Abstract: Provided are an inspection device and an inspection method capable of achieving improved magnetic field sensitivity by using a magnetic thin film of a small film thickness. A light-emitting unit 1 emits light of a first wavelength for acquiring magnetic field inspection information and a second wavelength for acquiring inspection object surface information. A selection unit 6 selects information from an inspection object 4 and information from a magnetophotonic crystal film 3 acquired by light irradiation performed by an irradiation unit 2. An image generation unit 9 generates image data based on the magnetic field inspection information acquired with the first wavelength and the inspection object surface information acquired with the second wavelength selected by the selection unit. Each of the generated image data is displayed on a display unit 10.

Abstract: Provided are an inspection device and an inspection method capable of achieving improved magnetic field sensitivity by using a magnetic thin film of a small film thickness. A light-emitting unit 1 emits light of a first wavelength for acquiring magnetic field inspection information and a second wavelength for acquiring inspection object surface information. A selection unit 6 selects information from an inspection object 4 and information from a magnetophotonic crystal film 3 acquired by light irradiation performed by an irradiation unit 2. An image generation unit 9 generates image data based on the magnetic field inspection information acquired with the first wavelength and the inspection object surface information acquired with the second wavelength selected by the selection unit. Each of the generated image data is displayed on a display unit 10.

Abstract: The present invention provides an eddy current testing method and an eddy current testing apparatus that can reduce detection noise to increase the SN ratio thus improving the defect detection accuracy. An eddy current testing sensor includes a pair of excitation coils and a detection coil disposed therebetween. For example, a voltage regulator applies voltages having different amplitudes to the pair of excitation coils so as to reduce detection noise caused by a deformed portion of a heat exchanger tube and a tube plate in a detection signal of the detection coil. Alternatively, for example, an eddy current testing detector applies a first excitation frequency f1, at which tube material noise is reduced to negligible an amplitude, and a second excitation frequency f2, which is higher than the first excitation frequency f1, to the eddy current testing sensor.

Abstract: An eddy current flaw detection sensor is provided which can detect a circumferential crack occurring at the deformed portion or peripheral portion thereof of a heat transfer tube with a high degree of sensitivity. Two excitation coils 1a, 1b cause eddy current B to flow in the axial direction of a tubular test object 31. A detection coil 2 disposed between the excitation coils 1a, 1b detects bypass eddy current D which flows in the circumferential direction of the test object 31 while bypassing a circumferential crack E. For this purpose, the coil axes of the excitation coils 1a, 1b are directed to the radial direction of the cylindrical protection member 3 and the coil axis of the detection coil 2 is directed to the axial direction of the protection member 3.

Abstract: An eddy current flaw detection sensor is provided which can detect a circumferential crack occurring at the deformed portion or peripheral portion thereof of a heat transfer tube with a high degree of sensitivity. Two excitation coils 1a, 1b cause eddy current B to flow in the axial direction of a tubular test object 31. A detection coil 2 disposed between the excitation coils 1a, 1b detects bypass eddy current D which flows in the circumferential direction of the test object 31 while bypassing a circumferential crack E. For this purpose, the coil axes of the excitation coils 1a, 1b are directed to the radial direction of the cylindrical protection member 3 and the coil axis of the detection coil 2 is directed to the axial direction of the protection member 3.