Abstract: A method of impedance measurement of a device under test (DUT) is disclosed based on a random excitation signal, the method comprising the steps of generating the random excitation signal, applying the generated random excitation signal to the DUT through two points of a data acquisition board (DAQ) and re-structuring the converted random excitation signal through a plurality of iterative calibration loops, wherein spectral phase of the random excitation signal is derived from a discrete uniform distribution and its time domain amplitude is controllable. The random excitation signal is a structured Gaussian White Noise (GWN) signal or sequence, which is generated based on the user-defined input parameters such as white noise power level, frequency range between the minimum and maximum frequencies (Fmin and Fmax), and frequency step (Fstep).

Abstract: There is provided an atmospheric pressure air microplasma system designed for random bit generation including a plurality of plasma electrodes, a power supply module supplying a DC voltage for igniting an arc discharge between the plurality of plasma electrodes, wherein the ignited arc discharge results in establishing and sustaining an arc current channel between the plurality of plasma electrodes, a current probe for measuring and collecting electric current time series data from the arc current channel, and a data acquisition board connected to the current probe for saving the collected electric current time series data, wherein binary sequences are generated from the electric current time series data. Further, the generated binary sequences are proven to pass all 15 tests of NIST Statistical Test Suite and thereby prove to qualify as random sequences.