Patents by Inventor Slawomir J. Swillo

Slawomir J. Swillo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical system and method for measuring continuously distributed strain
    Patent number: 7036364
    Abstract: A optical system and method of measuring a strain on a surface of a band of a sheet of a material. A single line, or an area having a boundary line, is marked on the band before deformation. The line traverses a width of the band at angle. The band is deformed and an equivalent two-dimensional image of the line after deformation is obtained. The line before deformation is compared with the two-dimensional equivalent image of the line after deformation, and the strain on the surface of the band after deformation is determined.
    Type: Grant
    Filed: September 25, 2003
    Date of Patent: May 2, 2006
    Assignee: The Regents of the University of Michigan
    Inventors: Slawomir J. Swillo, Kaushik Arjunan Iyer, Shixin Jack Hu