Abstract: An apparatus for automatically loading and unloading sleeves for an IC tester and then selectively reloading the sleeves after testing, which is controlled by a conventional microprocessor using sensor input and which automatically transports the IC chip containing sleeves randomly contained in a hopper to a sorter section in a correct posture by means of a timing belt having sleeve holders, to feed the chips in the sorter section, to the tester by a first transfer block, and then automatically transfer empty sleeves from an ejector section having a cam plate and an ejector through a dropping section having a pair of guide rails to an unloader section having a second transfer block, a sleeve holder, a sensor and a pushing plate, thereby permitting the sleeves to be refilled with the tester and sorted IC chips and stored in a storage box.