Abstract: An apparatus comprises a selected volume detector that detects a selected output volume; an analog output signal amplifier; a digital volume amplifier; a boost gain control element coupled to the selected volume detector; the analog output signal amplifier; and the digital volume amplifier; wherein the boost gain control element is configured to: keep a gain of a path of the digital volume amplifier and the analog output signal amplifier substantially constant, wherein the boost gain control element can adjust both: a) a gain of the digital volume control; and b) a gain of the analog output signal amplifier; to keep the gain of the path of the digital volume amplifier and the analog output signal substantially constant and equal to the selected output volume.

Abstract: An integrated circuit includes an output pad, an alarm output pad, and a test mode output pad. A first multi-bit register is programmable to store programmable data such as data that identifies a customer for whom the integrated circuit has been manufactured. A second multi-bit register is programmable to store customer specified threshold data. A first circuit selectively couples the first and second multi-bit registers to the output pad. The first circuit is operable responsive to the integrated circuit being placed into a test mode to perform parallel-to-serial conversion of either the customer identification data stored in the first multi-bit register or the customer specified threshold data stored in the second multi-bit register and drive the converted data for output through the output pad. The integrated circuit further includes a tamper detection circuit operable responsive to the customer specified threshold data to generate a tamper alarm signal.

Abstract: An apparatus comprises a selected volume detector that detects a selected output volume; an analog output signal amplifier; a digital volume amplifier; a boost gain control element coupled to the selected volume detector; the analog output signal amplifier; and the digital volume amplifier; wherein the boost gain control element is configured to: keep a gain of a path of the digital volume amplifier and the analog output signal amplifier substantially constant, wherein the boost gain control element can adjust both: a) a gain of the digital volume control; and b) a gain of the analog output signal amplifier; to keep the gain of the path of the digital volume amplifier and the analog output signal substantially constant and equal to the selected output volume.

Abstract: An apparatus and method are disclosed for temperature measurement that includes performing a first ?Vbe measurement of a first temperature of a diode circuit comprising a transistor and, subsequently, performing a first Vbe measurement of a second temperature of the diode circuit. A temperature difference is calculated between the second temperature and the first temperature. If the temperature difference is not greater than a predetermined amount, a second Vbe measurement of a third temperature of the diode circuit is subsequently performed. If the temperature difference is greater than the predetermined amount, a second ?Vbe measurement of the second temperature of the diode circuit is performed.

Abstract: A relaxation oscillator includes a capacitor connected to a comparator input, current sources switched to supply power to the capacitor based on an output of the comparator, and a duplicate integrator shifting a voltage on the capacitor to offset a propagation delay through the comparator. The duplicate integrator includes current sources and a capacitor matching and switched in tandem with those within the relaxation oscillator, plus an additional current source, and is selectively switched into connection with the comparator input. By canceling the comparator propagation delay, the oscillator output frequency can be stably controlled through selection of resistive and capacitive values, using cheaper technology and tolerating large temperature, voltage and process variations.

Abstract: An integrated circuit includes an output pad, an alarm output pad, and a test mode output pad. A first multi-bit register is programmable to store programmable data such as data that identifies a customer for whom the integrated circuit has been manufactured. A second multi-bit register is programmable to store customer specified threshold data. A first circuit selectively couples the first and second multi-bit registers to the output pad. The first circuit is operable responsive to the integrated circuit being placed into a test mode to perform parallel-to-serial conversion of either the customer identification data stored in the first multi-bit register or the customer specified threshold data stored in the second multi-bit register and drive the converted data for output through the output pad. The integrated circuit further includes a tamper detection circuit operable responsive to the customer specified threshold data to generate a tamper alarm signal.

Abstract: An integrated circuit includes an output pad, an alarm output pad, and a test mode output pad. A first multi-bit register is programmable to store programmable data such as data that identifies a customer for whom the integrated circuit has been manufactured. A second multi-bit register is programmable to store customer specified threshold data. A first circuit selectively couples the first and second multi-bit registers to the output pad. The first circuit is operable responsive to the integrated circuit being placed into a test mode to perform parallel-to-serial conversion of either the customer identification data stored in the first multi-bit register or the customer specified threshold data stored in the second multi-bit register and drive the converted data for output through the output pad. The integrated circuit further includes a tamper detection circuit operable responsive to the customer specified threshold data to generate a tamper alarm signal.

Abstract: A relaxation oscillator includes a capacitor connected to a comparator input, current sources switched to supply power to the capacitor based on an output of the comparator, and a duplicate integrator shifting a voltage on the capacitor to offset a propagation delay through the comparator. The duplicate integrator includes current sources and a capacitor matching and switched in tandem with those within the relaxation oscillator, plus an additional current source, and is selectively switched into connection with the comparator input. By canceling the comparator propagation delay, the oscillator output frequency can be stably controlled through selection of resistive and capacitive values, using cheaper technology and tolerating large temperature, voltage and process variations.

Abstract: An apparatus and method are disclosed for temperature measurement that includes performing a first ?Vbe measurement of a first temperature of a diode circuit comprising a transistor and, subsequently, performing a first Vbe measurement of a second temperature of the diode circuit. A temperature difference is calculated between the second temperature and the first temperature. If the temperature difference is not greater than a predetermined amount, a second Vbe measurement of a third temperature of the diode circuit is subsequently performed. If the temperature difference is greater than the predetermined amount, a second ?Vbe measurement of the second temperature of the diode circuit is performed.

Abstract: A digital-to-analog converter, in response to a digital signal, selectively taps a resistor string to generate an analog output and selectively shunts around resistors in the string to voltage shift the analog output. If two supply voltage sets are present, two strings are provided. A mutually exclusively selection of outputs is made to select a source of the analog output. An integrated circuit temperature sensor uses the converter and includes a sensing circuit that determines exposure to one of a relatively low or high temperature. A measured voltage across the base-emitter of a bipolar transistor is selected in low temperature exposure and compared against a first reference for a too cold temperature condition. Alternatively, a measured delta voltage across the base-emitter is selected in high temperature exposure and compared against a second reference voltage for a too hot temperature condition. Through the comparisons, a temperature exposure detection is made.

Abstract: An integrated circuit temperature sensor includes a sensor to determine whether the integrated circuit is currently exposed to a relatively low or high temperature. A measured voltage across the base-emitter of a bipolar transistor is selected if the sensor indicates exposure to the relatively low temperature or, a measured delta voltage across the base-emitter of the bipolar transistor is selected if the sensor indicates exposure to the relatively high temperature. The voltage across the base-emitter is compared against a first reference for determining exposure to a too cold condition or the selected measured delta voltage across the base-emitter is compared against a second reference for determining exposure to a too hot condition. In a test mode, the measured delta voltage across the base-emitter and/or the measured voltage across the base-emitter are scaled.

Abstract: A digital-to-analog converter, in response to a digital signal, selectively taps a resistor string to generate an analog output and selectively shunts around resistors in the string to voltage shift the analog output. If two supply voltage sets are present, two strings are provided. A mutually exclusively selection of outputs is made to select a source of the analog output. An integrated circuit temperature sensor uses the converter and includes a sensing circuit that determines exposure to one of a relatively low or high temperature. A measured voltage across the base-emitter of a bipolar transistor is selected in low temperature exposure and compared against a first reference for a too cold temperature condition. Alternatively, a measured delta voltage across the base-emitter is selected in high temperature exposure and compared against a second reference voltage for a too hot temperature condition. Through the comparisons, a temperature exposure detection is made.

Abstract: A sensing circuit determines whether an integrated circuit is currently exposed to one of a relatively low or a relatively high temperature. A selection circuit selects a measured voltage across the base-emitter of a bipolar transistor if the sensing circuit indicates that the circuit is exposed to the relatively low temperature or, alternatively, selects a measured delta voltage across the base-emitter of the bipolar transistor if the sensing circuit indicates that the circuit is exposed to the relatively high temperature. A comparator compares the selected measured voltage against a first reference voltage indicative of a too cold temperature condition or compares the selected measured delta voltage against a second reference voltage indicative of a too hot temperature condition. As a result of the comparison, detection may be made as to whether the integrated circuit is currently exposed to a too cold or too hot temperature.

Abstract: An integrated circuit temperature sensor includes a sensing circuit operable to determine whether the integrated circuit is currently exposed to one of a relatively low temperature or a relatively high temperature. A selection circuit operates to select a measured voltage across the base-emitter of a bipolar transistor of the integrated circuit if the sensing circuit indicates that the integrated circuit is currently exposed to the relatively low temperature or, alternatively, select a measured delta voltage across the base-emitter of the bipolar transistor of the integrated circuit if the sensing circuit indicates that the integrated circuit is currently exposed to the relatively high temperature.

Abstract: An integrated circuit temperature sensor includes a sensing circuit operable to determine whether the integrated circuit is currently exposed to one of a relatively low temperature or a relatively high temperature. A selection circuit operates to select a measured voltage across the base-emitter of a bipolar transistor of the integrated circuit if the sensing circuit indicates that the integrated circuit is currently exposed to the relatively low temperature or, alternatively, select a measured delta voltage across the base-emitter of the bipolar transistor of the integrated circuit if the sensing circuit indicates that the integrated circuit is currently exposed to the relatively high temperature.

Abstract: An integrated circuit includes an output pad, an alarm output pad, and a test mode output pad. A first multi-bit register is programmable to store programmable data such as data that identifies a customer for whom the integrated circuit has been manufactured. A second multi-bit register is programmable to store customer specified threshold data. A first circuit selectively couples the first and second multi-bit registers to the output pad. The first circuit is operable responsive to the integrated circuit being placed into a test mode to perform parallel-to-serial conversion of either the customer identification data stored in the first multi-bit register or the customer specified threshold data stored in the second multi-bit register and drive the converted data for output through the output pad. The integrated circuit further includes a tamper detection circuit operable responsive to the customer specified threshold data to generate a tamper alarm signal.