Patents by Inventor Soroush Abbaspour
Soroush Abbaspour has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20190198174Abstract: Patient assistant systems are provided. In various embodiments, health data of a user is read from one or more data source. A cohort of the user is determined based on a primary diagnosis of the user. The health data of the user includes the primary diagnosis. A co-morbidity of the primary diagnosis within the cohort is determined. One or more predictor of the co-morbidity within the cohort is determined. Assistance information is provided to the user based on the one or more predictor. The assistance information includes the predictor and one or more recommendation to mitigate the co-morbidity.Type: ApplicationFiled: December 22, 2017Publication date: June 27, 2019Inventors: Soroush Abbaspour, Francisco P. Curbera, Daniel M. Dias, Shahram Ebadollahi, Maria Eleftheriou
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Patent number: 8549452Abstract: A method for accurately performing a timing, power, and noise analysis by pre-processing the characterization points of the available libraries, storing time consuming parts of the analysis and utilizing the pre-processed information during active runs to calculate the attributes at a desired PVT point. The PVT space is preferably sub-divided into triangular or rectangular regions, preferably obtained using Delaunay triangulation. In one embodiment, the invention performs an up-front pre-processing step on the characterized libraries to compute the static portion of the interpolation function that is independent of the specific instance; and a coefficient matrix that allows for interpolation of specific instances.Type: GrantFiled: May 6, 2010Date of Patent: October 1, 2013Assignee: International Business Machines CorporationInventors: Revanta Banerji, Soroush Abbaspour, Peter Feldmann, Hemlata Gupta
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Patent number: 8515725Abstract: A system, method and computer program product for modeling a semiconductor device structure. The system and method implemented includes performing a simulation of the circuit by applying at least one input waveform on a circuit input port, and loading an output port with at least one of output load; determining, at successive time steps of the circuit simulation, a voltage value Vi on the input port, a voltage value Vo on the output port, and a current values (ia) and (ib) on the respective input and output ports. Then there is computed from the respective current value for each successive time step of the simulation, at least one charge value (Qa(Vi, Vo)) and (Qb(Vi, Vo)), respectively, as a function of Vi and Vo voltage values; and generating a nonlinear charge source from the at least one charge value, the nonlinear charge source used in modeling a dynamic behavior of the cell. A voltage controlled charge source (VCCS) is thereby determined by capturing the natural digital circuit cell behavior.Type: GrantFiled: December 2, 2010Date of Patent: August 20, 2013Assignee: International Business Machines CorporationInventors: Peter Feldmann, Sampath Dechu, Soroush Abbaspour, Ratan Singh
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Patent number: 8463571Abstract: A computer-implemented system, method, and storage device simulate a periodic voltage waveform in a network model of the integrated circuit design. The method then determines resultant current values in each segment of nets of the integrated circuit design resulting from the periodic voltage waveform and performs a Fourier transform of the periodic voltage waveform to generate a frequency domain representation of the periodic voltage waveform. The frequency domain representation comprises multiple Fourier terms, each of the Fourier terms is a frequency that is a multiple of the base frequency. Next, the method performs an AC analysis of the resultant voltage at each frequency of the multiple Fourier terms. The AC analysis provides an electrical current value for each of the frequencies of the Fourier terms for each of the nets. This allows the method to compute a root mean square current through each of the nets based on the AC analysis.Type: GrantFiled: November 12, 2010Date of Patent: June 11, 2013Assignee: International Business Machines CorporationInventors: Soroush Abbaspour, Ayesha Akhter, Peter Feldmann, Joachim Keinert
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Patent number: 8396910Abstract: A system and method for waveform compression includes preprocessing a collection of waveforms representing cell and/or interconnect response waveforms and constructing a representative waveform basis using linear algebra to create basis waveforms for a larger set of waveforms. The collection waveforms are represented as linear combination coefficients of an adaptive subset of the basis waveforms to compress an amount of stored information needed to reproduce the collection of waveforms. The representation of coefficients may be further compressed by, e.g., analytic representation.Type: GrantFiled: November 6, 2008Date of Patent: March 12, 2013Assignee: International Business Machines CorporationInventors: Soroush Abbaspour, Peter Feldmann, Safar Hatami
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Patent number: 8359563Abstract: In one embodiment, the invention is a moment-based characterization waveform for static timing analysis. One embodiment of a method for mapping a timing waveform associated with a gate of an integrated circuit to a characterization waveform includes using a processor to perform steps including: computing one or more moments of the timing waveform and defining the characterization waveform in accordance with the moments.Type: GrantFiled: August 17, 2009Date of Patent: January 22, 2013Assignee: International Business Machines CorporationInventors: Soroush Abbaspour, Peter Feldmann, David Ling, Chandramouli Visweswariah
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Publication number: 20120245904Abstract: In one embodiment, the invention is a method and apparatus for waveform-based digital gate modeling for timing analysis. One embodiment of a method for modeling a gate of an integrated circuit chip includes building a transform matrix that indexes each input waveform/output waveform pair in a gate library to a plurality of different capacitive loads, obtaining an input waveform and a capacitive load associated with the gate, and, mapping the input waveform and the capacitive load to an output waveform for the gate, in accordance with the transform matrix.Type: ApplicationFiled: March 24, 2011Publication date: September 27, 2012Applicant: International Business Machines CorporationInventors: SOROUSH ABBASPOUR, Peter Feldmann, Safar Hatami
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Patent number: 8239810Abstract: A method for optimizing a circuit includes at least a first branch and a second branch includes defining an objective function using a shape of waveforms measured at a timing point in each branch, and optimizing the objective function to minimize a variance of clock skew of the first branch and the second branch across different process voltage temperature values.Type: GrantFiled: November 11, 2010Date of Patent: August 7, 2012Assignee: International Business Machines CorporationInventors: Soroush Abbaspour, Peter Feldmann, Peter A. Habitz, Safar Hatami
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Publication number: 20120143582Abstract: A system, method and computer program product for modeling a semiconductor device structure. The system and method implemented includes performing a simulation of the circuit by applying at least one input waveform on a circuit input port, and loading an output port with at least one of output load; determining, at successive time steps of the circuit simulation, a voltage value Vi on the input port, a voltage value Vo on the output port, and a current values (ia) and (ib) on the respective input and output ports. Then there is computed from the respective current value for each successive time step of the simulation, at least one charge value (Qa(Vi, Vo)) and (Qb(Vi, Vo)), respectively, as a function of Vi and Vo voltage values; and generating a nonlinear charge source from the at least one charge value, the nonlinear charge source used in modeling a dynamic behavior of the cell. A voltage controlled charge source (VCCS) is thereby determined by capturing the natural digital circuit cell behavior.Type: ApplicationFiled: December 2, 2010Publication date: June 7, 2012Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Peter Feldmann, Sampath Dechu, Soroush Abbaspour, Ratan Singh
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Publication number: 20120123725Abstract: A computer-implemented system, method, and storage device simulate a periodic voltage waveform in a network model of the integrated circuit design. The method then determines resultant current values in each segment of nets of the integrated circuit design resulting from the periodic voltage waveform and performs a Fourier transform of the periodic voltage waveform to generate a frequency domain representation of the periodic voltage waveform. The frequency domain representation comprises multiple Fourier terms, each of the Fourier terms is a frequency that is a multiple of the base frequency. Next, the method performs an AC analysis of the resultant voltage at each frequency of the multiple Fourier terms. The AC analysis provides an electrical current value for each of the frequencies of the Fourier terms for each of the nets. This allows the method to compute a root mean square current through each of the nets based on the AC analysis.Type: ApplicationFiled: November 12, 2010Publication date: May 17, 2012Applicant: International Business Machines CorporationInventors: Soroush Abbaspour, Ayesha Akhter, Peter Feldmann, Joachim Keinert
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Publication number: 20120124542Abstract: A method for optimizing a circuit includes at least a first branch and a second branch includes defining an objective function using a shape of waveforms measured at a timing point in each branch, and optimizing the objective function to minimize a variance of clock skew of the first branch and the second branch across different process voltage temperature values.Type: ApplicationFiled: November 11, 2010Publication date: May 17, 2012Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Soroush Abbaspour, Peter Feldmann, Peter A. Habitz, Safar Hatami
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Patent number: 8122411Abstract: An abstraction model supporting multiple hierarchical levels is inputted into a generalized static timing analysis of a hierarchical IC chip design to analyze and optimize the design of circuits integral to the chip containing a plurality of macro abstracts. An electrical network, synthesized for an internal abstract interconnect segment, is performed only once per macro and is applied to multiple instances of the macro abstract model in the IC chip design. The synthesized electrical network is a resistive capacitive or a resistive inductive capacitive network or a combination thereof. The synthesized electrical network is then used to match impulse response transfer functions of the network and the abstract interconnect segment's timing model. This network is stitched with the electrical parasitics of external interconnect segments connected to macro primary outputs. Various model order reductions are then performed on the electrical parasitics of external interconnects prior to network stitching.Type: GrantFiled: July 16, 2009Date of Patent: February 21, 2012Assignee: International Business Machines CorporationInventors: Soroush Abbaspour, Debjit Sinha
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Patent number: 8108815Abstract: A method and system to improve the performance of an integrated circuit (IC) chip by removing timing violations detected by performing a statistical timing analysis, given distributions of process and environmental sources of variation. The distributions are quantized using a minimum distortion criterion into discrete values. For each timing node of the IC circuit, a discrete minimum and maximum operation is performed on the timing parameters using a subset of combinations of the discrete values. The results of the discrete minimum and maximum operation are then de-quantized and propagated to a subsequent timing node and edge thereof. The process continues until one or more primary inputs and outputs of the IC chip are reached. The design of the IC chip is modified by removing all the timing violations identified.Type: GrantFiled: May 26, 2009Date of Patent: January 31, 2012Assignee: International Business Machines CorporationInventors: Soroush Abbaspour, Peter Feldmann
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Patent number: 8103997Abstract: A method for converting interconnect parasitics of an interconnect network into slew dependent pin capacitances utilizes charge matching between predetermined voltage thresholds. During timing abstraction of a macro, parasitics of interconnects connected to the primary inputs are represented as slew dependent pin capacitances in an abstract model being created. Interconnect model order reduction is employed to speed the process. The generated abstract is subsequently used in place of each occurrence of the macro during chip level hierarchical static timing analysis, leading to an enhanced accuracy of the timing analysis of the logic components driving the abstracts.Type: GrantFiled: April 20, 2009Date of Patent: January 24, 2012Assignee: International Business Machines CorporationInventors: Debjit Sinha, Soroush Abbaspour, Adil Bhanji, Jeffrey M. Ritzinger
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Publication number: 20110276933Abstract: A method for accurately performing a timing, power, and noise analysis by pre-processing the characterization points of the available libraries, storing time consuming parts of the analysis and utilizing the pre-processed information during active runs to calculate the attributes at a desired PVT point. The PVT space is preferably sub-divided into triangular or rectangular regions, preferably obtained using Delaunay triangulation. In one embodiment, the invention performs an up-front pre-processing step on the characterized libraries to compute the static portion of the interpolation function that is independent of the specific instance; and a coefficient matrix that allows for interpolation of specific instances.Type: ApplicationFiled: May 6, 2010Publication date: November 10, 2011Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Revanta Banerji, Soroush Abbaspour, Peter Feldmann, Hemlata Gupta
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Patent number: 8020129Abstract: An approach for performing multiple voltage threshold timing analysis for a digital integrated circuit is described. In one embodiment, there is a multiple voltage threshold timing analysis tool for performing a multiple voltage threshold timing analysis of a digital integrated circuit having at least one logic gate loaded by an interconnect circuit. In this embodiment, a characterization data retrieving component is configured to obtain characterization data describing driving behavior of the at least one logic gate. An interconnect circuit model retrieving component is configured to obtain a model of the interconnect circuit. A multiple voltage threshold timing analysis component is configured to derive a sequence of crossing times for the driving point voltage waveform to advance between successive voltage thresholds. The multiple voltage threshold timing analysis component also generates a voltage waveform from the derived sequence of crossing times.Type: GrantFiled: January 29, 2008Date of Patent: September 13, 2011Assignee: International Business Machines CorporationInventors: Soroush Abbaspour, Peter Feldmann
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Patent number: 7941775Abstract: An approach for performing arbitrary waveform propagation through a logic gate using timing analysis results is described. In one embodiment, there is an arbitrary waveform propagation tool for determining an effect of noise on a digital integrated circuit having at least one logic gate. A timing analysis component is configured to perform a timing analysis on the at least one logic gate and a noise analysis component is configured to perform a noise analysis. A waveform propagation model synthesizer component is configured to dynamically synthesize a waveform propagation model as a function of the timing analysis. The waveform propagation model synthesizer component is further configured to apply an arbitrary voltage waveform comprising one of a noisy waveform or noise glitch waveform and determine an effect of the arbitrary voltage waveform on the at least one logic gate from the dynamically synthesized waveform propagation model.Type: GrantFiled: March 7, 2008Date of Patent: May 10, 2011Assignee: International Business Machines CorporationInventors: Soroush Abbaspour, Peter Feldmann
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Publication number: 20110041108Abstract: In one embodiment, the invention is a moment-based characterization waveform for static timing analysis. One embodiment of a method for mapping a timing waveform associated with a gate of an integrated circuit to a characterization waveform includes using a processor to perform steps including: computing one or more moments of the timing waveform and defining the characterization waveform in accordance with the moments.Type: ApplicationFiled: August 17, 2009Publication date: February 17, 2011Applicant: International Business Machines CorporationInventors: SOROUSH ABBASPOUR, Peter Feldman, David Ling, Chandramouli Visweswariah
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Publication number: 20110016442Abstract: An abstraction model supporting multiple hierarchical levels is inputted into a generalized static timing analysis of a hierarchical IC chip design to analyze and optimize the design of circuits integral to the chip containing a plurality of macro abstracts. An electrical network, synthesized for an internal abstract interconnect segment, is performed only once per macro and is applied to multiple instances of the macro abstract model in the IC chip design. The synthesized electrical network is a resistive capacitive or a resistive inductive capacitive network or a combination thereof. The synthesized electrical network is then used to match impulse response transfer functions of the network and the abstract interconnect segment's timing model. This network is stitched with the electrical parasitics of external interconnect segments connected to macro primary outputs. Various model order reductions are then performed on the electrical parasitics of external interconnects prior to network stitching.Type: ApplicationFiled: July 16, 2009Publication date: January 20, 2011Applicant: International Business Machines CorporationInventors: Soroush Abbaspour, Debjit Sinha
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Publication number: 20100306723Abstract: A method and system to improve the performance of an integrated circuit (IC) chip by removing timing violations detected by performing a statistical timing analysis, given distributions of process and environmental sources of variation. The distributions are quantized using a minimum distortion criterion into discrete values. For each timing node of the IC circuit, a discrete minimum and maximum operation is performed on the timing parameters using a subset of combinations of the discrete values. The results of the discrete minimum and maximum operation are then de-quantized and propagated to a subsequent timing node and edge thereof. The process continues until one or more primary inputs and outputs of the IC chip are reached. The design of the IC chip is modified by removing all the timing violations identified.Type: ApplicationFiled: May 26, 2009Publication date: December 2, 2010Applicant: International Business Machines CorporationInventors: Soroush Abbaspour, Peter Feldmann