Patents by Inventor Son Ngoc Dang

Son Ngoc Dang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Dual tip test probe assembly
    Patent number: 8026734
    Abstract: A dual tip test probe assembly for use in both cantilever and vertical probe applications includes first and second elongated test probes, each having a body portion and a tip portion with a tip configured to make contact with a device under test. An electrically-insulating material is disposed between but not in contact with the body portions of the first and second elongated test probes to electrically isolate the first and second elongated test probes. The first and second elongated test probes are held in alignment with respect to each other so that the tip of the first elongated test probe is adjacent to and not in contact with the tip of the second elongated test probe for making simultaneous contact with the device under test. The dual tip test probe assembly provides a low inductance and a small, stable footprint for testing small and/or non-flat test points.
    Type: Grant
    Filed: June 24, 2009
    Date of Patent: September 27, 2011
    Assignee: SV Probe Pte. Ltd.
    Inventors: Son Ngoc Dang, John McCormick, Habib Kilicaslan
  • Dual Tip Test Probe Assembly
    Publication number: 20100327894
    Abstract: A dual tip test probe assembly for use in both cantilever and vertical probe applications includes first and second elongated test probes, each having a body portion and a tip portion with a tip configured to make contact with a device under test. An electrically-insulating material is disposed between but not in contact with the body portions of the first and second elongated test probes to electrically isolate the first and second elongated test probes. The first and second elongated test probes are held in alignment with respect to each other so that the tip of the first elongated test probe is adjacent to and not in contact with the tip of the second elongated test probe for making simultaneous contact with the device under test. The dual tip test probe assembly provides a low inductance and a small, stable footprint for testing small and/or non-flat test points.
    Type: Application
    Filed: June 24, 2009
    Publication date: December 30, 2010
    Inventors: Son Ngoc Dang, John McCormick, Habib Kilicaslan