Patents by Inventor Soon Chun Kuek

Soon Chun Kuek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8568646
    Abstract: There is provided methods and apparatus for compensation of intensity profiles of imagers used in three-dimensional modelers. The intensity profile of the actinic radiation projected from the imager is determined by a variety of techniques, including but not limited to manually operated sensors, exposed and scanned actinic radiation-sensitive paper, and intensity profilers. Once the intensity profile of the imager is determined, each layer of the solidifiable liquid material is cured by projecting a plurality of patterns (as opposed to a single pattern) defining the two-dimensional cross-section of the part being cured. The patterns vary in duration, number, and/or shape to correlate to the intensity profile so that a single layer of selectively cured solidifiable liquid material is cured with a substantially equivalent (or otherwise controlled) amount of actinic radiation per unit of surface area to provide generally controlled and consistent part quality.
    Type: Grant
    Filed: September 21, 2011
    Date of Patent: October 29, 2013
    Assignee: 3D Systems, Inc.
    Inventors: Hongqing V. Wang, Soon-Chun Kuek, Charles W. Hull, Richard Ora Gregory, II, Thomas Alan Kerekes
  • Publication number: 20120133080
    Abstract: There is provided methods and apparatus for improving the accuracy of three-dimensional objects formed by additive manufacturing. By depositing or hardening build material within the interior of the layers in certain patterns, the stresses that lead to curl in the object can be isolated and controlled. Similarly, certain patterns for depositing or hardening the build material provide for reduced layer thicknesses to improve the sidewall quality of the object being formed. The patterns within the interior of the layers can include gaps or voids for particular layers being deposited or hardened, and the gaps or voids can be partially filled, fully filled, or not filled at all when subsequent layers are deposited or hardened. Accordingly, the accuracy of three-dimensional objects formed by additive manufacturing is improved.
    Type: Application
    Filed: November 29, 2010
    Publication date: May 31, 2012
    Applicant: 3D Systems, Inc.
    Inventors: Khalil Moussa, Hongqing Vincent Wang, Soon-Chun Kuek
  • Publication number: 20120007288
    Abstract: There is provided methods and apparatus for compensation of intensity profiles of imagers used in three-dimensional modelers. The intensity profile of the actinic radiation projected from the imager is determined by a variety of techniques, including but not limited to manually operated sensors, exposed and scanned actinic radiation-sensitive paper, and intensity profilers. Once the intensity profile of the imager is determined, each layer of the solidifiable liquid material is cured by projecting a plurality of patterns (as opposed to a single pattern) defining the two-dimensional cross-section of the part being cured. The patterns vary in duration, number, and/or shape to correlate to the intensity profile so that a single layer of selectively cured solidifiable liquid material is cured with a substantially equivalent (or otherwise controlled) amount of actinic radiation per unit of surface area to provide generally controlled and consistent part quality.
    Type: Application
    Filed: September 21, 2011
    Publication date: January 12, 2012
    Inventors: Hongqing V. Wang, Soon-Chun Kuek, Charles W. Hull, Richard Ora Gregory, II, Thomas Alan Kerekes
  • Patent number: 8048359
    Abstract: There is provided methods and apparatus for compensation of intensity profiles of imagers used in three-dimensional modelers. The intensity profile of the actinic radiation projected from the imager is determined by a variety of techniques, including but not limited to manually operated sensors, exposed and scanned actinic radiation-sensitive paper, and intensity profilers. Once the intensity profile of the imager is determined, each layer of the solidifiable liquid material is cured by projecting a plurality of patterns (as opposed to a single pattern) defining the two-dimensional cross-section of the part being cured. The patterns vary in duration, number, and/or shape to correlate to the intensity profile so that a single layer of selectively cured solidifiable liquid material is cured with a substantially equivalent (or otherwise controlled) amount of actinic radiation per unit of surface area to provide generally controlled and consistent part quality.
    Type: Grant
    Filed: October 20, 2008
    Date of Patent: November 1, 2011
    Assignee: 3D Systems, Inc.
    Inventors: Hongqing V. Wang, Soon-Chun Kuek, Charles W. Hull, Richard Ora Gregory, II, Thomas Alan Kerekes
  • Publication number: 20100098835
    Abstract: There is provided methods and apparatus for compensation of intensity profiles of imagers used in three-dimensional modelers. The intensity profile of the actinic radiation projected from the imager is determined by a variety of techniques, including but not limited to manually operated sensors, exposed and scanned actinic radiation-sensitive paper, and intensity profilers. Once the intensity profile of the imager is determined, each layer of the solidifiable liquid material is cured by projecting a plurality of patterns (as opposed to a single pattern) defining the two-dimensional cross-section of the part being cured. The patterns vary in duration, number, and/or shape to correlate to the intensity profile so that a single layer of selectively cured solidifiable liquid material is cured with a substantially equivalent (or otherwise controlled) amount of actinic radiation per unit of surface area to provide generally controlled and consistent part quality.
    Type: Application
    Filed: October 20, 2008
    Publication date: April 22, 2010
    Inventors: Hongqing V. Wang, Soon-Chun Kuek, Charles W. Hull, Richard Ora Gregory, II, Thomas Alan Kerekes
  • Patent number: 7568819
    Abstract: An optical navigation devices and methods that utilize an internal reflection surface to reflect and collimate sidelight from a light source are described. A light source is configured to emit light. The sidelight from the light source is reflected and collimated by an internal reflection surface towards a work surface. The light received by the sensor is used to measure movement of the optical navigation device relative to the work surface.
    Type: Grant
    Filed: June 7, 2006
    Date of Patent: August 4, 2009
    Assignee: Avago Technologies ECBU IP (Singapore) Pte. Ltd.
    Inventors: Boon Kheng Lee, Soon Chun Kuek, Sai Mun Lee
  • Publication number: 20070285392
    Abstract: An optical navigation devices and methods that utilize an internal reflection surface to reflect and collimate sidelight from a light source are described. A light source is configured to emit light. The sidelight from the light source is reflected and collimated by an internal reflection surface towards a work surface. The light received by the sensor is used to measure movement of the optical navigation device relative to the work surface.
    Type: Application
    Filed: June 7, 2006
    Publication date: December 13, 2007
    Inventors: Boon Kheng Lee, Soon Chun Kuek, Sai Mun Lee