Patents by Inventor Simon Winkelbach

Simon Winkelbach has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11300402
    Abstract: An example apparatus has a processor to analyze images of projected shifted versions of a fringe pattern onto a scene to obtain phase information associated with the pixels in the image. Topology information is derived by correcting the phase information using a phase offset associated with a combination of two subsequent versions of the fringe pattern in the images or by estimating a surface normal for each pixel using a partial derivative of the phase information of the pixel in a first spatial direction and a partial derivative of the phase information of the pixel in a second spatial direction.
    Type: Grant
    Filed: May 31, 2017
    Date of Patent: April 12, 2022
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventor: Simon Winkelbach
  • Publication number: 20210172733
    Abstract: An example apparatus has a processor to analyze images of projected shifted versions of a fringe pattern onto a scene to obtain phase information associated with the pixels in the image. Topology information is derived by correcting the phase information using a phase offset associated with a combination of two subsequent versions of the fringe pattern in the images or by estimating a surface normal for each pixel using a partial derivative of the phase information of the pixel in a first spatial direction and a partial derivative of the phase information of the pixel in a second spatial direction.
    Type: Application
    Filed: May 31, 2017
    Publication date: June 10, 2021
    Applicant: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.
    Inventor: Simon WINKELBACH
  • Patent number: 10801834
    Abstract: A fringe projection method for determining the topography of a body (12) comprising the steps: projecting a series of sets of patterns (Ti) onto a surface (20) of the body (12), wherein each set has at least two patterns (Ti) and wherein each pattern (Ti) has S fringes; for each pattern (Ti), recording an image (24.i) of the surface (20) having the projected pattern, so that a sequence of recordings is formed; and calculating the topography from the images (24.i), wherein such patterns are projected in which each fringe has an intensity distribution perpendicular to the fringe longitudinal direction (L) and each intensity distribution can be expressed by a function (Q) which has a spatial phase position (?). According to the invention, the phase position (?) changes as a function of a code (g(s)) of the ordinal number (s) of the fringe.
    Type: Grant
    Filed: May 30, 2016
    Date of Patent: October 13, 2020
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Simon Winkelbach, Sven Molkenstruck, Markus Rilk
  • Publication number: 20180112975
    Abstract: A fringe projection method for determining the topography of a body (12) comprising the steps: projecting a series of sets of patterns (Ti) onto a surface (20) of the body (12), wherein each set has at least two patterns (Ti) and wherein each pattern (Ti) has S fringes; for each pattern (Ti), recording an image (24.i) of the surface (20) having the projected pattern, so that a sequence of recordings is formed; and calculating the topography from the images (24.i), wherein such patterns are projected in which each fringe has an intensity distribution perpendicular to the fringe longitudinal direction (L) and each intensity distribution can be expressed by a function (Q) which has a spatial phase position (ß). According to the invention, the phase position (ß) changes as a function of a code (g(s)) of the ordinal number (s) of the fringe.
    Type: Application
    Filed: May 30, 2016
    Publication date: April 26, 2018
    Inventors: Simon Winkelbach, Sven Molkenstruck, Markus Rilk