Patents by Inventor Soumyadeep Banerjee

Soumyadeep Banerjee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10003418
    Abstract: A testing apparatus obtains user equipment (UE) parametric measurements with unknown and/or unavailable authentication and security information. The testing apparatus may obtain uplink and downlink parameters of a wireless device after the wireless device initiates registration while an associated timer is activated, enabling the testing apparatus to obtain additional measurement information without security information about the tested wireless device. The apparatus may also measure the UE's transmitted power level prior to the initiation of the authentication procedure. The testing apparatus may determine if a wireless device is to be tested at another frequency pair. If so, the testing apparatus redirects the wireless device to a radio resource at the other frequency pair. The testing apparatus then obtains uplink and downlink parameters for the wireless device by performing pre-registration and intra-registration measurements at the other frequency pair.
    Type: Grant
    Filed: April 11, 2017
    Date of Patent: June 19, 2018
    Assignee: LitePoint Corporation
    Inventors: Ramakrishna Yellapantula, Chandra Punyapu, Malhar Vaishnav, Soumyadeep Banerjee
  • Patent number: 9749097
    Abstract: A method for wireless communications testing using downlink (DL) signal transmissions from an access point to a mobile terminal and uplink (UL) signal transmissions from said mobile terminal to said access point. Accurate block error rate (BLER) testing of LTE mobile devices in a wireless signal environment is enabled by preventing repeated transmissions of the same downlink (DL) data block that would normally follow reception of uplink (UL) transmissions of negative UL acknowledgments (NACKs) caused by failures to decode prior DL data transmissions, thereby producing cumulative NACK counts accurately reflecting data reception errors.
    Type: Grant
    Filed: June 4, 2015
    Date of Patent: August 29, 2017
    Assignee: LitePoint Corporation
    Inventors: Ramakrishna Yellapantula, Soumyadeep Banerjee, Steve Lawrence Sheya
  • Patent number: 9608894
    Abstract: Method for testing one or more of a group of radio frequency (RF) data packet signal transceiver devices under test (DUTs) with reduced signal interference from the remaining DUTs. A tester broadcasts a signal containing power control instructions about uplink signal power characteristics for communication with the tester. For example, for the LTE 3GPP standards, such characteristics could include power ramping step size, preamble initial received target power or maximum number of preamble transmissions for uplink signals transmitted from the DUTs. Following initiation of communication between the tester and one or more DUTs, the tester broadcasts a signal containing power control instructions to instruct the remaining DUTs to transmit any future signals with different uplink signal power characteristics.
    Type: Grant
    Filed: June 4, 2015
    Date of Patent: March 28, 2017
    Assignee: LitePoint Corporation
    Inventors: Steve Lawrence Sheya, Soumyadeep Banerjee, Ramakrishna Yellapantula
  • Publication number: 20160359591
    Abstract: A method for wireless communications testing using downlink (DL) signal transmissions from an access point to a mobile terminal and uplink (UL) signal transmissions from said mobile terminal to said access point. Accurate block error rate (BLER) testing of LTE mobile devices in a wireless signal environment is enabled by preventing repeated transmissions of the same downlink (DL) data block that would normally follow reception of uplink (UL) transmissions of negative UL acknowledgments (NACKs) caused by failures to decode prior DL data transmissions, thereby producing cumulative NACK counts accurately reflecting data reception errors.
    Type: Application
    Filed: June 4, 2015
    Publication date: December 8, 2016
    Inventors: Ramakrishna YELLAPANTULA, Soumyadeep Banerjee, Steve Lawrence Sheya
  • Publication number: 20160359717
    Abstract: Method for testing one or more of a group of radio frequency (RF) data packet signal transceiver devices under test (DUTs) with reduced signal interference from the remaining DUTs. A tester broadcasts a signal containing power control instructions about uplink signal power characteristics for communication with the tester. For example, for the LTE 3GPP standards, such characteristics could include power ramping step size, preamble initial received target power or maximum number of preamble transmissions for uplink signals transmitted from the DUTs. Following initiation of communication between the tester and one or more DUTs, the tester broadcasts a signal containing power control instructions to instruct the remaining DUTs to transmit any future signals with different uplink signal power characteristics.
    Type: Application
    Filed: June 4, 2015
    Publication date: December 8, 2016
    Inventors: Steve Lawrence SHEYA, Soumyadeep BANERJEE, Ramakrishna YELLAPANTULA
  • Publication number: 20160359718
    Abstract: Method for calibrating an over-the air (OTA) test system for testing multiple radio frequency (RF) data packet signal transceiver devices under test (DUTs), as well as using such a calibrated OTA test system for performing such tests. Calibration is achieved by placing a known good device (KGD) in multiple defined locations within the OTA test system, radiating the KGD with RF test signals at each location, and collecting from the KGD at each location channel quality information identifying optimal RF test signal sub-band channels for ensuring reliable communications within the test system. Use of such system includes placing multiple DUTs at the defined locations within the OTA test system and communicating with them wirelessly via the identified optimal RF test signal sub-band channels.
    Type: Application
    Filed: June 5, 2015
    Publication date: December 8, 2016
    Inventors: Soumyadeep BANERJEE, Steve Lawrence Sheya, Ramakrishna Yellapantula