Patents by Inventor Soon-Gyu Ko

Soon-Gyu Ko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHOD AND APPRATUS FOR SWITCHING FROM MASTER NODE TO SECONDARY NODE IN COMMUNICATION SYSTEM
    Publication number: 20240137821
    Abstract: Disclosed is a technique for switching from a master node to a secondary node in a communication system. A method of a first communication node may comprise: adding the first communication node as a primary secondary cell (PSCell) to a second communication node through dual connectivity (DC); generating a first user plane path for smart dynamic switching (SDS) and a first instance for supporting the first user plane path according to a request from the second communication node; transmitting information on the first user plane path and the first instance to a terminal; receiving user data based on the first user plane path from the terminal as the first instance; and transmitting the user data to a core network using the first user plane path.
    Type: Application
    Filed: October 22, 2023
    Publication date: April 25, 2024
    Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
    Inventors: Soon Gi PARK, Young-Jo KO, IL GYU KIM, Jung Im KIM, Jun Sik KIM, Sung Cheol CHANG, Sun Mi JUN, Yong Seouk CHOI
  • Atomic force microscope with probe with improved tip movement
    Patent number: 7246517
    Abstract: An atomic force microscope probe provides an indentation testing function in a direction along an axis. The probe has a tip and an arm structure holding the tip. The arm structure has one end mounted on a fixed stage, the other end coupled to the AFM tip, and a hollow frame having a shape symmetric with respect to a plane including an axis on which the two ends are positioned.
    Type: Grant
    Filed: June 19, 2006
    Date of Patent: July 24, 2007
    Assignee: Korea Institute of Machinery & Materials
    Inventors: Hak-Joo Lee, Jae-Hyun Kim, Chung-Seog Oh, Seung-Woo Han, Shin Hur, Soon-Gyu Ko, Byung-Ik Choi
  • Atomic force microscope with probe with improved tip movement
    Publication number: 20060243036
    Abstract: An atomic force microscope probe provides an indentation testing function in a direction along an axis. The probe has a tip and an arm structure holding the tip. The arm structure has one end mounted on a fixed stage, the other end coupled to the AFM tip, and a hollow frame having a shape symmetric with respect to a plane including an axis on which the two ends are positioned.
    Type: Application
    Filed: June 19, 2006
    Publication date: November 2, 2006
    Inventors: Hak-Joo Lee, Jae-Hyun Kim, Chung-Seog Oh, Seung-Woo Han, Shin Hur, Soon-Gyu Ko, Byung-Ik Choi