Patents by Inventor Siva Reddy Vemireddy

Siva Reddy Vemireddy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Low noise and low distortion test method and system for analog-to-digital converters
    Patent number: 10892768
    Abstract: Disclosed examples include a method and automated test system for testing an ADC. The method includes computing an ADC noise value based on a first set of data values sampled while the ADC input terminals are shorted, computing a first system noise value based on a second set of data values sampled while a test circuit signal source applies zero volts to the ADC through a signal chain, computing a signal chain noise value based on the first system noise value and the ADC noise value, computing a measured SNR value based on a third set of data values sampled while the test circuit signal source applies a non-zero source voltage signal to the signal chain, computing a second system noise value based on the measured SNR value, and computing an ADC SNR value based on the second system noise value and the signal chain noise value.
    Type: Grant
    Filed: September 11, 2017
    Date of Patent: January 12, 2021
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Rahul Vijay Kulkarni, Siva Reddy Vemireddy, Sharat Chandra Rudrasamudram
  • LOW NOISE AND LOW DISTORTION TEST METHOD AND SYSTEM FOR ANALOG-TO-DIGITAL CONVERTERS
    Publication number: 20190081634
    Abstract: Disclosed examples include a method and automated test system for testing an ADC. The method includes computing an ADC noise value based on a first set of data values sampled while the ADC input terminals are shorted, computing a first system noise value based on a second set of data values sampled while a test circuit signal source applies zero volts to the ADC through a signal chain, computing a signal chain noise value based on the first system noise value and the ADC noise value, computing a measured SNR value based on a third set of data values sampled while the test circuit signal source applies a non-zero source voltage signal to the signal chain, computing a second system noise value based on the measured SNR value, and computing an ADC SNR value based on the second system noise value and the signal chain noise value.
    Type: Application
    Filed: September 11, 2017
    Publication date: March 14, 2019
    Applicant: Texas Instruments Incorporated
    Inventors: Rahul Vijay Kulkarni, Siva Reddy Vemireddy, Sharat Chandra Rudrasamudram