Patents by Inventor Soraya J. Matos

Soraya J. Matos has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8890507
    Abstract: A method of measuring the phase transient response of a device under test automatically provides a flattened phase transient response without any user intervention. The method comprises the steps of calculating an instantaneous phase waveform based on an instantaneous voltage waveform that represents an output signal of the device under test as it steps from a first frequency to a second frequency, calculating an instantaneous frequency waveform based on the instantaneous phase waveform, automatically estimating the second frequency based on the instantaneous frequency waveform without any user intervention, and flattening the instantaneous phase waveform based on the estimate of the second frequency.
    Type: Grant
    Filed: May 19, 2010
    Date of Patent: November 18, 2014
    Assignee: Tektronix, Inc.
    Inventors: Kathryn A. Engholm, Soraya J. Matos, Shigetsune Torin
  • Patent number: 8184608
    Abstract: A system and method is provided enabling identification of different PN offsets values for CDMA signals without access to a GPS signal, such as when making measurements within indoor environments. When a timing reference, such as that provided by a GPS signal, is lost, the frame boundary timestamp of the CDMA signal itself is used. The parameters of the strongest available PN offset are used. The timing error is determined and the new timing reference timestamp is estimated. The strongest PN is used as the time reference and tau is corrected for. In further embodiments, a user may be able to provide identifying information allowing the estimated timing reference timestamp to be determined even when a GPS signal was never established for providing an initial timing reference.
    Type: Grant
    Filed: March 17, 2008
    Date of Patent: May 22, 2012
    Assignee: Tektronix, Inc.
    Inventors: Soraya J. Matos, Thomas L. Kuntz, Thomas A. Elliot, Jerry L. Young
  • Publication number: 20110285381
    Abstract: A method of measuring the phase transient response of a device under test automatically provides a flattened phase transient response without any user intervention. The method comprises the steps of calculating an instantaneous phase waveform based on an instantaneous voltage waveform that represents an output signal of the device under test as it steps from a first frequency to a second frequency, calculating an instantaneous frequency waveform based on the instantaneous phase waveform, automatically estimating the second frequency based on the instantaneous frequency waveform without any user intervention, and flattening the instantaneous phase waveform based on the estimate of the second frequency.
    Type: Application
    Filed: May 19, 2010
    Publication date: November 24, 2011
    Applicant: TEKTRONIX, INC
    Inventors: KATHRYN A. ENGHOLM, SORAYA J. MATOS, SHIGETSUNE TORIN
  • Publication number: 20090073951
    Abstract: A system and method is provided enabling identification of different PN offsets values for CDMA signals without access to a GPS signal, such as when making measurements within indoor environments. When a timing reference, such as that provided by a GPS signal, is lost, the frame boundary timestamp of the CDMA signal itself is used. The parameters of the strongest available PN offset are used. The timing error is determined and the new timing reference timestamp is estimated. The strongest PN is used as the time reference and tau is corrected for. In further embodiments, a user may be able to provide identifying information allowing the estimated timing reference timestamp to be determined even when a GPS signal was never established for providing an initial timing reference.
    Type: Application
    Filed: March 17, 2008
    Publication date: March 19, 2009
    Applicant: TEKTRONIX, INC.
    Inventors: Soraya J. Matos, Thomas L. Kuntz, Thomas A. Elliot, Jerry A. Young
  • Patent number: 6701265
    Abstract: An improved calibration method for a vector network analyzer stores sparse calibration data, interpolates system error data from the sparse calibration data for each measurement by the vector network analyzer, and creates calibrated measurement data from the system error data and uncorrected measurement data at each measurement frequency. The sparse calibration data may be generated by measuring every Nth frequency step over a calibration frequency range greater than a specified measurement frequency range, or by measuring every frequency step over the calibration frequency range and compressing the resulting measurement data. The interpolation may be achieved by using a curve-fit algorithm, such as a parametric polynomial curve fitting algorithm.
    Type: Grant
    Filed: March 5, 2002
    Date of Patent: March 2, 2004
    Assignee: Tektronix, Inc.
    Inventors: Thomas C. Hill, Xiaofen Chen, Soraya J. Matos, Leroy J. Willmann, Kyle L. Bernard, Linley F. Gumm
  • Publication number: 20030171886
    Abstract: An improved calibration method for a vector network analyzer stores sparse calibration data, interpolates system error data from the sparse calibration data for each measurement by the vector network analyzer, and creates calibrated measurement data from the system error data and uncorrected measurement data at each measurement frequency. The sparse calibration data may be generated by measuring every Nth frequency step over a calibration frequency range greater than a specified measurement frequency range, or by measuring every frequency step over the calibration frequency range and compressing the resulting measurement data. The interpolation may be achieved by using a curve-fit algorithm, such as a parametric polynomial curve fitting algorithm.
    Type: Application
    Filed: March 5, 2002
    Publication date: September 11, 2003
    Inventors: Thomas C. Hill, Xiaofen Chen, Soraya J. Matos, Leroy J. Willmann, Kyle L. Bernard, Linley F. Gumm
  • Patent number: 6542112
    Abstract: A method of interference cancellation in antenna test measurements is achieved by acquiring an acquisition at a test port of an antenna test instrument in response to an internal signal source, stamping the data acquisition time, and measuring a signal vector that has both a reflection signal component and an interference signal component. Another acquisition at the test port without the internal signal source is obtained with limited data points to detect whether there are interference signals. If there is significant interference power, a complete acquisition is obtained without the internal signal source, the data acquisition time is stamped, and an interference vector that has only the interference signal is measured.
    Type: Grant
    Filed: March 6, 2002
    Date of Patent: April 1, 2003
    Assignee: Tektronix, Inc.
    Inventors: Xiaofen Chen, Soraya J. Matos