Patents by Inventor Sivan Natan-Knaz

Sivan Natan-Knaz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9304316
    Abstract: A method of scanning a light beam is disclosed. The method comprises scanning the light beam along a first axis and scanning the light beam along a second axis, such that a functional dependence of the scanning along the first axis is substantially a step-wave, and a functional dependence of the scanning along the second axis is other than a step-wave.
    Type: Grant
    Filed: June 8, 2014
    Date of Patent: April 5, 2016
    Assignee: APPLE INC.
    Inventors: Yizhar Weiss, Mordekhai Velger, Sivan Natan-Knaz, Raviv Erlich, Alexander Sromin
  • Publication number: 20140327945
    Abstract: A method of scanning a light beam is disclosed. The method comprises scanning the light beam along a first axis and scanning the light beam along a second axis, such that a functional dependence of the scanning along the first axis is substantially a step-wave, and a functional dependence of the scanning along the second axis is other than a step-wave.
    Type: Application
    Filed: June 8, 2014
    Publication date: November 6, 2014
    Inventors: Yizhar Weiss, Mordekhai Velger, Sivan Natan-Knaz, Raviv Erlich, Alexander Sromin
  • Patent number: 8797623
    Abstract: A method of scanning a light beam is disclosed. The method comprises scanning the light beam along a first axis and scanning the light beam along a second axis, such that a functional dependence of the scanning along the first axis is substantially a step-wave, and a functional dependence of the scanning along the second axis is other than a step-wave.
    Type: Grant
    Filed: April 4, 2013
    Date of Patent: August 5, 2014
    Assignee: Scaneva Ltd.
    Inventors: Yizhar Weiss, Mordekhai Velger, Sivan Natan-Knaz, Raviv Erlich, Alexander Sromin
  • Publication number: 20130242363
    Abstract: A method of scanning a light beam is disclosed. The method comprises scanning the light beam along a first axis and scanning the light beam along a second axis, such that a functional dependence of the scanning along the first axis is substantially a step-wave, and a functional dependence of the scanning along the second axis is other than a step-wave.
    Type: Application
    Filed: April 4, 2013
    Publication date: September 19, 2013
    Applicant: SCANEVA LTD.
    Inventors: Yizhar Weiss, Mordekhai Velger, Sivan Natan-Knaz, Raviv Erlich, Alexander Sromin
  • Patent number: 8437063
    Abstract: A method of scanning a light beam is disclosed. The method comprises scanning the light beam along a first axis and scanning the light beam along a second axis, such that a functional dependence of the scanning along the first axis is substantially a step-wave, and a functional dependence of the scanning along the second axis is other than a step-wave.
    Type: Grant
    Filed: May 4, 2011
    Date of Patent: May 7, 2013
    Assignee: Scaneva Ltd.
    Inventors: Yizhar Weiss, Mordekhai Velger, Sivan Natan-Knaz, Raviv Erlich, Alexander Sromin
  • Publication number: 20110286066
    Abstract: A method of scanning a light beam is disclosed. The method comprises scanning the light beam along a first axis and scanning the light beam along a second axis, such that a functional dependence of the scanning along the first axis is substantially a step-wave, and a functional dependence of the scanning along the second axis is other than a step-wave.
    Type: Application
    Filed: May 4, 2011
    Publication date: November 24, 2011
    Applicant: ELOP ELECTROOPTICAL INDUSTRIES LTD.
    Inventors: Yizhar Weiss, Mordekhai Velger, Sivan Natan-Knaz, Raviv Erlich, Alexander Sromin
  • Patent number: 7952781
    Abstract: A method of scanning a light beam is disclosed. The method comprises scanning the light beam along a first axis and scanning the light beam along a second axis, such that a functional dependence of the scanning along the first axis is substantially a step-wave, and a functional dependence of the scanning along the second axis is other than a step-wave.
    Type: Grant
    Filed: November 14, 2005
    Date of Patent: May 31, 2011
    Assignee: Elop Electrooptical Industries Ltd.
    Inventors: Yizhar Weiss, Mordekhai Velger, Sivan Natan-Knaz, Raviv Erlich, Alexander Sromin
  • Publication number: 20080123167
    Abstract: A method of scanning a light beam is disclosed. The method comprises scanning the light beam along a first axis and scanning the light beam along a second axis, such that a functional dependence of the scanning along the first axis is substantially a step-wave, and a functional dependence of the scanning along the second axis is other than a step-wave.
    Type: Application
    Filed: November 14, 2005
    Publication date: May 29, 2008
    Applicant: Elop Electrooptical Industries Ltd.
    Inventors: Yizhar Weiss, Mordekhai Velger, Sivan Natan-Knaz, Raviv Erlich, Alexander Sromin