Abstract: Systems and methods are provided for testing a Device Under Test (DUT) in its working environment. A control computer is coupled to an air compressor and generates a temperature control signal that is provided to the air compressor to generate an amount of hot air or cold air to set the temperature of the DUT's working environment to a desired test temperature. The control computer also generates at least one test signal that is sent to a hardware test element for testing at least one memory component of the DUT at the desired test temperature and obtaining test results. The control computer analyzes the test results to determine a parameter adjustment for the at least one memory element so that it operates in a stable manner at the test temperature.

Abstract: A cloud computing system is described that communicates with a virtual machine to reattach the face of a patient to brain imaging data before the brain imaging data is transmitted for display on a brain navigation system.

Abstract: Disclosed are techniques for identifying and displaying spatial relationships between a seed parcel and other parcels in a patient's brain. A method can include obtaining connectivity data characterizing, for each pair of parcels including a first parcel and a second parcel from a group of parcels, a connectivity metric measuring a relationship between the first and second parcels in the patient's brain, obtaining brain atlas data, identifying a seed parcel from the group of parcels, determining one or more other parcels in the group of parcels having a connectivity metric with the seed parcel that satisfies a threshold connectivity metric condition to provide at least one seed-connected parcel, and for the seed-connected parcel, providing the brain atlas data and an indication of a degree of the connectivity metric between the seed parcel and seed-connected parcel for display as an overlay on a visualization of the brain atlas data.

Abstract: Systems and methods are provided for testing a Device Under Test (DUT) in its working environment. A control computer is coupled to an air compressor and generates a temperature control signal that is provided to the air compressor to generate an amount of hot air or cold air to set the temperature of the DUT's working environment to a desired test temperature. The control computer also generates at least one test signal that is sent to a hardware test element for testing at least one memory component of the DUT at the desired test temperature and obtaining test results. The control computer analyzes the test results to determine a parameter adjustment for the at least one memory element so that it operates in a stable manner at the test temperature.

Abstract: A cloud computing system is described that communicates with a virtual machine to reattach the face of a patient to brain imaging data before the brain imaging data is transmitted for display on a brain navigation system.

Abstract: A cloud computing system is described that communicates with a virtual machine to reattach the face of a patient to brain imaging data before the brain imaging data is transmitted for display on a brain navigation system.

Abstract: Various embodiments are described herein for testing memory devices more effectively and taking corrective action or for identifying memory devices. For example, a particular set of memory cells may be used for testing and/or for identifying a memory device. In other cases, memory testing may be done with a particular subset of test patterns.

Abstract: Embodiments described herein relate to systems and methods for testing and assembling memory modules. In at least one embodiment, the method comprises: assembling a memory module, the memory module comprising at least one memory device having one or more defective memory locations; wherein the assembling comprises storing the data that identifies the one or more defective memory locations on the memory device in a persistent store on the memory module, wherein the memory module comprises a microprocessor and persistent memory associated with the microprocessor, and wherein the persistent store on the memory module comprises the persistent memory associated with the microprocessor.

Abstract: Various embodiments are described herein for a system and a method for increasing reliability of a secondary storage device used with a computing system where the secondary storage device contains a memory buffer, a controller, and non-volatile memory. The method may comprise initializing a test of the memory buffer; testing at least one memory block of the memory buffer; discontinuing use of a given memory block of the memory buffer if a defective memory location is detected for the given memory block; and storing test results for the memory buffer.

Abstract: Embodiments of systems and methods for testing memory are disclosed, where memory errors are detected, and, in at least one embodiment, memory units containing errors are prevented from being accessed by applications on a computing system.

Abstract: Embodiments described herein relate to systems and methods for testing and assembling memory modules. In at least one embodiment, the method comprises: assembling a memory module, the memory module comprising at least one memory device having one or more defective memory locations; wherein the assembling comprises storing the data that identifies the one or more defective memory locations on the memory device in a persistent store on the memory module, wherein the memory module comprises a microprocessor and persistent memory associated with the microprocessor, and wherein the persistent store on the memory module comprises the persistent memory associated with the microprocessor.

Abstract: Embodiments described herein relate to systems and methods for testing and assembling memory modules. In at least one embodiment, the method comprises, for each memory device of a plurality of memory devices, based on testing performed on the memory device, determining whether the memory device has any defective memory locations, and if so, identifying the one or more defective memory locations, and generating data that identifies the one or more defective memory locations on the memory device; and assembling a memory module comprising at least one memory device having one or more defective memory locations; wherein the assembling comprises, for each memory device of the memory module having one or more defective memory locations, storing the data that identifies the one or more defective memory locations on the memory device in a persistent store on the memory module.

Abstract: Embodiments of systems and methods for testing memory are disclosed, where memory errors are detected, and, in at least one embodiment, memory units containing errors are prevented from being accessed by applications on a computing system.

Abstract: Embodiments described herein relate to systems and methods for testing and assembling memory modules. In at least one embodiment, the method comprises, for each memory device of a plurality of memory devices, based on testing performed on the memory device, determining whether the memory device has any defective memory locations, and if so, identifying the one or more defective memory locations, and generating data that identifies the one or more defective memory locations on the memory device; and assembling a memory module comprising at least one memory device having one or more defective memory locations; wherein the assembling comprises, for each memory device of the memory module having one or more defective memory locations, storing the data that identifies the one or more defective memory locations on the memory device in a persistent store on the memory module.

Abstract: A freestanding humidifier is provided with a movable base tray which is adapted to slide into and out of the bottom rear portion of the humidifier housing. The base tray is contoured to receive a pair of large volume water tanks which can be easily removed, refilled and reinstalled on the base tray. A large diameter fan is mounted in the humidifier and positioned to exhaust air in a substantially horizontal flow path from the humidifier into the ambient surroundings.