Patents by Inventor Sohichiro NAKAMURA

Sohichiro NAKAMURA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Dynamic light-scattering measuring apparatus using low-coherence light source and light-scattering measuring method of using the apparatus
    Patent number: 8467067
    Abstract: There is provided a dynamic light-scattering measuring apparatus including: a Mach-Zehnder interferometer; and a low-coherence light source. Further, there is provided a method for measuring light-scattering intensity of particles in a medium, including the steps of: providing a Mach-Zehnder interferometer; and measuring light-scattering intensity from light emitted from a low-coherence light source, in accordance with a dynamic light-scattering intensity measuring process.
    Type: Grant
    Filed: July 1, 2010
    Date of Patent: June 18, 2013
    Assignee: FUJIFILM Corporation
    Inventors: Katsuhiro Ishii, Sohichiro Nakamura, Yuki Sato
  • DYNAMIC LIGHT-SCATTERING MEASURING APPARATUS USING LOW-COHERENCE LIGHT SOURCE AND LIGHT-SCATTERING MEASURING METHOD OF USING THE APPARATUS
    Publication number: 20110001969
    Abstract: There is provided a dynamic light-scattering measuring apparatus including: a Mach-Zehnder interferometer; and a low-coherence light source. Further, there is provided a method for measuring light-scattering intensity of particles in a medium, including the steps of: providing a Mach-Zehnder interferometer; and measuring light-scattering intensity from light emitted from a low-coherence light source, in accordance with a dynamic light-scattering intensity measuring process.
    Type: Application
    Filed: July 1, 2010
    Publication date: January 6, 2011
    Applicant: FUJIFILM Corporation
    Inventors: Katsuhiro ISHII, Sohichiro NAKAMURA, Yuki SATO