Patents by Inventor Son Le
Son Le has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20250378023Abstract: The present disclosure describes apparatuses and methods for hybrid logical to physical (LTP) address mapping in memory systems. In various aspects, a memory controller maps, with an interleave map mode, a first portion of logical address space to a first portion of the physical address space of a memory. The memory controller also maps, with a fixed map mode, a second portion of logical address space to a second portion of the physical address space of the memory. Thus, the memory controller may configure some memory banks with interleave address mapping and other banks with fixed address mapping. In some cases, the memory controller may reconfigure a bank of the memory from one mapping mode to the other mapping mode. By so doing, the memory controller can leverage benefits provided by either mapping mode to optimize access performance, reduce power consumption, or isolate defective areas with minimal capacity loss.Type: ApplicationFiled: February 25, 2025Publication date: December 11, 2025Applicant: Marvell Asia Pte, Ltd.Inventors: Anh Nguyen, Son Le, Hiep Nguyen
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Patent number: 11609296Abstract: A ferromagnetic resonance (FMR) measurement method is disclosed wherein a magnetic film or stack of layers is patterned into elongated structures having a length along a long axis. A magnetic field (H) is applied in two different orientations with respect to the long axis (in-plane parallel and perpendicular to the long axis) or one orientation may be perpendicular-to-plane. In another embodiment, H is applied parallel to a first set of elongated structures with a long axis in the x-axis direction, and perpendicular to a second set of elongated structures with a long axis in the y-axis direction. From the difference in measured resonance frequency (?fr) (for a fixed magnetic field and sweeping through a range of frequencies) or the difference in measured resonance field (?Hr) (for a fixed microwave frequency and sweeping through a range of magnetic field amplitudes), magnetic saturation Ms is determined using formulas of demagnetizing factors.Type: GrantFiled: September 28, 2020Date of Patent: March 21, 2023Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Santiago Serrano Guisan, Luc Thomas, Guenole Jan, Son Le
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Publication number: 20230046425Abstract: Described are compounds and compositions for transdifferentiation of glioblastoma cells to antigen presenting cells. Methods of using the compounds and compositions to treat glioblastoma and to induce an immune response against a glioblastoma are also described.Type: ApplicationFiled: December 22, 2020Publication date: February 16, 2023Inventors: David TRAN, Son LE
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Publication number: 20220383102Abstract: Various embodiments analyze the application of satellite imaging and deep learning in predicting ignition and spread of major wildfires. The training data comes from NASA satellite products and historical records of wildfires in the United States. A state-of-the-art technique in neural network image classification may be utilized and yield impressive results for wildfire ignition prediction. In one embodiment, the model may achieve an accuracy rate of 93.5%, a precision rate of 93.2%, a recall rate of 88.9%, and an F-1 score of 90.8%. Direct applications of the model may include wildfire monitoring and wildfire prevention.Type: ApplicationFiled: November 24, 2021Publication date: December 1, 2022Inventors: Son Le, Andrew Engler, Nathaniel Manning
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Patent number: 11447768Abstract: The subject invention pertains to a Molecular Cell Diary System (MCDS), which allows identification of the history of somatic alterations in the cell. MCDS comprises one or more combinations of a DNA cutter and a DNA writer expressed under the control of a promoter controlled a cellular event of interest. The DNA cutter and the DNA writer are in a combination are co-expressed when an even of interest occurs. The DNA cutter creates double strand breaks (DSB) in a target DNA in a sequence specific manner and the DNA writer incorporates DNA sequences in the DSB. The endogenous DNA repair machinery synthesizes repairs the DSB. As such, the combination of the DNA cutter and the DNA writer modifies the target DNA and leaves “marks” of the occurrence of the cellular event of interest. These marks are sequenced and the cellular event history of the cell is deciphered.Type: GrantFiled: March 1, 2017Date of Patent: September 20, 2022Assignee: University of Florida Research Foundation, IncorporatedInventors: David Tran, Son Le
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Patent number: 11397226Abstract: A scanning ferromagnetic resonance (FMR) measurement system is disclosed with a radio frequency (RF) probe and one or two magnetic poles mounted on a holder plate and enable a perpendicular-to-plane or in-plane magnetic field, respectively, at test locations. While the RF probe tip contacts a magnetic film on a whole wafer under test (WUT), a plurality of microwave frequencies (fR) is sequentially transmitted through the probe tip. Simultaneously, a magnetic field (HR) is applied to the contacted region thereby causing a FMR condition in the magnetic film for each pair of (HR, fR) values. RF output signals are transmitted through or reflected from the magnetic film to a RF diode and converted to voltage signals which a controller uses to determine effective anisotropy field, linewidth, damping coefficient, and/or inhomogeneous broadening for a sub-mm area. The WUT is moved to preprogrammed locations to enable multiple FMR measurements at each test location.Type: GrantFiled: August 31, 2020Date of Patent: July 26, 2022Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Guenole Jan, Son Le, Luc Thomas, Santiago Serrano Guisan
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Publication number: 20220138919Abstract: An image processing device and image processing methods that improve image quality by reducing latency and improving the performance of local processing are provided. An image processing device using an image input signal as an input and an image output signal as an output includes a first image processing unit and a second image processing unit. The first image processing unit includes a histogram processing unit for extracting image characteristic data from the image input signal, a first image parameter processing unit for creating a first parameter group for performing image processing from the image characteristic data, and an arithmetic processing unit for processing the image input signal to create an image output signal. The second image processing unit has a second image parameter processing unit for creating a second parameter group for performing image processing from the image characteristic data.Type: ApplicationFiled: November 4, 2020Publication date: May 5, 2022Inventors: Quyet Hoang, Hai NGUYEN, Son LE, Kenichi IWATA, Tetsuya SHIBAYAMA
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Patent number: 11237240Abstract: A ferromagnetic resonance (FMR) measurement system is disclosed with a plurality of “m” RF probes and one or more magnetic assemblies to enable a perpendicular-to-plane or in-plane magnetic field (Hap) to be applied simultaneously with a sequence of microwave frequencies (fR) at a plurality of “m” test locations on a magnetic film formed on a whole wafer under test (WUT). A FMR condition occurs in the magnetic film (stack of unpatterned layers or patterned structure) for each pair of (Hap, fR) values. RF input signals are distributed to the RF probes using RF power distribution or routing devices. RF output signals are transmitted through or reflected from the magnetic film to a plurality of “n” RF diodes where 1?n?m, and converted to voltage signals which a controller uses to determine effective anisotropy field, linewidth, damping coefficient, and/or inhomogeneous broadening at the predetermined test locations.Type: GrantFiled: August 24, 2020Date of Patent: February 1, 2022Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Santiago Serrano Guisan, Luc Thomas, Son Le, Guenole Jan
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Patent number: 11092661Abstract: A ferromagnetic resonance (FMR) measurement system is disclosed with a waveguide transmission line (WGTL) connected at both ends to a mounting plate having an opening through which the WGTL is suspended. While the WGTL bottom surface contacts a portion of magnetic film on a whole wafer, a plurality of microwave frequencies is sequentially transmitted through the WGTL. Simultaneously, a magnetic field is applied to the contacted region thereby causing a FMR condition in the magnetic film. After RF output is transmitted through or reflected from the WGTL to a RF detector and converted to a voltage signal, effective anisotropy field, linewidth, damping coefficient, and/or inhomogeneous broadening are determined based on magnetic field intensity, microwave frequency and voltage output. A plurality of measurements is performed by controllably moving the WGTL or wafer and repeating the simultaneous application of microwave frequencies and magnetic field at additional preprogrammed locations on the magnetic film.Type: GrantFiled: July 9, 2019Date of Patent: August 17, 2021Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Santiago Serrano Guisan, Luc Thomas, Son Le, Guenole Jan
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Publication number: 20210025958Abstract: A ferromagnetic resonance (FMR) measurement method is disclosed wherein a magnetic film or stack of layers is patterned into elongated structures having a length along a long axis. A magnetic field (H) is applied in two different orientations with respect to the long axis (in-plane parallel and perpendicular to the long axis) or one orientation may be perpendicular-to-plane. In another embodiment, H is applied parallel to a first set of elongated structures with a long axis in the x-axis direction, and perpendicular to a second set of elongated structures with a long axis in the y-axis direction. From the difference in measured resonance frequency (?fr) (for a fixed magnetic field and sweeping through a range of frequencies) or the difference in measured resonance field (?Hr) (for a fixed microwave frequency and sweeping through a range of magnetic field amplitudes), magnetic saturation Ms is determined using formulas of demagnetizing factors.Type: ApplicationFiled: September 28, 2020Publication date: January 28, 2021Inventors: Santiago Serrano Guisan, Luc Thomas, Guenole Jan, Son Le
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Publication number: 20200393525Abstract: A scanning ferromagnetic resonance (FMR) measurement system is disclosed with a radio frequency (RF) probe and one or two magnetic poles mounted on a holder plate and enable a perpendicular-to-plane or in-plane magnetic field, respectively, at test locations. While the RF probe tip contacts a magnetic film on a whole wafer under test (WUT), a plurality of microwave frequencies (fR) is sequentially transmitted through the probe tip. Simultaneously, a magnetic field (HR) is applied to the contacted region thereby causing a FMR condition in the magnetic film for each pair of (HR, fR) values. RF output signals are transmitted through or reflected from the magnetic film to a RF diode and converted to voltage signals which a controller uses to determine effective anisotropy field, linewidth, damping coefficient, and/or inhomogeneous broadening for a sub-mm area. The WUT is moved to preprogrammed locations to enable multiple FMR measurements at each test location.Type: ApplicationFiled: August 31, 2020Publication date: December 17, 2020Inventors: Guenole Jan, Son Le, Luc Thomas, Santiago Serrano Guisan
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Publication number: 20200386840Abstract: A ferromagnetic resonance (FMR) measurement system is disclosed with a plurality of “m” RF probes and one or more magnetic assemblies to enable a perpendicular-to-plane or in-plane magnetic field (Hap) to be applied simultaneously with a sequence of microwave frequencies (fR) at a plurality of “m” test locations on a magnetic film formed on a whole wafer under test (WUT). A FMR condition occurs in the magnetic film (stack of unpatterned layers or patterned structure) for each pair of (Hap, fR) values. RF input signals are distributed to the RF probes using RF power distribution or routing devices. RF output signals are transmitted through or reflected from the magnetic film to a plurality of “n” RF diodes where 1?n?m, and converted to voltage signals which a controller uses to determine effective anisotropy field, linewidth, damping coefficient, and/or inhomogeneous broadening at the predetermined test locations.Type: ApplicationFiled: August 24, 2020Publication date: December 10, 2020Inventors: Santiago Serrano Guisan, Luc Thomas, Son Le, Guenole Jan
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Patent number: 10788561Abstract: A ferromagnetic resonance (FMR) measurement method is disclosed wherein a magnetic film or stack of layers is patterned into elongated structures having a length along a long axis. A magnetic field (H) is applied in two different orientations with respect to the long axis (in-plane parallel and perpendicular to the long axis) or one orientation may be perpendicular-to-plane. In another embodiment, H is applied parallel to a first set of elongated structures with a long axis in the x-axis direction, and perpendicular to a second set of elongated structures with a long axis in the y-axis direction. From the difference in measured resonance frequency (?fr) (for a fixed magnetic field and sweeping through a range of frequencies) or the difference in measured resonance field (?Hr) (for a fixed microwave frequency and sweeping through a range of magnetic field amplitudes), magnetic saturation Ms is determined using formulas of demagnetizing factors.Type: GrantFiled: October 16, 2018Date of Patent: September 29, 2020Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Santiago Serrano Guisan, Luc Thomas, Guenole Jan, Son Le
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Patent number: 10761154Abstract: A scanning ferromagnetic resonance (FMR) measurement system is disclosed with a radio frequency (RF) probe and one or two magnetic poles mounted on a holder plate and enable a perpendicular-to-plane or in-plane magnetic field, respectively, at test locations. While the RF probe tip contacts a magnetic film on a whole wafer under test (WUT), a plurality of microwave frequencies (fR) is sequentially transmitted through the probe tip. Simultaneously, a magnetic field (HR) is applied to the contacted region thereby causing a FMR condition in the magnetic film for each pair of (HR, fR) values. RF output signals are transmitted through or reflected from the magnetic film to a RF diode and converted to voltage signals which a controller uses to determine effective anisotropy field, linewidth, damping coefficient, and/or inhomogeneous broadening for a sub-mm area. The WUT is moved to preprogrammed locations to enable multiple FMR measurements at each test location.Type: GrantFiled: January 19, 2018Date of Patent: September 1, 2020Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Guenole Jan, Son Le, Luc Thomas, Santiago Serrano
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Patent number: 10754000Abstract: A ferromagnetic resonance (FMR) measurement system is disclosed with a plurality of “m” RF probes and one or more magnetic assemblies to enable a perpendicular-to-plane or in-plane magnetic field (Hap) to be applied simultaneously with a sequence of microwave frequencies (fR) at a plurality of “m” test locations on a magnetic film formed on a whole wafer under test (WUT). A FMR condition occurs in the magnetic film (stack of unpatterned layers or patterned structure) for each pair of (Hap, fR) values. RF input signals are distributed to the RF probes using RF power distribution or routing devices. RF output signals are transmitted through or reflected from the magnetic film to a plurality of “n” RF diodes where 1?n?m, and converted to voltage signals which a controller uses to determine effective anisotropy field, linewidth, damping coefficient, and/or inhomogeneous broadening at the predetermined test locations.Type: GrantFiled: August 7, 2018Date of Patent: August 25, 2020Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Santiago Serrano Guisan, Luc Thomas, Son Le, Guenole Jan
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Publication number: 20200230282Abstract: A compact aromatic diffuser configured to be used in conjunction with a breathing mask, allowing full consumption of the diffused essential oil by the user. The compact aromatic diffuser may also be used as a hand held inhaler for application proximate the user's face or a standalone diffuser for treating the atmosphere in a room or closed compartment.Type: ApplicationFiled: March 23, 2020Publication date: July 23, 2020Inventor: Son Le
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Publication number: 20200116811Abstract: A ferromagnetic resonance (FMR) measurement method is disclosed wherein a magnetic film or stack of layers is patterned into elongated structures having a length along a long axis. A magnetic field (H) is applied in two different orientations with respect to the long axis (in-plane parallel and perpendicular to the long axis) or one orientation may be perpendicular-to-plane. In another embodiment, H is applied parallel to a first set of elongated structures with a long axis in the x-axis direction, and perpendicular to a second set of elongated structures with a long axis in the y-axis direction. From the difference in measured resonance frequency (?fr) (for a fixed magnetic field and sweeping through a range of frequencies) or the difference in measured resonance field (?Hr) (for a fixed microwave frequency and sweeping through a range of magnetic field amplitudes), magnetic saturation Ms is determined using formulas of demagnetizing factors.Type: ApplicationFiled: October 16, 2018Publication date: April 16, 2020Inventors: Santiago Serrano Guisan, Luc Thomas, Guenole Jan, Son Le
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Patent number: 10596292Abstract: A compact aromatic diffuser configured to be used in conjunction with a breathing mask, allowing full consumption of the diffused essential oil by the user. The compact aromatic diffuser may also be used as a hand held inhaler for application proximate the user's face or a standalone diffuser for treating the atmosphere in a room or closed compartment.Type: GrantFiled: December 18, 2017Date of Patent: March 24, 2020Inventor: Son Le
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Publication number: 20200049787Abstract: A ferromagnetic resonance (FMR) measurement system is disclosed with a plurality of “m” RF probes and one or more magnetic assemblies to enable a perpendicular-to-plane or in-plane magnetic field (Hap) to be applied simultaneously with a sequence of microwave frequencies (fR) at a plurality of “m” test locations on a magnetic film formed on a whole wafer under test (WUT). A FMR condition occurs in the magnetic film (stack of unpatterned layers or patterned structure) for each pair of (Hap, fR) values. RF input signals are distributed to the RF probes using RF power distribution or routing devices. RF output signals are transmitted through or reflected from the magnetic film to a plurality of “n” RF diodes where 1?n?m, and converted to voltage signals which a controller uses to determine effective anisotropy field, linewidth, damping coefficient, and/or inhomogeneous broadening at the predetermined test locations.Type: ApplicationFiled: August 7, 2018Publication date: February 13, 2020Inventors: Santiago Serrano Guisan, Luc Thomas, Son Le, Guenole Jan
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Publication number: 20190331752Abstract: A ferromagnetic resonance (FMR) measurement system is disclosed with a waveguide transmission line (WGTL) connected at both ends to a mounting plate having an opening through which the WGTL is suspended. While the WGTL bottom surface contacts a portion of magnetic film on a whole wafer, a plurality of microwave frequencies is sequentially transmitted through the WGTL. Simultaneously, a magnetic field is applied to the contacted region thereby causing a FMR condition in the magnetic film. After RF output is transmitted through or reflected from the WGTL to a RF detector and converted to a voltage signal, effective anisotropy field, linewidth, damping coefficient, and/or inhomogeneous broadening are determined based on magnetic field intensity, microwave frequency and voltage output. A plurality of measurements is performed by controllably moving the WGTL or wafer and repeating the simultaneous application of microwave frequencies and magnetic field at additional preprogrammed locations on the magnetic film.Type: ApplicationFiled: July 9, 2019Publication date: October 31, 2019Inventors: Santiago Serrano Guisan, Luc Thomas, Son Le, Guenole Jan