Patents by Inventor Sophiane TOURNOIS

Sophiane TOURNOIS has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and test system for assessing the quality of a multi-channel micro- and/or subwavelength-optical projection unit
    Patent number: 11630026
    Abstract: A method for assessing the quality of a multi-channel micro- and/or subwavelength-optical projection unit is disclosed. The method comprises the following steps: At least a predefined portion of the optical projection unit is illuminated so that an image is generated by at least two channels of the predefined portion of the multi-channel optical projection unit. At least one characteristic quantity is determined based on the analysis of the image, wherein a value of the characteristic quantity is associated with a characteristic feature of the projection unit, a defect of the projection unit and/or a defect class of the projection unit. The quality of the projection unit is assessed based on the at least one characteristic quantity. Moreover, a test system for assessing the quality of a multi-channel micro- and/or subwavelength-optical projection unit and a computer program are disclosed.
    Type: Grant
    Filed: September 2, 2020
    Date of Patent: April 18, 2023
    Inventors: Isabel Agireen, Katrin Schindler, Wilfried Noell, Sophiane Tournois, Susanne Westenhoefer
  • Method and test system for assessing the quality of a multi-channel micro- and/or subwavelength-optical projection unit
    Publication number: 20210063863
    Abstract: A method for assessing the quality of a multi-channel micro- and/or subwavelength-optical projection unit is disclosed. The method comprises the following steps: At least a predefined portion of the optical projection unit is illuminated so that an image is generated by at least two channels of the predefined portion of the multi-channel optical projection unit. At least one characteristic quantity is determined based on the analysis of the image, wherein a value of the characteristic quantity is associated with a characteristic feature of the projection unit, a defect of the projection unit and/or a defect class of the projection unit. The quality of the projection unit is assessed based on the at least one characteristic quantity.
    Type: Application
    Filed: September 2, 2020
    Publication date: March 4, 2021
    Inventors: Isabel AGIREEN, Katrin SCHINDLER, Wilfried NOELL, Sophiane TOURNOIS, Susanne WESTENHOEFER