Patents by Inventor Snigdha Ghoshal
Snigdha Ghoshal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6866415Abstract: A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.Type: GrantFiled: January 21, 2003Date of Patent: March 15, 2005Assignee: International Business Machines CorporationInventors: Steven Alan Cordes, David R. DiMilia, James Patrick Doyle, Matthew James Farinelli, Snigdha Ghoshal, Uttam Shyamalindu Ghoshal, Chandler Todd McDowell, Li Shi
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Patent number: 6817761Abstract: A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.Type: GrantFiled: April 21, 2003Date of Patent: November 16, 2004Assignee: International Business Machines CorporationInventors: Steven Alan Cordes, David R. DiMilia, James Patrick Doyle, Matthew James Farinelli, Snigdha Ghoshal, Uttam Shyamalindu Ghoshal, Chandler Todd McDowell, Li Shi
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Publication number: 20040028117Abstract: A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.Type: ApplicationFiled: April 21, 2003Publication date: February 12, 2004Inventors: Steven Alan Cordes, David R. DiMilia, James Patrick Doyle, Matthew James Farinelli, Snigdha Ghoshal, Uttam Shyamalindu Ghoshal, Chandler Todd McDowell, Li Shi
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Patent number: 6679625Abstract: A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.Type: GrantFiled: December 17, 2001Date of Patent: January 20, 2004Assignee: International Business Machines CorporationInventors: Steven Alan Cordes, David R. DiMilia, James Patrick Doyle, Matthew James Farinelli, Snigdha Ghoshal, Uttam Shyamalindu Ghoshal, Chandler Todd McDowell, Li Shi
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Patent number: 6652139Abstract: A method of fabricating a scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. The invention also relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.Type: GrantFiled: January 21, 2003Date of Patent: November 25, 2003Assignee: International Business Machines CorporationInventors: Steven Alan Cordes, David R. DiMilia, James Patrick Doyle, Matthew James Farinelli, Snigdha Ghoshal, Uttam Shyamalindu Ghoshal, Chandler Todd McDowell, Li Shi
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Publication number: 20030169798Abstract: A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.Type: ApplicationFiled: January 21, 2003Publication date: September 11, 2003Inventors: Steven Alan Cordes, David R. DiMilia, James Patrick Doyle, Matthew James Farinelli, Snigdha Ghoshal, Uttam Shyamalindu Ghoshal, Chandler Todd McDowell, Li Shi
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Publication number: 20030156623Abstract: A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.Type: ApplicationFiled: January 21, 2003Publication date: August 21, 2003Inventors: Steven Alan Cordes, David R. DiMilia, James Patrick Doyle, Matthew James Farinelli, Snigdha Ghoshal, Uttam Shyamalindu Ghoshal, Chandler Todd McDowell, Li Shi
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Publication number: 20030112844Abstract: A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.Type: ApplicationFiled: December 17, 2001Publication date: June 19, 2003Applicant: International Business Machines CorporationInventors: Steven Alan Cordes, David R. DiMilia, James Patrick Doyle, Matthew James Farinelli, Snigdha Ghoshal, Uttam Shyamalindu Ghoshal, Chandler Todd McDowell, Li Shi
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Patent number: 6118284Abstract: A system for measuring magnetic fields produced by an integrated circuit device-under-test includes a clock generator configured to generate a clock signal, a delay circuit configured to generate a delayed clock signal having a known delay relative to the clock signal, a pulse generator configured to generate a series of pulses having a frequency corresponding to a frequency of the clock signal, the pulses of the series of pulses being offset from the clock signal by the known delay, and a sensor having a property that varies in response to a magnetic field at the sensor. A sampling circuit connected to the sensor and to the pulse generator is configured to measure the property of the sensor at times corresponding to pulses of the series of pulses, and to produce a sampling signal having, for each pulse, a first value (e.g., a logical one) when the property of the sensor indicates that the magnetic field at the sensor exceeds a threshold amount and a second value (e.g.Type: GrantFiled: October 6, 1997Date of Patent: September 12, 2000Inventors: Uttam S. Ghoshal, Snigdha Ghoshal