Patents by Inventor Simone HOCHGREB

Simone HOCHGREB has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220268684
    Abstract: A particle sensor for measuring size and concentration properties of particles in a gas includes a bipolar diffusion charger configured to charge particles within a received gas sample by the collision of the received particles with and transfer of charge from both positive and negative ions concurrently. At least one electrometer detects the charge of received particles thereby charged. The net, positive, negative or total charge on the bipolarly charged particles has a low sensitivity to variations in the absolute rate of charge generation in the bipolar diffusion charger. A sensor for a ratio of ion charge mobilities in a bipolar diffusion charger employs an ion trap between the bipolar diffusion charger and at least one electrometer.
    Type: Application
    Filed: July 30, 2020
    Publication date: August 25, 2022
    Inventors: Robert NISHIDA, Tyler James JOHNSON, Simone HOCHGREB, Adam Meyer BOIES
  • Patent number: 10502710
    Abstract: Particle measurement apparatus comprises an inlet for receiving a gas sample for analysis, a photoionisation chamber, at least one light source arranged to illuminate an interior of the photoionisation chamber, first and second electrodes coupled to a power source and configured to provide a DC potential difference across at least a portion of the photoionisation chamber, and an outlet, together defining a gas flow path from the inlet, through the photoionisation chamber, and towards the outlet.
    Type: Grant
    Filed: June 6, 2017
    Date of Patent: December 10, 2019
    Assignees: ALPHASENSE LIMITED, CAMBRIDGE ENTERPRISE LIMITED
    Inventors: Simone Hochgreb, Robert Nishida, Adam Boies, John Saffell
  • Publication number: 20170350862
    Abstract: Particle measurement apparatus comprises an inlet for receiving a gas sample for analysis, a photoionisation chamber, at least one light source arranged to illuminate an interior of the photoionisation chamber, first and second electrodes coupled to a power source and configured to provide a DC potential difference across at least a portion of the photoionisation chamber, and an outlet, together defining a gas flow path from the inlet, through the photoionisation chamber, and towards the outlet.
    Type: Application
    Filed: June 6, 2017
    Publication date: December 7, 2017
    Inventors: Simone HOCHGREB, Robert NISHIDA, Adam BOIES, John SAFFELL