Patents by Inventor Soung Yeoul Eom
Soung Yeoul Eom has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8726777Abstract: A cutting wheel is provided for cutting a liquid crystal panel. The cutting wheel is disc shaped and includes a plurality of grooves disposed along an edge of the cutting wheel and cutting portions formed between the grooves. A pattern having a predetermined period is formed by multiple grooves and cutting portions. The grooves in each period have the same or different widths and depths and the cutting portions have probe shapes or cutting blades of different lengths. The cutting wheel is applied to dummy areas of the glass substrates forming the liquid crystal panel.Type: GrantFiled: March 24, 2005Date of Patent: May 20, 2014Assignee: LG Display Co., Ltd.Inventor: Soung-Yeoul Eom
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Patent number: 8305542Abstract: A thin film transistor array substrate comprises thin film transistors and pixel electrodes formed at respective pixels that are defined by gate lines and data lines that orthogonally intersect each other. The thin film transistor array substrate further comprises a plurality of gate pad units that group a plurality of gate pads extended from the gate lines, and a plurality of data pad units that groups a plurality of data pads extended from the data lines. The thin film transistor array substrate further includes a plurality of gate test terminals connected to the gate pad units and beside at least one side of the respective gate pad units, and a plurality of data test terminals connected to the data pad units and located beside at least one side of the respective data pad units.Type: GrantFiled: July 11, 2011Date of Patent: November 6, 2012Assignee: LG Display Co., Ltd.Inventors: Dong Woo Kang, Soung Yeoul Eom, Bong Chul Kim, Ki Soub Yang
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Publication number: 20110287561Abstract: A thin film transistor array substrate comprises thin film transistors and pixel electrodes formed at respective pixels that are defined by gate lines and data lines that orthogonally intersect each other. The thin film transistor array substrate further comprises a plurality of gate pad units that group a plurality of gate pads extended from the gate lines, and a plurality of data pad units that groups a plurality of data pads extended from the data lines. The thin film transistor array substrate further includes a plurality of gate test terminals connected to the gate pad units and beside at least one side of the respective gate pad units, and a plurality of data test terminals connected to the data pad units and located beside at least one side of the respective data pad units.Type: ApplicationFiled: July 11, 2011Publication date: November 24, 2011Applicant: Lg Display Co., Ltd.Inventors: Dong Woo Kang, Soung Yeoul Eom, Bong Chul Kim, Ki Soub Yang
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Patent number: 7999901Abstract: A thin film transistor array substrate comprises thin film transistors and pixel electrodes formed at respective pixels that are defined by gate lines and data lines that orthogonally intersect each other. The thin film transistor array substrate further comprises a plurality of gate pad units that group a plurality of gate pads extended from the gate lines, and a plurality of data pad units that groups a plurality of data pads extended from the data lines. The thin film transistor array substrate further includes a plurality of gate test terminals connected to the gate pad units and beside at least one side of the respective gate pad units, and a plurality of data test terminals connected to the data pad units and located beside at least one side of the respective data pad units.Type: GrantFiled: June 29, 2006Date of Patent: August 16, 2011Assignee: LG Display Co., Ltd.Inventors: Dong Woo Kang, Soung Yeoul Eom, Bong Chul Kim, Ki Soub Yang
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Patent number: 7868644Abstract: A liquid crystal display (LCD) inspection apparatus and method are provided. The inspection apparatus and method are capable of automatically and accurately detecting defects of an LCD panel, and providing information of the automatically-detected defects of the LCD panel to the operator, thereby enabling the operator to easily recognize the defects.Type: GrantFiled: August 5, 2009Date of Patent: January 11, 2011Assignee: LG Display Co., Ltd.Inventors: Dong Woo Kang, Soung Yeoul Eom, Bong Chul Kim, Ki Soub Yang
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Patent number: 7834650Abstract: An LCD test method and apparatus for reducing the number of channels of a probe unit is provided. An apparatus for testing a liquid crystal display including: a stage on which a liquid crystal panel is placed; a plurality of vertically divided blocks, wherein each of the vertically divided blocks include a plurality of adjacent data lines; a data probe unit that provides test pattern signals respectively to groups of at least two of the plurality of vertically divided blocks of the liquid crystal panel; a plurality of horizontally divided blocks, wherein each of the horizontally divided blocks include a plurality of adjacent gate lines; a gate probe unit that provides scanning signals respectively to the plurality of horizontally divided blocks of the liquid crystal panel; and a controller that provides test pattern signals to the data probe unit and provides scanning signals to the gate probe unit.Type: GrantFiled: December 31, 2008Date of Patent: November 16, 2010Assignee: LG Display Co., Ltd.Inventors: Dong Woo Kang, Soung Yeoul Eom, Bong Chul Kim, Ki Soub Yang
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Patent number: 7830484Abstract: A TFT substrate for inspection for shorts, includes a substrate defined by a display area and a non-display area outside the display area; a plurality of first and second lines formed in the display area on the substrate; pad lines formed to be extended from one side of each of the first lines to the non-display area; a plurality of signal inspection bars formed in the non-display area to cross the pad lines at one side of the pad lines; a shorting inspection bar spaced apart from the outermost signal inspection bar at a predetermined interval and substantially parallel with the signal inspection bar and connected to the pad lines; and a plurality of transparent electrode patterns partially overlapped with the pad lines and connected to one of the signal inspection bars.Type: GrantFiled: June 9, 2006Date of Patent: November 9, 2010Assignee: LG Display Co., Ltd.Inventors: Soung Yeoul Eom, Dong Woo Kang, Bong Chul Kim, Ki Soub Yang
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Patent number: 7800568Abstract: The liquid crystal display (LCD) inspection apparatus for inspecting an LCD panel includes a worktable which supports the LCD panel to be seated on a front side of the worktable, probe units which are electrically connected to the LCD panel, a backlight unit which supplies light to the LCD panel, an imaging unit which photographs an image of the LCD panel supported by the worktable, a first polarizing plate which is arranged between the imaging unit and the LCD panel to polarize the light, a second polarizing plate which is arranged between the LCD panel and the backlight unit to polarize the light, an illumination unit which emits illumination light to surfaces of the LCD panel, and an image processor which receives the image photographed by the imaging unit, and extracts defect information from the received image.Type: GrantFiled: May 30, 2006Date of Patent: September 21, 2010Assignee: LG Display Co., Ltd.Inventors: Dong Woo Kang, Soung Yeoul Eom, Bong Chul Kim, Ki Soub Yang
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Patent number: 7753567Abstract: A backlight unit for a test device of an LCD panel is disclosed. The backlight unit includes: a chamber enclosing a predetermined space, the chamber being provided with a plurality of through holes formed around the chamber perimeter to allow air flow between the interior and exterior of the chamber; a backlight provided in the chamber to emit a light to an LCD panel positioned in the chamber; and a plurality of circulating fans provided in the chamber to circulate air inside the chamber.Type: GrantFiled: May 30, 2006Date of Patent: July 13, 2010Assignee: LG Display Co., Ltd.Inventors: Dong Woo Kang, Soung Yeoul Eom, Bong Chul Kim, Ki Soub Yang
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Publication number: 20090290785Abstract: A liquid crystal display (LCD) inspection apparatus and method are provided. The inspection apparatus and method are capable of automatically and accurately detecting defects of an LCD panel, and providing information of the automatically-detected defects of the LCD panel to the operator, thereby enabling the operator to easily recognize the defects.Type: ApplicationFiled: August 5, 2009Publication date: November 26, 2009Inventors: Dong Woo Kang, Soung Yeoul Eom, Bong Chul Kim, Ki Soub Yang
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Patent number: 7586323Abstract: A liquid crystal display (LCD) inspection apparatus and method are provided. The inspection apparatus and method are capable of automatically and accurately detecting defects of an LCD panel, and providing information of the automatically-detected defects of the LCD panel to the operator, thereby enabling the operator to easily recognize the defects.Type: GrantFiled: May 30, 2006Date of Patent: September 8, 2009Assignee: LG. Display Co., Ltd.Inventors: Dong Woo Kang, Soung Yeoul Eom, Bong Chul Kim, Ki Soub Yang
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Publication number: 20090146679Abstract: An LCD test method and apparatus for reducing the number of channels of a probe unit is provided. An apparatus for testing a liquid crystal display including: a stage on which a liquid crystal panel is placed; a plurality of vertically divided blocks, wherein each of the vertically divided blocks include a plurality of adjacent data lines; a data probe unit that provides test pattern signals respectively to groups of at least two of the plurality of vertically divided blocks of the liquid crystal panel; a plurality of horizontally divided blocks, wherein each of the horizontally divided blocks include a plurality of adjacent gate lines; a gate probe unit that provides scanning signals respectively to the plurality of horizontally divided blocks of the liquid crystal panel; and a controller that provides test pattern signals to the data probe unit and provides scanning signals to the gate probe unit.Type: ApplicationFiled: December 31, 2008Publication date: June 11, 2009Inventors: Dong Woo Kang, Soung Yeoul Eom, Bong Chul Kim, Ki Soub Yang
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Patent number: 7486102Abstract: An LCD test method and apparatus for reducing the number of channels of a probe unit is provided. An apparatus for testing a liquid crystal display including: a stage on which a liquid crystal panel is placed; a plurality of vertically divided blocks, wherein each of the vertically divided blocks include a plurality of adjacent data lines; a data probe unit that provides test pattern signals respectively to groups of at least two of the plurality of vertically divided blocks of the liquid crystal panel; a plurality of horizontally divided blocks, wherein each of the horizontally divided blocks include a plurality of adjacent gate lines; a gate probe unit that provides scanning signals respectively to the plurality of horizontally divided blocks of the liquid crystal panel; and a controller that provides test pattern signals to the data probe unit and provides scanning signals to the gate probe unit.Type: GrantFiled: May 31, 2006Date of Patent: February 3, 2009Assignee: LG Display Co., Ltd.Inventors: Dong Woo Kang, Soung Yeoul Eom, Bong Chul Kim, Ki Soub Yang
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Patent number: 7439757Abstract: A liquid crystal display (LCD) inspection apparatus for inspecting an LCD panel, includes a worktable to support an LCD panel seated on a front side of the worktable, probe units to be electrically connected to the LCD panel, a backlight unit to emit light toward the LCD panel, a first polarizing plate arranged in front of the LCD panel to polarize the light, and a second polarizing plate arranged between the LCD panel and the backlight unit to polarize the light, and a shutter unit to selectively shut off the light emitted from the backlight unit toward the LCD panel.Type: GrantFiled: May 30, 2006Date of Patent: October 21, 2008Assignee: LG Display Co., Ltd.Inventors: Dong Woo Kang, Soung Yeoul Eom, Bong Chul Kim, Ki Soub Yang
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Patent number: 7411410Abstract: An LCD test device and a test process thereof are disclosed, in which a defect of an LCD panel is exactly identified through exact electrical connection between an LCD panel and a probe unit. The LCD test device includes a work table on which an LCD panel is mounted, a clamping unit on the work table, clamping a top surface of an edge of the LCD panel mounted on the work table, a probe unit electrically connected with a pad of the LCD panel fixed to the work table by the clamping unit, and a back light unit supplying light to the LCD panel fixed to the work table. Accordingly, since the defect of the LCD panel can be tested exactly, reliability of the test is improved, and it is possible to prevent yield and the cost from being reduced in advance.Type: GrantFiled: December 26, 2006Date of Patent: August 12, 2008Assignee: LG Display Co., Ltd.Inventors: Dong Woo Kang, Soung Yeoul Eom, Ki Soub Yang
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Publication number: 20070296451Abstract: An LCD test device and a test process thereof are disclosed, in which a defect of an LCD panel is exactly identified through exact electrical connection between an LCD panel and a probe unit. The LCD test device includes a work table on which an LCD panel is mounted, a clamping unit on the work table, clamping a top surface of an edge of the LCD panel mounted on the work table, a probe unit electrically connected with a pad of the LCD panel fixed to the work table by the clamping unit, and a back light unit supplying light to the LCD panel fixed to the work table. Accordingly, since the defect of the LCD panel can be tested exactly, reliability of the test is improved, and it is possible to prevent yield and the cost from being reduced in advance.Type: ApplicationFiled: December 26, 2006Publication date: December 27, 2007Inventors: Dong Woo Kang, Soung Yeoul Eom, Ki Soul Yang
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Patent number: 7227374Abstract: A liquid crystal display (LCD) inspection apparatus is provided which is capable of preventing detection of defects from being omitted or degraded due to formation of stains in a certain region of an LCD panel in an inspection of the LCD panel.Type: GrantFiled: May 30, 2006Date of Patent: June 5, 2007Assignee: LG. Philips LCD Co., Ltd.Inventors: Dong Woo Kang, Soung Yeoul Eom, Bong Chul Kim, Ki Soub Yang
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Publication number: 20060068121Abstract: An apparatus for treating a thin film on a substrate includes a stage on which the substrate is disposed. A gas shield faces the substrate. An energy source irradiates a part of the substrate with light emitted therefrom through a retention space of the gas shield. A dispense unit includes a pin nozzle that injects a reaction gas towards the part of the substrate.Type: ApplicationFiled: August 24, 2005Publication date: March 30, 2006Inventors: Jong-Chul Lee, Soung-Yeoul Eom, Sang-Hyuck Park
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Publication number: 20050211047Abstract: A cutting wheel is provided for cutting a liquid crystal panel. The cutting wheel is disc shaped and includes a plurality of grooves disposed along an edge of the cutting wheel and cutting portions formed between the grooves. A pattern having a predetermined period is formed by multiple grooves and cutting portions. The grooves in each period have the same or different widths and depths and the cutting portions have probe shapes or cutting blades of different lengths. The cutting wheel is applied to dummy areas of the glass substrates forming the liquid crystal panel.Type: ApplicationFiled: March 24, 2005Publication date: September 29, 2005Inventor: Soung-Yeoul Eom