, Jef de Busser, Antoon de Cleen, Simon Kerkhofs, Pieter Ieven
  • Publication number: 20230053393
    Abstract: A process includes receiving a target quality value, receiving a measured quality value, and sending an inspection control instruction. The inspection control instruction is based at least in part on the target quality value and the measured quality value. The measured quality value is generated by a product inspector configured to inspect a sample before being sorted and may also include data generated by an output product inspector configured to inspect a sample after passing a sorting phase. The target quality value indicates a desired quality value of an output group of samples. The inspection control instruction controls the method of inspection performed by the product inspector. The measured quality values are received by a computing device, which in turn outputs the inspection control instruction to a product inspector.
    Type: Application
    Filed: November 2, 2022
    Publication date: February 23, 2023
    Inventors: Raf Peeters, Pieter Boogaerts, Jef de Busser, Antoon de Cleen, Simon Kerkhofs, Pieter Ieven
  • Publication number: 20230042481
    Abstract: A process includes receiving a target quality value, receiving a measured quality value, receiving a source quality value, and sending a source control instruction. The source control instruction is based at least in part on the target quality value, the measured quality value, and the source quality value. The target quality value, the measured quality value, the source quality value, and the source control instruction are communicated via the communication port. The measured quality value is generated by an inspection device configured to inspect a sample. The source quality value is associated with a quality level of a first group of samples. The target quality value indicates a desired quality value of an output group of samples. The source control instruction causes a source selecting device to select one of a plurality of groups of samples, each group having identified quality characteristics.
    Type: Application
    Filed: October 17, 2022
    Publication date: February 9, 2023
    Inventors: Raf Peeters, Pieter Boogaerts, Jef de Busser, Antoon de Cleen, Simon Kerkhofs, Pieter Ieven