Patents by Inventor Soroosh Rezazadeh

Soroosh Rezazadeh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8983206
    Abstract: A visual quality assessment method and system are based on deriving a quality metric by comparing sub-band approximations of a distorted image and an undistorted version of the same image, providing a good compromise between computational complexity and accuracy. The sub-band approximations are derived from Discrete Wavelet (Haar) transforms of small image blocks of each image. Due to inherent symmetries, the wavelet transform is “blind” to certain types of distortions. But the accuracy of the method is enhanced, and the blindness of the transform is overcome, by computing quality metrics for the distorted image as well as computing quality metrics for a shifted version of the distorted image and combining the results.
    Type: Grant
    Filed: May 3, 2012
    Date of Patent: March 17, 2015
    Assignee: Ecole de Techbologie Superieure
    Inventors: Stephane Coulombe, Soroosh Rezazadeh
  • Patent number: 8660364
    Abstract: Method and system for determining a measure of quality for images by using multi-level decomposition are presented. Multi-level decomposition of images is performed in the wavelet domain producing subbands at each level of decomposition. Aggregation of subbands is performed across multiple levels to produce an accurate measure of image quality. By aggregating only selected subbands the computational complexity of the method is greatly reduced.
    Type: Grant
    Filed: July 9, 2013
    Date of Patent: February 25, 2014
    Assignee: Ecole de Technologie Superieure
    Inventors: Soroosh Rezazadeh, Stephane Coulombe
  • Patent number: 8660363
    Abstract: Method and system for determining a measure of quality for images are presented. Multi-level decomposition of images in the wavelet domain using a variable number of levels of decomposition and aggregation of selected subbands is performed to obtain an accurate measure of quality. The processing time is reduced in comparison to that required by other methods for generating measures of quality.
    Type: Grant
    Filed: July 9, 2013
    Date of Patent: February 25, 2014
    Assignee: Ecole De Technologies Superieur
    Inventors: Soroosh Rezazadeh, Stephane Coulombe
  • Publication number: 20130294703
    Abstract: Method and system for determining a measure of quality for images by using multi-level decomposition are presented. Multi-level decomposition of images is performed in the wavelet domain producing subbands at each level of decomposition. Aggregation of subbands is performed across multiple levels to produce an accurate measure of image quality. By aggregating only selected subbands the computational complexity of the method is greatly reduced.
    Type: Application
    Filed: July 9, 2013
    Publication date: November 7, 2013
    Inventors: Soroosh REZAZADEH, Stephane COULOMBE
  • Publication number: 20130294701
    Abstract: Method and system for determining a measure of quality for images are presented. Multi-level decomposition of images in the wavelet domain using a variable number of levels of decomposition and aggregation of selected subbands is performed to obtain an accurate measure of quality. The processing time is reduced in comparison to that required by other methods for generating measures of quality.
    Type: Application
    Filed: July 9, 2013
    Publication date: November 7, 2013
    Inventors: Soroosh REZAZADEH, Stephane COULOMBE
  • Patent number: 8532396
    Abstract: Method and system for low complexity assessment of quality of an image are presented. By performing multiresolution decomposition of images using, for example, a discrete wavelet transform, and determining a metric based on a structural similarity index or a structural similarity map, a structural similarity score, characterizing similarity between images with a high degree of accuracy, is produced. The processing time is much smaller in comparison to that required by other methods producing image quality metrics of comparable accuracy.
    Type: Grant
    Filed: December 3, 2012
    Date of Patent: September 10, 2013
    Assignee: Ecole de Technologie Superieure
    Inventors: Soroosh Rezazadeh, Stéphane Coulombe
  • Patent number: 8515181
    Abstract: Method and system for determining a measure of quality for images are presented. Multi-level decomposition of images in the wavelet domain using a variable number of levels of decomposition and aggregation of selected subbands is performed to obtain an accurate measure of quality. The processing time is reduced in comparison to that required by other methods for generating measures of quality.
    Type: Grant
    Filed: October 17, 2010
    Date of Patent: August 20, 2013
    Assignee: Ecole de Technologie Superieure
    Inventors: Soroosh Rezazadeh, Stephane Coulombe
  • Patent number: 8515182
    Abstract: Method and system for determining a measure of quality for images by using multi-level decomposition are presented. Multi-level decomposition of images is performed in the wavelet domain producing subbands at each level of decomposition. Aggregation of subbands is performed across multiple levels to produce an accurate measure of image quality. By aggregating only selected subbands the computational complexity of the method is greatly reduced.
    Type: Grant
    Filed: October 17, 2010
    Date of Patent: August 20, 2013
    Assignee: Ecole de Technologie Superieure
    Inventors: Soroosh Rezazadeh, Stephane Coulombe
  • Patent number: 8326046
    Abstract: Method and system for low complexity assessment of quality of an image are presented. By performing multiresolution decomposition of images using, for example, a discrete wavelet transform, and determining a metric based on a structural similarity index or a structural similarity map, a structural similarity score, characterizing similarity between images with a high degree of accuracy, is produced. The processing time is much smaller in comparison to that required by other methods producing image quality metrics of comparable accuracy.
    Type: Grant
    Filed: July 9, 2009
    Date of Patent: December 4, 2012
    Assignee: Ecole de Technologie Superieure
    Inventors: Soroosh Rezazadeh, Stéphane Coulombe
  • Publication number: 20120281924
    Abstract: A visual quality assessment method and system are based on deriving a quality metric by comparing sub-band approximations of a distorted image and an undistorted version of the same image, providing a good compromise between computational complexity and accuracy. The sub-band approximations are derived from Discrete Wavelet (Haar) transforms of small image blocks of each image. Due to inherent symmetries, the wavelet transform is “blind” to certain types of distortions. But the accuracy of the method is enhanced, and the blindness of the transform is overcome, by computing quality metrics for the distorted image as well as computing quality metrics for a shifted version of the distorted image and combining the results.
    Type: Application
    Filed: May 3, 2012
    Publication date: November 8, 2012
    Inventors: STEPHANE COULOMBE, Soroosh Rezazadeh
  • Publication number: 20110038548
    Abstract: Method and system for determining a measure of quality for images by using multi-level decomposition are presented. Multi-level decomposition of images is performed in the wavelet domain producing subbands at each level of decomposition. Aggregation of subbands is performed across multiple levels to produce an accurate measure of image quality. By aggregating only selected subbands the computational complexity of the method is greatly reduced.
    Type: Application
    Filed: October 17, 2010
    Publication date: February 17, 2011
    Inventors: Soroosh REZAZADEH, Stephane COULOMBE
  • Publication number: 20110033119
    Abstract: Method and system for determining a measure of quality for images are presented. Multi-level decomposition of images in the wavelet domain using a variable number of levels of decomposition and aggregation of selected subbands is performed to obtain an accurate measure of quality. The processing time is reduced in comparison to that required by other methods for generating measures of quality.
    Type: Application
    Filed: October 17, 2010
    Publication date: February 10, 2011
    Inventors: Soroosh Rezazadeh, Stephane Coulombe
  • Publication number: 20100202700
    Abstract: Method and system for low complexity assessment of quality of an image are presented. By performing multiresolution decomposition of images using, for example, a discrete wavelet transform, and determining a metric based on a structural similarity index or a structural similarity map, a structural similarity score, characterizing similarity between images with a high degree of accuracy, is produced. The processing time is much smaller in comparison to that required by other methods producing image quality metrics of comparable accuracy.
    Type: Application
    Filed: July 9, 2009
    Publication date: August 12, 2010
    Inventors: Soroosh REZAZADEH, Stephane COULOMBE