Abstract: A thin film magnetic head includes: a magneto resistance effect film of which electrical resistance varies corresponding to an external magnetic field; a pair of shields provided on both sides in a manner of sandwiching the MR film in a direction that is orthogonal to a film surface of the MR film; an anisotropy providing layer that provides exchange anisotropy to a first shield of the pair of shields in order to magnetize the first shield in a desired direction, and that is disposed on the opposite side from the MR film with respect to the first shield; and side shields that are disposed on both sides of the MR film in a track width direction and that include soft magnetic layers magnetically connected with the first shield.

Abstract: A thin film magnetic head includes; an MR film that includes a pinned layer of which a magnetization direction is pinned, a free layer of which a magnetization direction varies, and a spacer that is disposed therebetween; a pair of shields that are disposed on both sides sandwiching the MR film in a direction orthogonal to a film surface of the MR film; and an anisotropy providing layer that provides anisotropy to a first shield so that the first shield is magnetized in a desired direction, and that is disposed on an opposite side from the MR film with respect to the first shield. The MR film includes a magnetic coupling layer that is disposed between the first shield and the free layer and that magnetically couples the first shield with the free layer.

Abstract: A thin film magnetic head has a plurality of electrode terminals formed on substantially the same surface as the head formation surface on which magnetic head element is laminated. The plurality of electrode terminals is arranged in an array near and along the second side of the head formation surface that is opposite the first side on the ABS side, from which the functional end of the magnetic head is exposed. The plurality of electrode terminals is formed to include a pad and a protrusion formed along a part of the periphery of the pad.

Abstract: A thin film magnetic head includes: a magneto resistance effect film of which electrical resistance varies corresponding to an external magnetic field; a pair of shields provided on both sides in a manner of sandwiching the MR film in a direction that is orthogonal to a film surface of the MR film; an anisotropy providing layer that provides exchange anisotropy to a first shield of the pair of shields in order to magnetize the first shield in a desired direction, and that is disposed on the opposite side from the MR film with respect to the first shield; and side shields that are disposed on both sides of the MR film in a track width direction and that include soft magnetic layers magnetically connected with the first shield.

Abstract: A thin film magnetic head includes; an MR film that includes a pinned layer of which a magnetization direction is pinned, a free layer of which a magnetization direction varies, and a spacer that is disposed therebetween; a pair of shields that are disposed on both sides sandwiching the MR film in a direction orthogonal to a film surface of the MR film; and an anisotropy providing layer that provides anisotropy to a first shield so that the first shield is magnetized in a desired direction, and that is disposed on an opposite side from the MR film with respect to the first shield. The MR film includes a magnetic coupling layer that is disposed between the first shield and the free layer and that magnetically couples the first shield with the free layer.

Abstract: A thin film magnetic head has a plurality of electrode terminals formed on substantially the same surface as the head formation surface on which magnetic head element is laminated. The plurality of electrode terminals is arranged in an array near and along the second side of the head formation surface that is opposite the first side on the ABS side, from which the functional end of the magnetic head is exposed. The plurality of electrode terminals is formed to include a pad and a protrusion formed along a part of the periphery of the pad.

Abstract: Provided is a method for testing a head element that enables proper evaluation of the head element based on a characteristic of the head element under high-temperature and high-stress conditions. The testing method can be performed on a thin-film magnetic head including a head element and a heating element capable of applying a heat and stress to the head element, or performed on a row bar or a substrate wafer on which a plurality of the head elements and a plurality of the heating elements are disposed. The testing method comprises the steps of: causing the heating element to generate heat to apply a heat and stress to the head element; and measuring a characteristic of the head element under the heat and stress to evaluate the head element.

Abstract: The present invention relates to a thin-film magnetic head with a heater. A thin-film magnetic head includes a substrate, a magnetic read head element that has a shield area and is formed on the substrate, a magnetic write head element that has a pole area and is formed on the opposite side of the substrate with respect to the magnetic read head element, an overcoat layer that covers the magnetic read head element and the magnetic write head element and is formed on the substrate, a heater that heats at least during the magnetic read head element or the magnetic write head element in operation and is formed in the overcoat layer, and a slit area that splits the shield area in a shield length direction and is made of lower thermal conductivity material than the one of the shield area.

Abstract: A thin-film magnetic head according to the present invention comprises: a substrate; at least one magnetic head element formed on the substrate; an overcoat multilayer composed of a plurality of overcoat layers, formed on the substrate so as to cover the at least one magnetic head element; and at least one heating element to be heated at least during operation of the at least one magnetic head element, the at least one heating element provided in the overcoat multilayer, and a coefficient of thermal expansion of an overcoat layer located farthest from the substrate in the overcoat multilayer being smaller than a coefficient of thermal expansion of an overcoat layer located closest to the substrate in the overcoat multilayer.

Abstract: A magnetic head part is constituted by a reproducing head part having a GMR device and a recording head part acting as an inductive electromagnetic transducer which are laminated on a support. The magnetic head part further comprises a heater. One of poles of the heater is electrically connected to a heater electrode pad disposed on a first surface of a head slider. The other pole is electrically connected to a substrate constituting the support, and is energized by way of a second surface of the head slider.

Abstract: A method is presented for grinding a surface of an elongate bar having a plurality of thin film magnetic elements aligned in a line, each of the thin film magnetic elements having a magnetoresistive sensor for reading a magnetic record from a recording medium and an inductive electromagnetic transducer for writing a magnetic record into the recording medium in a stacked structure, the surface of the bar being a grind surface so that it can be formed into an air-bearing surface by means of the grinding. The method has steps of providing first resistive films on the grind surface in advance along a first longitudinal line parallel to a longitudinal direction of the bar, and providing second resistive films on the grind surface in advance along a second longitudinal line parallel to the longitudinal direction of the bar.

Abstract: Provided is a method for testing a head element that enables proper evaluation of the head element based on a characteristic of the head element under high-temperature and high-stress conditions. The testing method can be performed on a thin-film magnetic head including a head element and a heating element capable of applying a heat and stress to the head element, or performed on a row bar or a substrate wafer on which a plurality of the head elements and a plurality of the heating elements are disposed. The testing method comprises the steps of: causing the heating element to generate heat to apply a heat and stress to the head element; and measuring a characteristic of the head element under the heat and stress to evaluate the head element.

Abstract: A thin-film magnetic head comprises at least one of an electromagnetic transducer and a magnetoresistive device, and a heater member adapted to generate heat upon energization. The heater member contains NiCu or NiCr.

Abstract: A thin-film magnetic head has at least either an electromagnetic transducer or a magnetoresistive device, and a sheet-shaped heater for generating heat when energized. The heater has a heating part and a lead part connected in series to the heating part. The lead part has a sheet resistance lower than that of the heating part.

Abstract: A heater member is formed in structure including a heater layer with a low electrical resistivity and a cap layer with a higher electrical resistivity, an electrically conductive electrode film is formed thereon, and electrically conductive bumps are formed thereon by plating. Unnecessary part of the electrode film is removed using the bumps as a mask. The heater member generates heat to thermally expand a thin-film magnetic head, whereby the distance is reduced between a recording medium and, a magnetoresistive device and/or an electromagnetic conversion device. During removal of the electrode film part of the cap layer with the higher electrical resistivity in the heater member is removed together with the electrode film, which reduces the variation in the total resistance of the heater member.

Abstract: A thin-film magnetic head on a support includes an electromagnetic transducer for writing, a magnetoresistive device for reading, an overcoat layer and a heating element. The transducer and magnetoresistive device are disposed on the support. The overcoat layer is disposed at the opposite side of them from the support. The heating element is provided in the overcoat layer and generates heat when energized.

Abstract: A thin-film magnetic head comprises at least one of a magnetoresistive device and an electromagnetic transducer, and a heater adapted to generate heat upon energization. A method of making this thin-film magnetic head comprises a heater forming step of forming the heater, and an annealing step of annealing the heater formed by the heater forming step.

Abstract: In the head slider of the present invention, recording and reproducing electrode pads and heater electrode pads are attached to the same surface of an overcoat layer. The heater electrode pads are located on both sides of a group constituted by the recording and reproducing electrode pads. As a consequence, leads for the heater are located between respective leads for recording and reproducing head parts, whereby crosstalk can be prevented from occurring between the leads for the recording and reproducing head parts.

Abstract: The head slider in accordance with the present invention comprises a thin-film magnetic head including a magnetoresistive device and an electromagnetic transducer, and a heater adapted to generate heat upon energization. At least one of a reproducing bump, a recording bump, and a heater bump includes a bypass layer extending in a direction intersecting a bump extending direction, a first bump portion positioned closer to a pad-forming surface than is the bypass layer, and a second bump portion positioned on the side of the bypass layer opposite from the first bump portion. The first and second bump portions are displaced from each other in the bypass layer extending direction.

Abstract: The heaters in the respective thin-film magnetic head in the bar are electrically connected to its neighbors, and a variable resistor is connected to each of the heaters in parallel. The resistance of each of the variable resistors is varied depending on the amount that the medium-opposing surface (ABS) of the thin-film magnetic head is to project. Also, the medium-opposing surface of the thin-film magnetic head in the magnetic head bar is polished while energizing all the heaters by the same power supply.