Patents by Inventor Smruti Subhash Jhaveri
Smruti Subhash Jhaveri has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 12235784Abstract: Described apparatuses and methods facilitate bus training with multiple dice, such as multiple memory dice. A controller can communicate with multiple dice to perform bus training by sending a test pattern and receiving in return a feedback pattern indicative of the bits detected by the dice. Because suitable signal timing can differ between dice, even those using the same bus, a controller may train each die separately from the others. In some situations, however, individualized training may be infeasible. To accommodate such situations, logic associated with two or more dice can combine, using at least one logical operation, bits as detected from the test pattern into a combined feedback pattern. A timing parameter that is jointly suitable for multiple dice can be determined, and the bus training may be concluded, responsive to the combined feedback pattern matching the test pattern. The multiple dice may be stacked or linked.Type: GrantFiled: August 30, 2022Date of Patent: February 25, 2025Assignee: Micron Technology, Inc.Inventors: Yang Lu, Creston M. Dupree, Smruti Subhash Jhaveri, Hyun Yoo Lee, John Christopher Sancon, Kang-Yong Kim, Francesco Douglas Verna-Ketel
-
Patent number: 12235783Abstract: Described apparatuses and methods facilitate bus training with multiple dice, such as multiple memory dice. A controller can communicate with multiple dice over a bus to perform bus training by sending a test pattern and receiving in return a feedback pattern indicative of the bits detected by the dice. Because suitable signal timing can differ between dice, even those using the same bus, the controller may attempt to train each die separately from the others. In some situations, however, individualized training may be infeasible. To accommodate such situations, logic associated with two or more dice can combine the bits as detected from the test pattern into a combined feedback pattern. A timing parameter that is jointly suitable for multiple dice can be determined, and the bus training may be concluded, responsive to the combined feedback pattern matching the test pattern. The multiple dice may be stacked or linked.Type: GrantFiled: August 30, 2022Date of Patent: February 25, 2025Assignee: Micron Technology, Inc.Inventors: Francesco Douglas Verna-Ketel, Hyun Yoo Lee, Smruti Subhash Jhaveri, John Christopher Sancon, Yang Lu, Kang-Yong Kim
-
Publication number: 20250021875Abstract: Test data associated with a command bus training (CBT) can be separately received at interconnected memory dice. Feedback data that are outputted from the multiple interconnected memory dice in response to the test data can be randomly combined such that combined feedback data is returned as if the feedback data were sent from a single memory die. This provides a flexible and scalable architecture that can accommodate a range of memory densities (e.g., a number of memory dice that are interconnected).Type: ApplicationFiled: June 26, 2024Publication date: January 16, 2025Inventors: Wonjun Choi, Hyunyoo Lee, Smruti Subhash Jhaveri
-
Publication number: 20240371460Abstract: During a command bus training (CBT), interconnected memory dice are accessed in a sequence determined (e.g., predetermined) by a bit sequence generator and via a shared data link for retrieving a respective set of feedback data of the CBT from each memory dice. This eliminates a need to individually train and/or control interconnected memory dice for the CBT; thereby, providing a flexible and scalable architecture that can accommodate a range of memory densities (e.g., a number of memory dice that are interconnected) and making it a valuable solution for high-performance memory applications.Type: ApplicationFiled: April 30, 2024Publication date: November 7, 2024Inventors: Smruti Subhash Jhaveri, Hyunyoo Lee
-
Publication number: 20240176697Abstract: Described apparatuses and methods facilitate sharing redundant memory portions at a controller-level to enable memory repair between two or more memory blocks. Each memory die of multiple memory dies can include, for instance, multiple spare rows for use if a row of a memory array has a faulty bit. If a memory die has more faults than spare rows, the memory die cannot repair the additional faults. This document describes a controller that can inventory unrepaired faults and available spare rows across multiple memory dies. The controller can then “borrow” a spare row from a second memory die that has an available one and “share” the spare row with a first memory die that has a fault than it cannot repair. The controller can remap a memory access request targeting the row with the unrepaired fault in the first memory die to a spare row in the second memory die.Type: ApplicationFiled: November 28, 2023Publication date: May 30, 2024Applicant: Micron Technology, Inc.Inventors: Smruti Subhash Jhaveri, Hyun Yoo Lee
-
Publication number: 20240170038Abstract: Described apparatuses and methods relate to adaptive refresh staggering for a memory system that may support a nondeterministic protocol. To help manage power-delivery networks in a memory system, a memory device can include logic that can be programmed to stagger the start of refresh operations for each die upon receiving a command to enter a lower-power mode, such as self-refresh. The staggered start can be implemented at a channel level, a package level, or both. The programming sets a delay for each die so that initiation of refresh operations is staggered. Thus, a first die can initiate refresh operations when a command to enter the lower-power mode is received (e.g., approximately zero delay). However, initiation of refresh operations for subsequent dies (e.g., “after” the first die) is delayed, which can reduce peak current draw and power consumption.Type: ApplicationFiled: November 16, 2023Publication date: May 23, 2024Applicant: Micron Technology, Inc.Inventors: Hyun Yoo Lee, Smruti Subhash Jhaveri, Kang-Yong Kim
-
Publication number: 20240070101Abstract: Described apparatuses and methods facilitate bus training with multiple dice, such as multiple memory dice. A controller can communicate with multiple dice over a bus to perform bus training by sending a test pattern and receiving in return a feedback pattern indicative of the bits detected by the dice. Because suitable signal timing can differ between dice, even those using the same bus, the controller may attempt to train each die separately from the others. In some situations, however, individualized training may be infeasible. To accommodate such situations, logic associated with two or more dice can combine the bits as detected from the test pattern into a combined feedback pattern. A timing parameter that is jointly suitable for multiple dice can be determined, and the bus training may be concluded, responsive to the combined feedback pattern matching the test pattern. The multiple dice may be stacked or linked.Type: ApplicationFiled: August 30, 2022Publication date: February 29, 2024Applicant: Micron Technology, Inc.Inventors: Francesco Douglas Verna-Ketel, Hyun Yoo Lee, Smruti Subhash Jhaveri, John Christopher Sancon, Yang Lu, Kang-Yong Kim
-
Publication number: 20240070102Abstract: Described apparatuses and methods facilitate bus training with multiple dice, such as multiple memory dice. A controller can communicate with multiple dice to perform bus training by sending a test pattern and receiving in return a feedback pattern indicative of the bits detected by the dice. Because suitable signal timing can differ between dice, even those using the same bus, a controller may train each die separately from the others. In some situations, however, individualized training may be infeasible. To accommodate such situations, logic associated with two or more dice can combine, using at least one logical operation, bits as detected from the test pattern into a combined feedback pattern. A timing parameter that is jointly suitable for multiple dice can be determined, and the bus training may be concluded, responsive to the combined feedback pattern matching the test pattern. The multiple dice may be stacked or linked.Type: ApplicationFiled: August 30, 2022Publication date: February 29, 2024Applicant: Micron Technology, Inc.Inventors: Yang Lu, Creston M. Dupree, Smruti Subhash Jhaveri, Hyun Yoo Lee, John Christopher Sancon, Kang-Yong Kim, Francesco Douglas Verna-Ketel