Patents by Inventor Sotaro Kobayashi

Sotaro Kobayashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Specific conductivity measurement method, recording medium recording specific conductivity calculation program, and specific conductivity measurement system
    Patent number: 11435385
    Abstract: A specific conductivity measurement method includes: performing first measurement to obtain a resonance frequency f1 that is outputted to a measuring device when the first and second dielectric flat plates each have a thickness t1, and an unloaded Qu1 that corresponds to the resonance frequency f1; performing second measurement to obtain a resonance frequency f2 that is outputted to the measuring device when the first and second dielectric flat plates each have a thickness t2 that is different from the thickness t1, and an unloaded Qu2 that corresponds to the resonance frequency f2; and calculating a specific conductivity ?r of the copper foil and the first and second conductor flat plates based on an arithmetic equation that includes the resonance frequency the unloaded Qu1, the resonance frequency f2, and the unloaded Qu2.
    Type: Grant
    Filed: April 16, 2020
    Date of Patent: September 6, 2022
    Assignee: FUJITSU LIMITED
    Inventors: Kazuki Takahashi, Akiko Matsui, Kohei Choraku, Mitsunori Abe, Tetsuro Yamada, Yoshio Kobayashi, Sotaro Kobayashi
  • SPECIFIC CONDUCTIVITY MEASUREMENT METHOD, RECORDING MEDIUM RECORDING SPECIFIC CONDUCTIVITY CALCULATION PROGRAM, AND SPECIFIC CONDUCTIVITY MEASUREMENT SYSTEM
    Publication number: 20200341042
    Abstract: A specific conductivity measurement method includes: performing first measurement to obtain a resonance frequency f1 that is outputted to a measuring device when the first and second dielectric flat plates each have a thickness t1, and an unloaded Qu1 that corresponds to the resonance frequency f1; performing second measurement to obtain a resonance frequency f2 that is outputted to the measuring device when the first and second dielectric flat plates each have a thickness t2 that is different from the thickness t1, and an unloaded Qu2 that corresponds to the resonance frequency f2; and calculating a specific conductivity ?r of the copper foil and the first and second conductor flat plates based on an arithmetic equation that includes the resonance frequency the unloaded Qu1, the resonance frequency f2, and the unloaded Qu2.
    Type: Application
    Filed: April 16, 2020
    Publication date: October 29, 2020
    Applicant: FUJITSU LIMITED
    Inventors: Kazuki TAKAHASHI, AKIKO MATSUI, Kohei Choraku, Mitsunori Abe, Tetsuro Yamada, Yoshio Kobayashi, Sotaro Kobayashi